KR20060065528A - 어레이 기판 검사 방법 및 장치 - Google Patents

어레이 기판 검사 방법 및 장치 Download PDF

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Publication number
KR20060065528A
KR20060065528A KR1020050119603A KR20050119603A KR20060065528A KR 20060065528 A KR20060065528 A KR 20060065528A KR 1020050119603 A KR1020050119603 A KR 1020050119603A KR 20050119603 A KR20050119603 A KR 20050119603A KR 20060065528 A KR20060065528 A KR 20060065528A
Authority
KR
South Korea
Prior art keywords
voltage
transistor
conductive state
data terminal
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020050119603A
Other languages
English (en)
Korean (ko)
Inventor
노부타카 이타가키
히데유키 노리마츠
Original Assignee
애질런트 테크놀로지스, 인크.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 애질런트 테크놀로지스, 인크. filed Critical 애질런트 테크놀로지스, 인크.
Publication of KR20060065528A publication Critical patent/KR20060065528A/ko
Withdrawn legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00—Electroluminescent light sources
    • H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Liquid Crystal (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of El Displays (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
KR1020050119603A 2004-12-09 2005-12-08 어레이 기판 검사 방법 및 장치 Withdrawn KR20060065528A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2004-00357326 2004-12-09
JP2004357326A JP2006163202A (ja) 2004-12-09 2004-12-09 アレイ基板の検査方法及び検査装置

Publications (1)

Publication Number Publication Date
KR20060065528A true KR20060065528A (ko) 2006-06-14

Family

ID=36583078

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020050119603A Withdrawn KR20060065528A (ko) 2004-12-09 2005-12-08 어레이 기판 검사 방법 및 장치

Country Status (5)

Country Link
US (1) US20060125512A1 (enExample)
JP (1) JP2006163202A (enExample)
KR (1) KR20060065528A (enExample)
CN (1) CN1790109A (enExample)
TW (1) TW200624827A (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2556961A1 (en) 2006-08-15 2008-02-15 Ignis Innovation Inc. Oled compensation technique based on oled capacitance
CN101589338B (zh) 2007-01-25 2014-09-10 东阳特克尼卡株式会社 Tft液晶面板的物理性质测量方法及tft液晶面板的物理性质测量装置
CN102456592A (zh) * 2010-10-15 2012-05-16 北京京东方光电科技有限公司 测试阵列基板上薄膜晶体管特性的方法和装置
CN103185842B (zh) * 2011-12-29 2015-03-11 北京大学 用于测量大规模阵列器件统计涨落的电路
CN102680884B (zh) * 2012-05-18 2014-07-30 北京大学 用于测量大规模阵列器件特性的电路
CN104536169B (zh) * 2014-12-31 2018-01-12 深圳市华星光电技术有限公司 一种用于获取阵列基板中电容容值的结构体及方法
KR102259356B1 (ko) * 2020-02-13 2021-06-02 포스필 주식회사 광소자를 포함하는 디스플레이 패널 검사 장치 및 방법
KR102845029B1 (ko) 2020-05-01 2025-08-11 스미토모 긴조쿠 고잔 가부시키가이샤 후막 저항 페이스트, 후막 저항체, 및 전자 부품
WO2021221173A1 (ja) 2020-05-01 2021-11-04 住友金属鉱山株式会社 厚膜抵抗ペースト、厚膜抵抗体、及び電子部品
US12249447B2 (en) 2020-05-01 2025-03-11 Sumitomo Metal Mining Co., Ltd. Thick film resistor paste, thick film resistor, and electronic component

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3698365B2 (ja) * 2002-08-29 2005-09-21 インターナショナル・ビジネス・マシーンズ・コーポレーション アレイ基板の検査装置および検査方法

Also Published As

Publication number Publication date
US20060125512A1 (en) 2006-06-15
CN1790109A (zh) 2006-06-21
TW200624827A (en) 2006-07-16
JP2006163202A (ja) 2006-06-22

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20051208

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid