KR20110015555A - 비임렛 블랭커 배열체 - Google Patents

비임렛 블랭커 배열체 Download PDF

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Publication number
KR20110015555A
KR20110015555A KR1020107025645A KR20107025645A KR20110015555A KR 20110015555 A KR20110015555 A KR 20110015555A KR 1020107025645 A KR1020107025645 A KR 1020107025645A KR 20107025645 A KR20107025645 A KR 20107025645A KR 20110015555 A KR20110015555 A KR 20110015555A
Authority
KR
South Korea
Prior art keywords
beamlet
array
charged particle
deflector
beamlets
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020107025645A
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English (en)
Korean (ko)
Inventor
얀 자코 윌랜드
알렉산더 헨드릭 빈센트 반 빈
Original Assignee
마퍼 리쏘그라피 아이피 비.브이.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 마퍼 리쏘그라피 아이피 비.브이. filed Critical 마퍼 리쏘그라피 아이피 비.브이.
Publication of KR20110015555A publication Critical patent/KR20110015555A/ko
Withdrawn legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • H01L21/0274—Photolithographic processes
    • H01L21/0275—Photolithographic processes using lasers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
    • H01J37/3177—Multi-beam, e.g. fly's eye, comb probe
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00—Manufacture or treatment of nanostructures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/10—Lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002—Details
    • H01J37/3007—Electron or ion-optical systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/04—Means for controlling the discharge
    • H01J2237/049—Focusing means
    • H01J2237/0492—Lens systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/10—Lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/15—Means for deflecting or directing discharge

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Optics & Photonics (AREA)
  • Electron Beam Exposure (AREA)
KR1020107025645A 2008-04-15 2009-04-15 비임렛 블랭커 배열체 Withdrawn KR20110015555A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US4524308P 2008-04-15 2008-04-15
US61/045,243 2008-04-15

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020157020023A Division KR101638766B1 (ko) 2008-04-15 2009-04-15 비임렛 블랭커 배열체

Publications (1)

Publication Number Publication Date
KR20110015555A true KR20110015555A (ko) 2011-02-16

Family

ID=40786929

Family Applications (4)

Application Number Title Priority Date Filing Date
KR1020107025645A Withdrawn KR20110015555A (ko) 2008-04-15 2009-04-15 비임렛 블랭커 배열체
KR1020157021939A Active KR101678823B1 (ko) 2008-04-15 2009-04-15 투사 렌즈 배열체
KR1020107025644A Active KR101605865B1 (ko) 2008-04-15 2009-04-15 투사 렌즈 배열체
KR1020157020023A Active KR101638766B1 (ko) 2008-04-15 2009-04-15 비임렛 블랭커 배열체

Family Applications After (3)

Application Number Title Priority Date Filing Date
KR1020157021939A Active KR101678823B1 (ko) 2008-04-15 2009-04-15 투사 렌즈 배열체
KR1020107025644A Active KR101605865B1 (ko) 2008-04-15 2009-04-15 투사 렌즈 배열체
KR1020157020023A Active KR101638766B1 (ko) 2008-04-15 2009-04-15 비임렛 블랭커 배열체

Country Status (7)

Country Link
EP (3) EP2279515B1 (enExample)
JP (4) JP5268170B2 (enExample)
KR (4) KR20110015555A (enExample)
CN (2) CN102067272B (enExample)
AT (1) ATE535932T1 (enExample)
TW (3) TW201003713A (enExample)
WO (2) WO2009127659A2 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
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KR20140043355A (ko) * 2011-04-27 2014-04-09 마퍼 리쏘그라피 아이피 비.브이. 하나 이상의 하전 입자 빔의 조종을 위한 조종기 장치를 포함하는 하전 입자 시스템
KR20170063484A (ko) * 2014-09-03 2017-06-08 가부시키가이샤 뉴플레어 테크놀로지 멀티 하전 입자빔의 블랭킹 장치, 멀티 하전 입자빔 묘화 장치, 및 멀티 하전 입자빔의 불량빔 차폐 방법

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CN102668015B (zh) * 2009-10-26 2015-06-17 迈普尔平版印刷Ip有限公司 带电粒子多子射束光刻系统、调节装置及其制造方法
JP5636238B2 (ja) * 2010-09-22 2014-12-03 株式会社ニューフレアテクノロジー 荷電粒子ビーム描画装置及び荷電粒子ビーム描画方法
KR101725299B1 (ko) * 2010-10-26 2017-04-10 마퍼 리쏘그라피 아이피 비.브이. 변조 디바이스 및 이를 사용하는 하전 입자 멀티-빔렛 리소그래피 시스템
WO2012062934A1 (en) 2010-11-13 2012-05-18 Mapper Lithography Ip B.V. Charged particle beam modulator
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JP2012204624A (ja) * 2011-03-25 2012-10-22 Canon Inc 描画装置、および、物品の製造方法
JP6038882B2 (ja) 2011-04-20 2016-12-07 マッパー・リソグラフィー・アイピー・ビー．ブイ． 光ファイバの構成体及びこのような構成体を形成する方法
US8936994B2 (en) 2011-04-28 2015-01-20 Mapper Lithography Ip B.V. Method of processing a substrate in a lithography system
TW201303524A (zh) 2011-05-18 2013-01-16 Mapper Lithography Ip Bv 用於多子束微影設備的分裂圖案的方法
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JP2013016744A (ja) 2011-07-06 2013-01-24 Canon Inc 描画装置及びデバイスの製造方法
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NL2010759C2 (en) 2012-05-14 2015-08-25 Mapper Lithography Ip Bv Modulation device and power supply arrangement.
US9460260B2 (en) 2014-02-21 2016-10-04 Mapper Lithography Ip B.V. Enhanced stitching by overlap dose and feature reduction
JP6262024B2 (ja) * 2014-03-04 2018-01-17 株式会社ニューフレアテクノロジー マルチ荷電粒子ビーム描画装置
JP6677368B2 (ja) * 2014-06-13 2020-04-08 インテル・コーポレーション 電子ビームのユニバーサルカッタ
CN106463347B (zh) * 2014-06-13 2020-09-15 英特尔公司 即时电子束对准
US9390891B2 (en) * 2014-08-15 2016-07-12 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus for charged particle lithography system
CN107111251B (zh) 2014-11-14 2020-10-20 Asml荷兰有限公司 用于在光刻系统中转移基材的加载锁定系统和方法
WO2016158994A1 (ja) * 2015-03-31 2016-10-06 富士フイルム株式会社 パターン形成方法、フォトマスクの製造方法及び電子デバイスの製造方法
JP2016207925A (ja) 2015-04-27 2016-12-08 株式会社アドバンテスト 素子、製造方法、および露光装置
KR102358009B1 (ko) * 2015-11-10 2022-02-04 삼성전자주식회사 빔 투사 장치 및 빔 투사 장치를 이용하여 빔을 투사하는 방법
JP6589597B2 (ja) * 2015-11-25 2019-10-16 株式会社ニューフレアテクノロジー アパーチャのアライメント方法及びマルチ荷電粒子ビーム描画装置
JP6682278B2 (ja) 2016-01-19 2020-04-15 株式会社ニューフレアテクノロジー マルチ荷電粒子ビーム露光方法及びマルチ荷電粒子ビーム露光装置
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US10840056B2 (en) * 2017-02-03 2020-11-17 Kla Corporation Multi-column scanning electron microscopy system
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KR102460680B1 (ko) * 2017-10-02 2022-10-28 에이에스엠엘 네델란즈 비.브이. 하전 입자 빔들을 사용하는 장치
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Cited By (2)

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Publication number Priority date Publication date Assignee Title
KR20140043355A (ko) * 2011-04-27 2014-04-09 마퍼 리쏘그라피 아이피 비.브이. 하나 이상의 하전 입자 빔의 조종을 위한 조종기 장치를 포함하는 하전 입자 시스템
KR20170063484A (ko) * 2014-09-03 2017-06-08 가부시키가이샤 뉴플레어 테크놀로지 멀티 하전 입자빔의 블랭킹 장치, 멀티 하전 입자빔 묘화 장치, 및 멀티 하전 입자빔의 불량빔 차폐 방법

Also Published As

Publication number Publication date
TW201003713A (en) 2010-01-16
JP2011517131A (ja) 2011-05-26
KR20110007199A (ko) 2011-01-21
EP2402979A2 (en) 2012-01-04
JP2013140998A (ja) 2013-07-18
CN102067271B (zh) 2014-05-21
KR20150091417A (ko) 2015-08-10
EP2279515B1 (en) 2011-11-30
KR20150099617A (ko) 2015-08-31
JP2013140997A (ja) 2013-07-18
EP2402979B1 (en) 2013-10-23
TW201003711A (en) 2010-01-16
JP5268170B2 (ja) 2013-08-21
WO2009127659A2 (en) 2009-10-22
KR101638766B1 (ko) 2016-07-13
EP2402979A3 (en) 2012-06-27
KR101605865B1 (ko) 2016-03-24
JP5475155B2 (ja) 2014-04-16
JP5384759B2 (ja) 2014-01-08
TWI474360B (zh) 2015-02-21
EP2279515A1 (en) 2011-02-02
CN102067271A (zh) 2011-05-18
WO2009127658A1 (en) 2009-10-22
JP2011517130A (ja) 2011-05-26
KR101678823B1 (ko) 2016-11-23
CN102067272B (zh) 2014-04-30
ATE535932T1 (de) 2011-12-15
CN102067272A (zh) 2011-05-18
TW201515044A (zh) 2015-04-16
WO2009127659A3 (en) 2009-12-10
EP2281296A2 (en) 2011-02-09
TWI534849B (zh) 2016-05-21

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