JP2006163202A - アレイ基板の検査方法及び検査装置 - Google Patents

アレイ基板の検査方法及び検査装置 Download PDF

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Publication number
JP2006163202A
JP2006163202A JP2004357326A JP2004357326A JP2006163202A JP 2006163202 A JP2006163202 A JP 2006163202A JP 2004357326 A JP2004357326 A JP 2004357326A JP 2004357326 A JP2004357326 A JP 2004357326A JP 2006163202 A JP2006163202 A JP 2006163202A
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JP
Japan
Prior art keywords
voltage
transistor
data terminal
terminal
gon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004357326A
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English (en)
Japanese (ja)
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JP2006163202A5 (enExample
Inventor
Nobutaka Itagaki
信孝 板垣
Hideyuki Norimatsu
秀行 乗松
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Priority to JP2004357326A priority Critical patent/JP2006163202A/ja
Priority to TW094142294A priority patent/TW200624827A/zh
Priority to CNA2005101279747A priority patent/CN1790109A/zh
Priority to US11/296,956 priority patent/US20060125512A1/en
Priority to KR1020050119603A priority patent/KR20060065528A/ko
Publication of JP2006163202A publication Critical patent/JP2006163202A/ja
Publication of JP2006163202A5 publication Critical patent/JP2006163202A5/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00—Electroluminescent light sources
    • H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Liquid Crystal (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Control Of El Displays (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP2004357326A 2004-12-09 2004-12-09 アレイ基板の検査方法及び検査装置 Pending JP2006163202A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2004357326A JP2006163202A (ja) 2004-12-09 2004-12-09 アレイ基板の検査方法及び検査装置
TW094142294A TW200624827A (en) 2004-12-09 2005-12-01 Method and apparatus for inspecting array substrate
CNA2005101279747A CN1790109A (zh) 2004-12-09 2005-12-07 检验阵列衬底的方法和装置
US11/296,956 US20060125512A1 (en) 2004-12-09 2005-12-08 Method and apparatus for inspecting array substrate
KR1020050119603A KR20060065528A (ko) 2004-12-09 2005-12-08 어레이 기판 검사 방법 및 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004357326A JP2006163202A (ja) 2004-12-09 2004-12-09 アレイ基板の検査方法及び検査装置

Publications (2)

Publication Number Publication Date
JP2006163202A true JP2006163202A (ja) 2006-06-22
JP2006163202A5 JP2006163202A5 (enExample) 2008-01-31

Family

ID=36583078

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004357326A Pending JP2006163202A (ja) 2004-12-09 2004-12-09 アレイ基板の検査方法及び検査装置

Country Status (5)

Country Link
US (1) US20060125512A1 (enExample)
JP (1) JP2006163202A (enExample)
KR (1) KR20060065528A (enExample)
CN (1) CN1790109A (enExample)
TW (1) TW200624827A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010500620A (ja) * 2006-08-15 2010-01-07 イグニス・イノベイション・インコーポレーテッド Ｏｌｅｄの輝度劣化補償
KR20230004484A (ko) 2020-05-01 2023-01-06 스미토모 긴조쿠 고잔 가부시키가이샤 후막 저항 페이스트, 후막 저항체, 및 전자 부품
KR20230004487A (ko) 2020-05-01 2023-01-06 스미토모 긴조쿠 고잔 가부시키가이샤 후막 저항 페이스트, 후막 저항체, 및 전자 부품
KR20230004485A (ko) 2020-05-01 2023-01-06 스미토모 긴조쿠 고잔 가부시키가이샤 후막 저항 페이스트, 후막 저항체, 및 전자 부품

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101589338B (zh) 2007-01-25 2014-09-10 东阳特克尼卡株式会社 Tft液晶面板的物理性质测量方法及tft液晶面板的物理性质测量装置
CN102456592A (zh) * 2010-10-15 2012-05-16 北京京东方光电科技有限公司 测试阵列基板上薄膜晶体管特性的方法和装置
CN103185842B (zh) * 2011-12-29 2015-03-11 北京大学 用于测量大规模阵列器件统计涨落的电路
CN102680884B (zh) * 2012-05-18 2014-07-30 北京大学 用于测量大规模阵列器件特性的电路
CN104536169B (zh) * 2014-12-31 2018-01-12 深圳市华星光电技术有限公司 一种用于获取阵列基板中电容容值的结构体及方法
KR102259356B1 (ko) * 2020-02-13 2021-06-02 포스필 주식회사 광소자를 포함하는 디스플레이 패널 검사 장치 및 방법

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3698365B2 (ja) * 2002-08-29 2005-09-21 インターナショナル・ビジネス・マシーンズ・コーポレーション アレイ基板の検査装置および検査方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010500620A (ja) * 2006-08-15 2010-01-07 イグニス・イノベイション・インコーポレーテッド Ｏｌｅｄの輝度劣化補償
KR20230004484A (ko) 2020-05-01 2023-01-06 스미토모 긴조쿠 고잔 가부시키가이샤 후막 저항 페이스트, 후막 저항체, 및 전자 부품
KR20230004487A (ko) 2020-05-01 2023-01-06 스미토모 긴조쿠 고잔 가부시키가이샤 후막 저항 페이스트, 후막 저항체, 및 전자 부품
KR20230004485A (ko) 2020-05-01 2023-01-06 스미토모 긴조쿠 고잔 가부시키가이샤 후막 저항 페이스트, 후막 저항체, 및 전자 부품

Also Published As

Publication number Publication date
US20060125512A1 (en) 2006-06-15
CN1790109A (zh) 2006-06-21
KR20060065528A (ko) 2006-06-14
TW200624827A (en) 2006-07-16

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