TW200624827A - Method and apparatus for inspecting array substrate - Google Patents

Method and apparatus for inspecting array substrate

Info

Publication number
TW200624827A
TW200624827A TW094142294A TW94142294A TW200624827A TW 200624827 A TW200624827 A TW 200624827A TW 094142294 A TW094142294 A TW 094142294A TW 94142294 A TW94142294 A TW 94142294A TW 200624827 A TW200624827 A TW 200624827A
Authority
TW
Taiwan
Prior art keywords
transistor
voltage
data terminal
applying
array substrate
Prior art date
Application number
TW094142294A
Other languages
English (en)
Chinese (zh)
Inventor
Nobutaka Itagaki
Hideyuki Norimatsu
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of TW200624827A publication Critical patent/TW200624827A/zh

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00—Electroluminescent light sources
    • H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Liquid Crystal (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of El Displays (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW094142294A 2004-12-09 2005-12-01 Method and apparatus for inspecting array substrate TW200624827A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004357326A JP2006163202A (ja) 2004-12-09 2004-12-09 アレイ基板の検査方法及び検査装置

Publications (1)

Publication Number Publication Date
TW200624827A true TW200624827A (en) 2006-07-16

Family

ID=36583078

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094142294A TW200624827A (en) 2004-12-09 2005-12-01 Method and apparatus for inspecting array substrate

Country Status (5)

Country Link
US (1) US20060125512A1 (enExample)
JP (1) JP2006163202A (enExample)
KR (1) KR20060065528A (enExample)
CN (1) CN1790109A (enExample)
TW (1) TW200624827A (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2556961A1 (en) 2006-08-15 2008-02-15 Ignis Innovation Inc. Oled compensation technique based on oled capacitance
CN101589338B (zh) 2007-01-25 2014-09-10 东阳特克尼卡株式会社 Tft液晶面板的物理性质测量方法及tft液晶面板的物理性质测量装置
CN102456592A (zh) * 2010-10-15 2012-05-16 北京京东方光电科技有限公司 测试阵列基板上薄膜晶体管特性的方法和装置
CN103185842B (zh) * 2011-12-29 2015-03-11 北京大学 用于测量大规模阵列器件统计涨落的电路
CN102680884B (zh) * 2012-05-18 2014-07-30 北京大学 用于测量大规模阵列器件特性的电路
CN104536169B (zh) * 2014-12-31 2018-01-12 深圳市华星光电技术有限公司 一种用于获取阵列基板中电容容值的结构体及方法
KR102259356B1 (ko) * 2020-02-13 2021-06-02 포스필 주식회사 광소자를 포함하는 디스플레이 패널 검사 장치 및 방법
KR102845029B1 (ko) 2020-05-01 2025-08-11 스미토모 긴조쿠 고잔 가부시키가이샤 후막 저항 페이스트, 후막 저항체, 및 전자 부품
WO2021221173A1 (ja) 2020-05-01 2021-11-04 住友金属鉱山株式会社 厚膜抵抗ペースト、厚膜抵抗体、及び電子部品
US12249447B2 (en) 2020-05-01 2025-03-11 Sumitomo Metal Mining Co., Ltd. Thick film resistor paste, thick film resistor, and electronic component

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3698365B2 (ja) * 2002-08-29 2005-09-21 インターナショナル・ビジネス・マシーンズ・コーポレーション アレイ基板の検査装置および検査方法

Also Published As

Publication number Publication date
US20060125512A1 (en) 2006-06-15
CN1790109A (zh) 2006-06-21
KR20060065528A (ko) 2006-06-14
JP2006163202A (ja) 2006-06-22

Similar Documents

Publication Publication Date Title
US7102378B2 (en) Testing apparatus and method for thin film transistor display array
US9261545B2 (en) Capacitance voltage conversion circuit, input apparatus using the same, electronic instrument, and capacitance voltage conversion method
CN109828173B (zh) 一种负载检测系统及其负载检测方法
WO2006014972A3 (en) Impedance measurement for an implantable device
US20170300148A1 (en) Capacitance measurement circuit
SG149782A1 (en) Open circuit delay devices, systems, and methods for analyte measurement
AU2003288863A1 (en) A method and a device for voltage measurement in a high-voltage conductor
TW200624827A (en) Method and apparatus for inspecting array substrate
WO2008024688A3 (en) Method, apparatus and system relating to automatic cell threshold voltage measurement
US7710123B2 (en) Voltage variance tester
TW200500829A (en) Data latch circuit and electronic device
TW200620291A (en) Memory and semiconductor device
MXPA04008445A (es) Medicion de calidad y presencia de fluido por medio de la respuesta de inmitividad transitoria.
TW200600997A (en) Voltage detection circuit
TW200702679A (en) Leakage current detection circuit and leakage current comparison circuit
TW200532225A (en) Method for testing a TFT array
CN202210280U (zh) 串行数据传输系统
JP2006163202A5 (enExample)
US9983725B2 (en) Mutual capacitance sensing circuit with increased sensitivity
EP1353187A3 (en) Measuring junction leakage
AU2003296804A1 (en) Secure electronic entity for time certification
JP3264222B2 (ja) 半導体装置の絶縁膜のリーク電流測定方法
TW201702783A (zh) 隨負載變化而調整輸出電壓的補償方法及其補償電路
NO20032016D0 (no) Anordning og fremgangsmåte for elektrisk potensialfiksering
KR20090103340A (ko) 박막 트랜지스터 디스플레이 어레이에 대한 테스트 장치 및방법