KR102518086B1 - 도금 장치 - Google Patents
도금 장치 Download PDFInfo
- Publication number
- KR102518086B1 KR102518086B1 KR1020227029232A KR20227029232A KR102518086B1 KR 102518086 B1 KR102518086 B1 KR 102518086B1 KR 1020227029232 A KR1020227029232 A KR 1020227029232A KR 20227029232 A KR20227029232 A KR 20227029232A KR 102518086 B1 KR102518086 B1 KR 102518086B1
- Authority
- KR
- South Korea
- Prior art keywords
- plating
- substrate
- film thickness
- module
- plated
- Prior art date
Links
- 238000007747 plating Methods 0.000 title claims abstract description 266
- 239000000758 substrate Substances 0.000 claims abstract description 243
- 238000001514 detection method Methods 0.000 claims abstract description 28
- 238000005259 measurement Methods 0.000 claims abstract description 18
- 238000012545 processing Methods 0.000 claims abstract description 12
- 238000000034 method Methods 0.000 claims description 48
- 230000008569 process Effects 0.000 claims description 47
- 230000007246 mechanism Effects 0.000 claims description 29
- 230000008859 change Effects 0.000 claims description 15
- 230000005684 electric field Effects 0.000 claims description 2
- 238000012546 transfer Methods 0.000 description 22
- 238000004140 cleaning Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 10
- 239000007788 liquid Substances 0.000 description 9
- 230000032258 transport Effects 0.000 description 9
- 239000012528 membrane Substances 0.000 description 7
- 235000012431 wafers Nutrition 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 238000001035 drying Methods 0.000 description 3
- 238000003756 stirring Methods 0.000 description 3
- 239000003989 dielectric material Substances 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000001965 increasing effect Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000011897 real-time detection Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
- C25D21/12—Process control or regulation
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/008—Current shielding devices
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/06—Suspending or supporting devices for articles to be coated
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/06—Suspending or supporting devices for articles to be coated
- C25D17/08—Supporting racks, i.e. not for suspending
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/10—Electrodes, e.g. composition, counter electrode
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
- C25D21/10—Agitating of electrolytes; Moving of racks
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
- C25D5/022—Electroplating of selected surface areas using masking means
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Automation & Control Theory (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Electroplating Methods And Accessories (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2021/021358 WO2022254690A1 (fr) | 2021-06-04 | 2021-06-04 | Dispositif de placage |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20220164696A KR20220164696A (ko) | 2022-12-13 |
KR102518086B1 true KR102518086B1 (ko) | 2023-04-06 |
Family
ID=81731724
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020227029232A KR102518086B1 (ko) | 2021-06-04 | 2021-06-04 | 도금 장치 |
Country Status (5)
Country | Link |
---|---|
US (1) | US20240218553A1 (fr) |
JP (1) | JP7074937B1 (fr) |
KR (1) | KR102518086B1 (fr) |
CN (1) | CN115698389B (fr) |
WO (1) | WO2022254690A1 (fr) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2024042700A1 (fr) * | 2022-08-26 | 2024-02-29 | 株式会社荏原製作所 | Dispositif de mesure d'état de substrat, dispositif de placage, et procédé de mesure d'état de substrat |
CN117500960B (zh) * | 2022-12-16 | 2024-08-20 | 株式会社荏原制作所 | 镀覆装置 |
JP7373684B1 (ja) * | 2023-03-02 | 2023-11-02 | 株式会社荏原製作所 | めっき装置 |
JP7305075B1 (ja) * | 2023-03-17 | 2023-07-07 | 株式会社荏原製作所 | めっき装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003306793A (ja) | 2002-04-16 | 2003-10-31 | Ebara Corp | めっき装置及び方法 |
JP2004083932A (ja) | 2002-08-22 | 2004-03-18 | Ebara Corp | 電解処理装置 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05186898A (ja) * | 1992-01-09 | 1993-07-27 | Fujitsu Ltd | メッキ方法及びメッキ装置 |
JP2950016B2 (ja) * | 1992-05-22 | 1999-09-20 | 三菱電機株式会社 | 湿式プロセスにおけるめっき膜厚およびエッチング溝深さの測定方法 |
JP3346744B2 (ja) * | 1999-01-11 | 2002-11-18 | 沖電気工業株式会社 | メッキ成長装置及びメッキ成長方法 |
JP2001177238A (ja) * | 1999-12-20 | 2001-06-29 | Ibiden Co Ltd | プリント基板の製造方法 |
JP3797860B2 (ja) | 2000-09-27 | 2006-07-19 | 株式会社荏原製作所 | めっき装置及びめっき方法 |
WO2002047139A2 (fr) * | 2000-12-04 | 2002-06-13 | Ebara Corporation | Procede de traitement de substrat |
JP3661657B2 (ja) * | 2002-03-14 | 2005-06-15 | 住友金属鉱山株式会社 | 電気めっき方法および電気めっき装置 |
KR20050092130A (ko) * | 2003-01-23 | 2005-09-20 | 가부시키가이샤 에바라 세이사꾸쇼 | 도금장치 및 도금방법 |
KR20060009387A (ko) * | 2003-06-13 | 2006-01-31 | 가부시키가이샤 에바라 세이사꾸쇼 | 측정장치 |
JP4852333B2 (ja) * | 2006-03-31 | 2012-01-11 | 株式会社荏原製作所 | 分極曲線測定方法及び電解処理装置 |
JP2008019496A (ja) | 2006-07-14 | 2008-01-31 | Matsushita Electric Ind Co Ltd | 電解めっき装置および電解めっき方法 |
JP2008121062A (ja) * | 2006-11-10 | 2008-05-29 | Ebara Corp | めっき装置及びめっき方法 |
JP2008208421A (ja) * | 2007-02-26 | 2008-09-11 | Ebara Corp | めっき方法及びめっき装置 |
US8106651B2 (en) * | 2008-04-17 | 2012-01-31 | Novellus Systems, Inc. | Methods and apparatuses for determining thickness of a conductive layer |
JP5124756B1 (ja) * | 2011-09-08 | 2013-01-23 | ユケン工業株式会社 | めっき電流密度分布測定装置およびめっき電流密度分布の測定方法 |
US20140231245A1 (en) * | 2013-02-18 | 2014-08-21 | Globalfoundries Inc. | Adjustable current shield for electroplating processes |
CN105209670A (zh) * | 2013-05-13 | 2015-12-30 | 株式会社杰希优 | 基板镀敷装置 |
JP6335763B2 (ja) * | 2014-11-20 | 2018-05-30 | 株式会社荏原製作所 | めっき装置及びめっき方法 |
JP2017052986A (ja) * | 2015-09-08 | 2017-03-16 | 株式会社荏原製作所 | 調整板、これを備えためっき装置、及びめっき方法 |
JP2017115170A (ja) * | 2015-12-21 | 2017-06-29 | 株式会社荏原製作所 | めっき装置及びめっき方法 |
JP6756540B2 (ja) * | 2016-08-08 | 2020-09-16 | 株式会社荏原製作所 | めっき装置、めっき装置の制御方法、及び、めっき装置の制御方法をコンピュータに実行させるためのプログラムを格納した記憶媒体 |
JP2019002065A (ja) * | 2017-06-20 | 2019-01-10 | 株式会社荏原製作所 | めっき装置、及びプログラムを記録した記録媒体 |
JP6861610B2 (ja) * | 2017-11-07 | 2021-04-21 | 株式会社荏原製作所 | めっき解析方法、めっき解析システム、及びめっき解析のためのコンピュータプログラム |
JP6933963B2 (ja) * | 2017-11-22 | 2021-09-08 | 株式会社荏原製作所 | 電気めっき装置における給電点の配置の決定方法および矩形の基板をめっきするための電気めっき装置 |
JP7256708B2 (ja) * | 2019-07-09 | 2023-04-12 | 株式会社荏原製作所 | めっき装置 |
-
2021
- 2021-06-04 JP JP2021561022A patent/JP7074937B1/ja active Active
- 2021-06-04 WO PCT/JP2021/021358 patent/WO2022254690A1/fr active Application Filing
- 2021-06-04 CN CN202180015247.9A patent/CN115698389B/zh active Active
- 2021-06-04 KR KR1020227029232A patent/KR102518086B1/ko active IP Right Grant
- 2021-06-04 US US17/923,080 patent/US20240218553A1/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003306793A (ja) | 2002-04-16 | 2003-10-31 | Ebara Corp | めっき装置及び方法 |
JP2004083932A (ja) | 2002-08-22 | 2004-03-18 | Ebara Corp | 電解処理装置 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2022254690A1 (fr) | 2022-12-08 |
CN115698389B (zh) | 2023-06-16 |
JP7074937B1 (ja) | 2022-05-24 |
KR20220164696A (ko) | 2022-12-13 |
US20240218553A1 (en) | 2024-07-04 |
CN115698389A (zh) | 2023-02-03 |
WO2022254690A1 (fr) | 2022-12-08 |
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