KR20010022326A - 임피던스 제어 회로 - Google Patents
임피던스 제어 회로 Download PDFInfo
- Publication number
- KR20010022326A KR20010022326A KR1020007000905A KR20007000905A KR20010022326A KR 20010022326 A KR20010022326 A KR 20010022326A KR 1020007000905 A KR1020007000905 A KR 1020007000905A KR 20007000905 A KR20007000905 A KR 20007000905A KR 20010022326 A KR20010022326 A KR 20010022326A
- Authority
- KR
- South Korea
- Prior art keywords
- impedance
- output buffer
- adjusting
- interface circuit
- data signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 239000000872 buffer Substances 0.000 claims abstract description 124
- 238000000034 method Methods 0.000 claims abstract description 40
- 230000008878 coupling Effects 0.000 claims description 20
- 238000010168 coupling process Methods 0.000 claims description 20
- 238000005859 coupling reaction Methods 0.000 claims description 20
- 238000013459 approach Methods 0.000 description 30
- 238000005070 sampling Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 9
- 230000008901 benefit Effects 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 229910044991 metal oxide Inorganic materials 0.000 description 3
- 150000004706 metal oxides Chemical class 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
- H03K19/017545—Coupling arrangements; Impedance matching circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0005—Modifications of input or output impedance
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Logic Circuits (AREA)
- Dc Digital Transmission (AREA)
- Networks Using Active Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US8/902,345 | 1997-07-29 | ||
| US08/902,345 US6087847A (en) | 1997-07-29 | 1997-07-29 | Impedance control circuit |
| PCT/US1998/014846 WO1999006845A2 (en) | 1997-07-29 | 1998-07-17 | Impedance control circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20010022326A true KR20010022326A (ko) | 2001-03-15 |
Family
ID=25415727
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020007000905A Ceased KR20010022326A (ko) | 1997-07-29 | 1998-07-17 | 임피던스 제어 회로 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US6087847A (https=) |
| EP (1) | EP1010013B1 (https=) |
| JP (1) | JP4274688B2 (https=) |
| KR (1) | KR20010022326A (https=) |
| AU (1) | AU8495298A (https=) |
| DE (1) | DE69822479T2 (https=) |
| TW (1) | TW461995B (https=) |
| WO (1) | WO1999006845A2 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100702838B1 (ko) * | 2005-05-09 | 2007-04-03 | 삼성전자주식회사 | 반도체 장치에서의 임피던스 콘트롤러블 출력 구동회로 및그에 따른 임피던스 콘트롤 방법 |
Families Citing this family (91)
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| JP4101973B2 (ja) * | 1999-05-21 | 2008-06-18 | 株式会社ルネサステクノロジ | 出力バッファ回路 |
| US6292407B1 (en) * | 1999-10-12 | 2001-09-18 | Micron Technolgy, Inc. | Method and apparatus for circuit variable updates |
| US6300789B1 (en) * | 1999-12-22 | 2001-10-09 | Intel Corporation | Dynamic termination for non-symmetric transmission line network topologies |
| US6566903B1 (en) * | 1999-12-28 | 2003-05-20 | Intel Corporation | Method and apparatus for dynamically controlling the performance of buffers under different performance conditions |
| US6331785B1 (en) * | 2000-01-26 | 2001-12-18 | Cirrus Logic, Inc. | Polling to determine optimal impedance |
| US6501292B1 (en) * | 2000-03-02 | 2002-12-31 | Intel Corporation | CMOS circuit for maintaining a constant slew rate |
| US6462588B2 (en) * | 2000-04-03 | 2002-10-08 | Rambus, Inc. | Asymmetry control for an output driver |
| US6329836B1 (en) * | 2000-05-26 | 2001-12-11 | Sun Microsystems, Inc. | Resistive arrayed high speed output driver with pre-distortion |
| US6392441B1 (en) * | 2000-06-13 | 2002-05-21 | Ramtron International Corporation | Fast response circuit |
| US6624659B1 (en) * | 2000-06-30 | 2003-09-23 | Intel Corporation | Dynamically updating impedance compensation code for input and output drivers |
| US7222208B1 (en) | 2000-08-23 | 2007-05-22 | Intel Corporation | Simultaneous bidirectional port with synchronization circuit to synchronize the port with another port |
| US6424175B1 (en) | 2000-09-11 | 2002-07-23 | Intel Corporation | Biased control loop circuit for setting impedance of output driver |
| KR100356576B1 (ko) * | 2000-09-15 | 2002-10-18 | 삼성전자 주식회사 | 프로그래머블 온 칩 터미네이션 동작을 갖는 프로그래머블데이터 출력회로 및 그 제어방법 |
| US6445245B1 (en) | 2000-10-06 | 2002-09-03 | Xilinx, Inc. | Digitally controlled impedance for I/O of an integrated circuit device |
| US6445170B1 (en) | 2000-10-24 | 2002-09-03 | Intel Corporation | Current source with internal variable resistance and control loop for reduced process sensitivity |
| KR100391148B1 (ko) * | 2000-11-02 | 2003-07-16 | 삼성전자주식회사 | 프로그래머블 임피던스 제어회로 및 방법 |
| US6420899B1 (en) | 2000-12-29 | 2002-07-16 | Intel Corporation | Dynamic impedance matched driver for improved slew rate and glitch termination |
| US6396301B1 (en) * | 2001-01-19 | 2002-05-28 | Dell Products L.P. | Ground bounce prediction methodology and use of same in data error reduction |
| US6529041B1 (en) | 2001-03-23 | 2003-03-04 | Xilinx, Inc. | System power control output circuit for programmable logic devices |
| US6448807B1 (en) | 2001-03-29 | 2002-09-10 | Intel Corporation | Dynamic impedance controlled driver for improved slew rate and glitch termination |
| US6448811B1 (en) | 2001-04-02 | 2002-09-10 | Intel Corporation | Integrated circuit current reference |
| US6522174B2 (en) * | 2001-04-16 | 2003-02-18 | Intel Corporation | Differential cascode current mode driver |
| US6507225B2 (en) | 2001-04-16 | 2003-01-14 | Intel Corporation | Current mode driver with variable equalization |
| US6545522B2 (en) * | 2001-05-17 | 2003-04-08 | Intel Corporation | Apparatus and method to provide a single reference component for multiple circuit compensation using digital impedance code shifting |
| US6535047B2 (en) * | 2001-05-17 | 2003-03-18 | Intel Corporation | Apparatus and method to use a single reference component in a master-slave configuration for multiple circuit compensation |
| US6597233B2 (en) | 2001-05-25 | 2003-07-22 | International Business Machines Corporation | Differential SCSI driver rise time and amplitude control circuit |
| US6791356B2 (en) | 2001-06-28 | 2004-09-14 | Intel Corporation | Bidirectional port with clock channel used for synchronization |
| US6603329B1 (en) | 2001-08-29 | 2003-08-05 | Altera Corporation | Systems and methods for on-chip impedance termination |
| US6798237B1 (en) | 2001-08-29 | 2004-09-28 | Altera Corporation | On-chip impedance matching circuit |
| US6529037B1 (en) | 2001-09-13 | 2003-03-04 | Intel Corporation | Voltage mode bidirectional port with data channel used for synchronization |
| US6525569B1 (en) * | 2001-09-21 | 2003-02-25 | International Business Machines Corporation | Driver circuit having shapable transition waveforms |
| US6590413B1 (en) | 2001-10-03 | 2003-07-08 | Altera Corporation | Self-tracking integrated differential termination resistance |
| US6597198B2 (en) | 2001-10-05 | 2003-07-22 | Intel Corporation | Current mode bidirectional port with data channel used for synchronization |
| US6812732B1 (en) | 2001-12-04 | 2004-11-02 | Altera Corporation | Programmable parallel on-chip parallel termination impedance and impedance matching |
| US6836144B1 (en) | 2001-12-10 | 2004-12-28 | Altera Corporation | Programmable series on-chip termination impedance and impedance matching |
| US7109744B1 (en) | 2001-12-11 | 2006-09-19 | Altera Corporation | Programmable termination with DC voltage level control |
| US6812734B1 (en) | 2001-12-11 | 2004-11-02 | Altera Corporation | Programmable termination with DC voltage level control |
| US6642742B1 (en) * | 2002-03-21 | 2003-11-04 | Advanced Micro Devices, Inc. | Method and apparatus for controlling output impedance |
| JP4212309B2 (ja) * | 2002-07-01 | 2009-01-21 | 株式会社ルネサステクノロジ | 半導体集積回路 |
| KR100495660B1 (ko) * | 2002-07-05 | 2005-06-16 | 삼성전자주식회사 | 온-다이 종결 회로를 구비한 반도체 집적 회로 장치 |
| US6836142B2 (en) | 2002-07-12 | 2004-12-28 | Xilinx, Inc. | Asymmetric bidirectional bus implemented using an I/O device with a digitally controlled impedance |
| US6963218B1 (en) | 2002-08-09 | 2005-11-08 | Xilinx, Inc. | Bi-directional interface and communication link |
| US7194559B2 (en) * | 2002-08-29 | 2007-03-20 | Intel Corporation | Slave I/O driver calibration using error-nulling master reference |
| US6930506B2 (en) * | 2002-10-22 | 2005-08-16 | International Business Machines Corporation | Terminating resistor driver for high speed data communication |
| US20040212399A1 (en) * | 2002-11-29 | 2004-10-28 | Daniel Mulligan | Programmable driver for use in a multiple function handheld device |
| US6998875B2 (en) * | 2002-12-10 | 2006-02-14 | Ip-First, Llc | Output driver impedance controller |
| US6985008B2 (en) * | 2002-12-13 | 2006-01-10 | Ip-First, Llc | Apparatus and method for precisely controlling termination impedance |
| US6949949B2 (en) * | 2002-12-17 | 2005-09-27 | Ip-First, Llc | Apparatus and method for adjusting the impedance of an output driver |
| US6788100B2 (en) * | 2003-01-31 | 2004-09-07 | Blueheron Semiconductor Corporation | Resistor mirror |
| US7129738B2 (en) * | 2003-03-04 | 2006-10-31 | Micron Technology, Inc. | Method and apparatus for calibrating driver impedance |
| JP4428504B2 (ja) * | 2003-04-23 | 2010-03-10 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
| US20040263203A1 (en) * | 2003-06-27 | 2004-12-30 | Intel Corporation | Signal compensation |
| US6888369B1 (en) | 2003-07-17 | 2005-05-03 | Altera Corporation | Programmable on-chip differential termination impedance |
| US6888370B1 (en) | 2003-08-20 | 2005-05-03 | Altera Corporation | Dynamically adjustable termination impedance control techniques |
| US6859064B1 (en) | 2003-08-20 | 2005-02-22 | Altera Corporation | Techniques for reducing leakage current in on-chip impedance termination circuits |
| US7330993B2 (en) * | 2003-09-29 | 2008-02-12 | Intel Corporation | Slew rate control mechanism |
| JP4086757B2 (ja) * | 2003-10-23 | 2008-05-14 | Necエレクトロニクス株式会社 | 半導体集積回路の入出力インターフェース回路 |
| JP4290537B2 (ja) * | 2003-11-26 | 2009-07-08 | 株式会社ルネサステクノロジ | 半導体装置 |
| JP2007517450A (ja) * | 2003-12-23 | 2007-06-28 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | ロード認知回路装置 |
| TWI304529B (en) * | 2004-01-30 | 2008-12-21 | Realtek Semiconductor Corp | Impedance control circuit and method thereof |
| KR100640782B1 (ko) * | 2004-04-16 | 2006-11-06 | 주식회사 하이닉스반도체 | 반도체 기억 장치 |
| US7248636B2 (en) * | 2004-04-20 | 2007-07-24 | Hewlett-Packard Development Company, L.P. | Systems and methods for adjusting an output driver |
| US7126394B2 (en) * | 2004-05-17 | 2006-10-24 | Micron Technology, Inc. | History-based slew rate control to reduce intersymbol interference |
| JP4536449B2 (ja) * | 2004-07-29 | 2010-09-01 | 富士通株式会社 | ドライバ回路、半導体装置、及び電子機器 |
| FR2878665B1 (fr) * | 2004-11-30 | 2007-05-25 | St Microelectronics Rousset | Circuit amplificateur a transconductance a gain negatif |
| US7221193B1 (en) | 2005-01-20 | 2007-05-22 | Altera Corporation | On-chip termination with calibrated driver strength |
| US7218155B1 (en) | 2005-01-20 | 2007-05-15 | Altera Corporation | Techniques for controlling on-chip termination resistance using voltage range detection |
| US7679397B1 (en) | 2005-08-05 | 2010-03-16 | Altera Corporation | Techniques for precision biasing output driver for a calibrated on-chip termination circuit |
| KR100746200B1 (ko) | 2005-10-21 | 2007-08-06 | 삼성전자주식회사 | 소스 드라이버, 소스 드라이버 모듈, 및 디스플레이 장치 |
| US8213894B2 (en) | 2005-12-29 | 2012-07-03 | Intel Corporation | Integrated circuit passive signal distribution |
| US20070252638A1 (en) * | 2006-04-26 | 2007-11-01 | Farrukh Aquil | Method and apparatus for temperature compensating off chip driver (OCD) circuit |
| US7486104B2 (en) * | 2006-06-02 | 2009-02-03 | Rambus Inc. | Integrated circuit with graduated on-die termination |
| KR100733449B1 (ko) | 2006-06-30 | 2007-06-28 | 주식회사 하이닉스반도체 | 반도체메모리소자의 온 다이 터미네이션 |
| JP4958719B2 (ja) * | 2006-10-20 | 2012-06-20 | ルネサスエレクトロニクス株式会社 | 半導体集積回路 |
| TW200910373A (en) | 2007-06-08 | 2009-03-01 | Mosaid Technologies Inc | Dynamic impedance control for input/output buffers |
| US7550993B2 (en) * | 2007-08-21 | 2009-06-23 | Texas Instruments Incorporated | Glitch reduced compensated circuits and methods for using such |
| US7876123B2 (en) * | 2007-10-09 | 2011-01-25 | Lsi Corporation | High speed multiple memory interface I/O cell |
| JP5059580B2 (ja) * | 2007-12-20 | 2012-10-24 | ルネサスエレクトロニクス株式会社 | 終端回路 |
| JP5109647B2 (ja) * | 2007-12-25 | 2012-12-26 | 凸版印刷株式会社 | ドライバ回路 |
| US7969181B1 (en) * | 2008-02-03 | 2011-06-28 | Freescale Semiconductor, Inc. | Device and method for adjusting an impedance of an output driver of an integrated circuit |
| US7653505B1 (en) * | 2008-03-14 | 2010-01-26 | Xilinx, Inc. | Method and apparatus for testing a controlled impedance buffer |
| US7443194B1 (en) * | 2008-04-24 | 2008-10-28 | International Business Machines Corporation | I/O driver for integrated circuit with output impedance control |
| JP5584401B2 (ja) * | 2008-08-23 | 2014-09-03 | ピーエスフォー ルクスコ エスエイアールエル | 半導体装置及びこれを備えるデータ処理システム |
| US7821290B2 (en) * | 2008-09-26 | 2010-10-26 | Vitesse Semiconductor Corporation | Differential voltage mode driver and digital impedance caliberation of same |
| US20100164471A1 (en) * | 2008-12-30 | 2010-07-01 | M2000 | Calibration of programmable i/o components using a virtual variable external resistor |
| US7888968B2 (en) * | 2009-01-15 | 2011-02-15 | International Business Machines Corporation | Configurable pre-emphasis driver with selective constant and adjustable output impedance modes |
| US8030968B1 (en) * | 2010-04-07 | 2011-10-04 | Intel Corporation | Staged predriver for high speed differential transmitter |
| JP2014146409A (ja) * | 2014-03-12 | 2014-08-14 | Ps4 Luxco S A R L | 半導体集積回路装置及びその試験方法 |
| JP7806447B2 (ja) * | 2021-11-09 | 2026-01-27 | 富士電機株式会社 | 集積回路 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5134311A (en) * | 1990-06-07 | 1992-07-28 | International Business Machines Corporation | Self-adjusting impedance matching driver |
| US5243229A (en) * | 1991-06-28 | 1993-09-07 | At&T Bell Laboratories | Digitally controlled element sizing |
| US5254883A (en) * | 1992-04-22 | 1993-10-19 | Rambus, Inc. | Electrical current source circuitry for a bus |
| FR2709217B1 (fr) * | 1993-08-19 | 1995-09-15 | Bull Sa | Procédé et dispositif d'adaptation d'impédance pour un émetteur et/ou récepteur, circuit intégré et système de transmission les mettant en Óoeuvre. |
| US5457407A (en) * | 1994-07-06 | 1995-10-10 | Sony Electronics Inc. | Binary weighted reference circuit for a variable impedance output buffer |
| JP3484825B2 (ja) * | 1995-06-09 | 2004-01-06 | 株式会社デンソー | ドライバ回路 |
| US5872471A (en) * | 1995-12-25 | 1999-02-16 | Hitachi, Ltd. | Simultaneous bidirectional transmission circuit |
| US5666078A (en) * | 1996-02-07 | 1997-09-09 | International Business Machines Corporation | Programmable impedance output driver |
| US5726583A (en) * | 1996-07-19 | 1998-03-10 | Kaplinsky; Cecil H. | Programmable dynamic line-termination circuit |
-
1997
- 1997-07-29 US US08/902,345 patent/US6087847A/en not_active Expired - Lifetime
-
1998
- 1998-07-17 DE DE69822479T patent/DE69822479T2/de not_active Expired - Lifetime
- 1998-07-17 KR KR1020007000905A patent/KR20010022326A/ko not_active Ceased
- 1998-07-17 WO PCT/US1998/014846 patent/WO1999006845A2/en not_active Ceased
- 1998-07-17 AU AU84952/98A patent/AU8495298A/en not_active Abandoned
- 1998-07-17 EP EP98935769A patent/EP1010013B1/en not_active Expired - Lifetime
- 1998-07-17 JP JP2000505524A patent/JP4274688B2/ja not_active Expired - Fee Related
- 1998-07-20 TW TW087111793A patent/TW461995B/zh not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100702838B1 (ko) * | 2005-05-09 | 2007-04-03 | 삼성전자주식회사 | 반도체 장치에서의 임피던스 콘트롤러블 출력 구동회로 및그에 따른 임피던스 콘트롤 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW461995B (en) | 2001-11-01 |
| EP1010013B1 (en) | 2004-03-17 |
| DE69822479D1 (de) | 2004-04-22 |
| JP4274688B2 (ja) | 2009-06-10 |
| AU8495298A (en) | 1999-02-22 |
| EP1010013A4 (en) | 2000-10-18 |
| JP2001512296A (ja) | 2001-08-21 |
| DE69822479T2 (de) | 2004-08-19 |
| EP1010013A2 (en) | 2000-06-21 |
| WO1999006845A3 (en) | 1999-09-10 |
| HK1027398A1 (en) | 2001-01-12 |
| US6087847A (en) | 2000-07-11 |
| WO1999006845A2 (en) | 1999-02-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0105 | International application |
Patent event date: 20000127 Patent event code: PA01051R01D Comment text: International Patent Application |
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