KR20010050814A - 소스 동기 신호의 검사 방법 및 장치 - Google Patents

소스 동기 신호의 검사 방법 및 장치 Download PDF

Info

Publication number
KR20010050814A
KR20010050814A KR1020000057947A KR20000057947A KR20010050814A KR 20010050814 A KR20010050814 A KR 20010050814A KR 1020000057947 A KR1020000057947 A KR 1020000057947A KR 20000057947 A KR20000057947 A KR 20000057947A KR 20010050814 A KR20010050814 A KR 20010050814A
Authority
KR
South Korea
Prior art keywords
dut
signal
data signal
output
comparator
Prior art date
Application number
KR1020000057947A
Other languages
English (en)
Korean (ko)
Inventor
가르시아로돌포에프.
Original Assignee
하이든 마틴
슐럼버거 테크놀로지즈, 아이엔씨.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 하이든 마틴, 슐럼버거 테크놀로지즈, 아이엔씨. filed Critical 하이든 마틴
Publication of KR20010050814A publication Critical patent/KR20010050814A/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020000057947A 1999-10-01 2000-10-02 소스 동기 신호의 검사 방법 및 장치 KR20010050814A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US41056999A 1999-10-01 1999-10-01
US9/410,569 1999-10-01

Publications (1)

Publication Number Publication Date
KR20010050814A true KR20010050814A (ko) 2001-06-25

Family

ID=23625308

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020000057947A KR20010050814A (ko) 1999-10-01 2000-10-02 소스 동기 신호의 검사 방법 및 장치

Country Status (6)

Country Link
US (1) US6775637B2 (US20070244113A1-20071018-C00087.png)
JP (1) JP2001141792A (US20070244113A1-20071018-C00087.png)
KR (1) KR20010050814A (US20070244113A1-20071018-C00087.png)
DE (1) DE10048895A1 (US20070244113A1-20071018-C00087.png)
FR (1) FR2804761B1 (US20070244113A1-20071018-C00087.png)
TW (1) TWI229195B (US20070244113A1-20071018-C00087.png)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7079612B2 (en) * 2002-01-29 2006-07-18 Texas Instruments Incorporated Fast bit-error-rate (BER) test
US6974252B2 (en) * 2003-03-11 2005-12-13 Intel Corporation Failsafe mechanism for preventing an integrated circuit from overheating
JP4906030B2 (ja) * 2004-10-15 2012-03-28 川崎マイクロエレクトロニクス株式会社 テスト回路およびテスト方法
US7469354B2 (en) * 2005-04-21 2008-12-23 Infineon Technologies Ag Circuit including a deskew circuit for asymmetrically delaying rising and falling edges
US7548105B2 (en) * 2005-06-10 2009-06-16 Integrated Device Technology, Inc Method and apparatus for source synchronous testing
US7461295B1 (en) * 2005-07-29 2008-12-02 Netlogic Microsystems, Inc. Timing failure analysis in a semiconductor device having a pipelined architecture
JP2007088712A (ja) * 2005-09-21 2007-04-05 Seiko Instruments Inc ノイズフィルタ回路
KR100706829B1 (ko) * 2005-10-19 2007-04-13 주식회사 하이닉스반도체 반도체 메모리의 파워 업 신호 생성장치 및 방법
KR101228270B1 (ko) * 2006-05-01 2013-01-30 주식회사 아도반테스토 시험 장치 및 시험 방법
US7761751B1 (en) 2006-05-12 2010-07-20 Credence Systems Corporation Test and diagnosis of semiconductors
US7756664B2 (en) 2007-03-21 2010-07-13 Advantest Corporation Test apparatus and measurement circuit
KR100956782B1 (ko) * 2008-09-24 2010-05-12 주식회사 하이닉스반도체 셋업/홀드 타임 테스트 장치 및 방법
CN102401878A (zh) * 2010-09-08 2012-04-04 凌阳科技股份有限公司 混合模式集成电路的测试系统及方法
TWI435090B (zh) * 2011-07-05 2014-04-21 Wistron Corp 快門眼鏡的測試架構、方法及系統
JP2013024729A (ja) * 2011-07-21 2013-02-04 Yokogawa Electric Corp 半導体試験装置における電気長測定方法
CN104101767A (zh) * 2014-08-08 2014-10-15 长沙金艺电子科技有限公司 一种从高压母线上直接取电压信号的避雷器阻性电流测试仪

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4554636A (en) 1982-09-30 1985-11-19 Allied Corporation Apparatus for testing circuits within a system
JPS6089773A (ja) 1983-08-01 1985-05-20 フエアチアイルド　カメラ　アンド　インストルメント　コ−ポレ−シヨン 自動テスト方式における信号のタイミングを動的に制御する方法及び装置
US4813005A (en) 1987-06-24 1989-03-14 Hewlett-Packard Company Device for synchronizing the output pulses of a circuit with an input clock
US4837521A (en) 1987-07-02 1989-06-06 Schlumberger Systems & Services, Inc. Delay line control system for automatic test equipment
JP2688941B2 (ja) 1988-08-29 1997-12-10 株式会社アドバンテスト 位相補正装置
US5293374A (en) 1989-03-29 1994-03-08 Hewlett-Packard Company Measurement system control using real-time clocks and data buffers
US5289116A (en) 1990-05-31 1994-02-22 Hewlett Packard Company Apparatus and method for testing electronic devices
DE4334264C2 (de) * 1993-03-02 1996-08-14 Hewlett Packard Co Triggerschaltung
JPH0758605A (ja) * 1993-08-17 1995-03-03 Fujitsu Ltd 自動位相調整回路
JPH07110359A (ja) * 1993-10-12 1995-04-25 Hitachi Ltd Ｌｓｉ試験装置
US5526286A (en) 1994-02-16 1996-06-11 Tektronix, Inc. Oversampled logic analyzer
US5577236A (en) 1994-12-30 1996-11-19 International Business Machines Corporation Memory controller for reading data from synchronous RAM
WO1996029655A1 (en) * 1995-03-20 1996-09-26 Hitachi, Ltd. Device and method for transferring data
US5886536A (en) * 1995-07-20 1999-03-23 Advantest Corp. Semiconductor tester synchronized with external clock
JP3367009B2 (ja) * 1995-08-31 2003-01-14 京セラ株式会社 プリンタ装置における同期式データ伝送方式
US5774001A (en) 1995-12-20 1998-06-30 Intel Corporation Method for eliminating multiple output switching timing skews in a source synchronous design
US5696951A (en) 1996-01-03 1997-12-09 Credence Systems Corporation Signal deskewing system for synchronous logic circuit
US5875153A (en) 1997-04-30 1999-02-23 Texas Instruments Incorporated Internal/external clock option for built-in self test
US6209072B1 (en) 1997-05-06 2001-03-27 Intel Corporation Source synchronous interface between master and slave using a deskew latch
CA2206614A1 (en) 1997-05-30 1998-11-30 Richard A. Kupnicki Method and apparatus for absolute time descriptor universal reference signals for the synchronization of video and audio equipment in analog and digital areas
US5946712A (en) 1997-06-04 1999-08-31 Oak Technology, Inc. Apparatus and method for reading data from synchronous memory
US6085345A (en) 1997-12-24 2000-07-04 Intel Corporation Timing control for input/output testability
JP3349943B2 (ja) * 1998-03-03 2002-11-25 日本電気株式会社 半導体装置
JP3114934B2 (ja) * 1998-10-09 2000-12-04 株式会社アドバンテスト 自動パターン同期回路及び同期方法
US6167001A (en) 1999-01-26 2000-12-26 Xilinx, Inc. Method and apparatus for measuring setup and hold times for element microelectronic device
JP2001251283A (ja) * 2000-03-06 2001-09-14 Hitachi Ltd インターフェース回路

Also Published As

Publication number Publication date
JP2001141792A (ja) 2001-05-25
US6775637B2 (en) 2004-08-10
FR2804761A1 (fr) 2001-08-10
DE10048895A1 (de) 2001-06-13
US20030229466A1 (en) 2003-12-11
FR2804761B1 (fr) 2003-02-21
TWI229195B (en) 2005-03-11

Similar Documents

Publication Publication Date Title
KR20010050814A (ko) 소스 동기 신호의 검사 방법 및 장치
EP1131645B1 (en) A skew calibration means and method of skew calibration
KR100402653B1 (ko) Ｉｃ 시험장치의 타이밍 교정방법 및 그 교정방법을이용한 교정기능을 갖는 ｉｃ 시험장치
JP4091957B2 (ja) 複数のクロック発生回路を含むテスト可能な集積回路
KR100335683B1 (ko) 속도 관련 결함을 테스트하기 위해 멀티플렉서 스캔플립플롭을 이용하는 방법 및 장치
US6356096B2 (en) Test board for testing a semiconductor device utilizing first and second delay elements in a signal-transmission-path
US6263463B1 (en) Timing adjustment circuit for semiconductor test system
US6956422B2 (en) Generation and measurement of timing delays by digital phase error compensation
US20080126897A1 (en) System and method for generating self-synchronized launch of last shift capture pulses using on-chip phase locked loop for at-speed scan testing
US20080126898A1 (en) System and method for generating on-chip individual clock domain based scan enable signal used for launch of last shift type of at-speed scan testing
US6857089B2 (en) Differential receiver architecture
JP2002139553A (ja) 電子回路素子の端部位置特定およびジッタの測定装置
US6470483B1 (en) Method and apparatus for measuring internal clock skew
US7096144B1 (en) Digital signal sampler
CN216595393U (zh) 时间延迟测试装置
West Accuracy requirements in at-speed functional test
KR20220095437A (ko) 반도체 소자의 테스트 및 타이밍 보정 기능을 구비한 테스트 장치
US5754063A (en) Method and apparatus to measure internal node timing
US5867694A (en) Information handling system including apparatus and method for controlling clock signals operating at different frequencies
US6748563B1 (en) Method and apparatus for testing path delays in a high-speed boundary scan implementation
GB2371116A (en) Test method and apparatus for source synchronous signals
TW452906B (en) A skew calibration means and a method of skew calibration
US20090167381A1 (en) Time Measurement of Periodic Signals
JPH11125660A (ja) 半導体試験装置用タイミング発生器
GB2608396A (en) Sampling signals

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E601 Decision to refuse application