KR102442364B1 - 프로브 핀 - Google Patents

프로브 핀 Download PDF

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Publication number
KR102442364B1
KR102442364B1 KR1020207029954A KR20207029954A KR102442364B1 KR 102442364 B1 KR102442364 B1 KR 102442364B1 KR 1020207029954 A KR1020207029954 A KR 1020207029954A KR 20207029954 A KR20207029954 A KR 20207029954A KR 102442364 B1 KR102442364 B1 KR 102442364B1
Authority
KR
South Korea
Prior art keywords
contact spring
spring portion
probe pin
contact
connector
Prior art date
Application number
KR1020207029954A
Other languages
English (en)
Korean (ko)
Other versions
KR20200133366A (ko
Inventor
나오야 사사노
히로타다 데라니시
다카히로 사카이
시훈 최
Original Assignee
오므론 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오므론 가부시키가이샤 filed Critical 오므론 가부시키가이샤
Publication of KR20200133366A publication Critical patent/KR20200133366A/ko
Application granted granted Critical
Publication of KR102442364B1 publication Critical patent/KR102442364B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/91—Coupling devices allowing relative movement between coupling parts, e.g. floating or self aligning
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement
    • H01R13/629—Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances
    • H01R13/631—Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances for engagement only
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency
    • H01R24/54—Intermediate parts, e.g. adapters, splitters or elbows
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/60—Contacts spaced along planar side wall transverse to longitudinal axis of engagement
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R31/00—Coupling parts supported only by co-operation with counterpart
    • H01R31/06—Intermediate parts for linking two coupling parts, e.g. adapter

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Mechanical Coupling Of Light Guides (AREA)
  • Pistons, Piston Rings, And Cylinders (AREA)
KR1020207029954A 2018-05-22 2019-05-15 프로브 핀 KR102442364B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018098189 2018-05-22
JPJP-P-2018-098189 2018-05-22
PCT/JP2019/019332 WO2019225441A1 (ja) 2018-05-22 2019-05-15 プローブピン

Publications (2)

Publication Number Publication Date
KR20200133366A KR20200133366A (ko) 2020-11-27
KR102442364B1 true KR102442364B1 (ko) 2022-09-14

Family

ID=68616147

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020207029954A KR102442364B1 (ko) 2018-05-22 2019-05-15 프로브 핀

Country Status (5)

Country Link
JP (1) JP7226441B2 (zh)
KR (1) KR102442364B1 (zh)
CN (1) CN112005448B (zh)
TW (1) TWI734985B (zh)
WO (1) WO2019225441A1 (zh)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001091537A (ja) 1999-09-24 2001-04-06 Isao Kimoto 接触子及びこれを用いた接触子組立体
JP2002289311A (ja) 1991-04-26 2002-10-04 Amp Inc 電気コネクタ
JP2004523757A (ja) 2001-03-13 2004-08-05 スリーエム イノベイティブ プロパティズ カンパニー 高帯域幅プローブアセンブリ
JP2008243535A (ja) 2007-03-27 2008-10-09 Matsushita Electric Works Ltd コネクタ
DE102009036807A1 (de) * 2009-08-10 2011-03-03 Tyco Electronics Amp Gmbh Elektrische Steckverbinderanordnung mit verringerter Steckkraft
JP2011112491A (ja) * 2009-11-26 2011-06-09 Micronics Japan Co Ltd プローブ装置
US20140134883A1 (en) * 2012-11-15 2014-05-15 Iriso Electronics Co., Ltd. Electric Connection Terminal and Connector Including the Same
JP2017059363A (ja) 2015-09-15 2017-03-23 オムロン株式会社 プローブピン、および、これを備えた検査治具
KR101851519B1 (ko) 2017-12-14 2018-04-23 오므론 가부시키가이샤 소켓, 검사 지그, 검사 유닛 및 검사 장치
KR102086390B1 (ko) 2019-11-05 2020-03-09 주식회사 플라이업 프로브 핀

Family Cites Families (20)

* Cited by examiner, † Cited by third party
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JP4522975B2 (ja) * 2006-06-19 2010-08-11 東京エレクトロン株式会社 プローブカード
US7455528B2 (en) * 2006-09-08 2008-11-25 Siemens Energy & Automation, Inc. Devices and/or systems for coupling a PLC bus
CN201845904U (zh) * 2010-10-08 2011-05-25 得意精密电子(苏州)有限公司 电连接器
CN202550167U (zh) * 2012-05-11 2012-11-21 合兴集团汽车电子有限公司 一种浮动式板对板连接器
JP5454646B1 (ja) * 2012-09-25 2014-03-26 第一精工株式会社 電気コネクタ
WO2014073368A1 (ja) * 2012-11-07 2014-05-15 オムロン株式会社 接続端子およびこれを用いた導通検査器具
TWI614947B (zh) * 2013-11-13 2018-02-11 Iriso Electronics Co Ltd 電連接器
DE102013226205A1 (de) * 2013-12-17 2015-06-18 Conti Temic Microelectronic Gmbh Einschubmodul für eine Motoreinheit
JP6192567B2 (ja) 2014-02-21 2017-09-06 ケル株式会社 フローティング型コネクタ
JP6295346B2 (ja) * 2014-05-30 2018-03-14 モレックス エルエルシー 電気コネクタ
WO2016041528A1 (zh) * 2014-09-19 2016-03-24 蔡周贤 电连接器
JP6531438B2 (ja) * 2015-03-13 2019-06-19 オムロン株式会社 プローブピン、および、これを備えたプローブユニット
TWM542266U (zh) * 2015-06-12 2017-05-21 蔡周賢 雙向電連接器
CN105186155B (zh) * 2015-07-30 2018-04-13 凡甲电子(苏州)有限公司 线缆连接器
TWI602358B (zh) * 2015-07-30 2017-10-11 凡甲科技股份有限公司 線纜連接器
TWI669866B (zh) * 2015-08-20 2019-08-21 美商摩勒克斯公司 Electrical connector and electrical connection device
JP6325505B2 (ja) * 2015-10-28 2018-05-16 日本航空電子工業株式会社 コネクタ
TWI630764B (zh) * 2016-01-18 2018-07-21 台灣立訊精密有限公司 電連接器
JP6610322B2 (ja) * 2016-02-15 2019-11-27 オムロン株式会社 プローブピンおよびそれを用いた検査装置
JP6473435B2 (ja) * 2016-10-18 2019-02-20 モレックス エルエルシー コネクタ

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002289311A (ja) 1991-04-26 2002-10-04 Amp Inc 電気コネクタ
JP2001091537A (ja) 1999-09-24 2001-04-06 Isao Kimoto 接触子及びこれを用いた接触子組立体
JP2004523757A (ja) 2001-03-13 2004-08-05 スリーエム イノベイティブ プロパティズ カンパニー 高帯域幅プローブアセンブリ
JP2008243535A (ja) 2007-03-27 2008-10-09 Matsushita Electric Works Ltd コネクタ
DE102009036807A1 (de) * 2009-08-10 2011-03-03 Tyco Electronics Amp Gmbh Elektrische Steckverbinderanordnung mit verringerter Steckkraft
JP2011112491A (ja) * 2009-11-26 2011-06-09 Micronics Japan Co Ltd プローブ装置
US20140134883A1 (en) * 2012-11-15 2014-05-15 Iriso Electronics Co., Ltd. Electric Connection Terminal and Connector Including the Same
JP2017059363A (ja) 2015-09-15 2017-03-23 オムロン株式会社 プローブピン、および、これを備えた検査治具
KR101851519B1 (ko) 2017-12-14 2018-04-23 오므론 가부시키가이샤 소켓, 검사 지그, 검사 유닛 및 검사 장치
KR102086390B1 (ko) 2019-11-05 2020-03-09 주식회사 플라이업 프로브 핀

Also Published As

Publication number Publication date
CN112005448B (zh) 2022-09-23
CN112005448A (zh) 2020-11-27
JP7226441B2 (ja) 2023-02-21
JPWO2019225441A1 (ja) 2021-05-13
TWI734985B (zh) 2021-08-01
KR20200133366A (ko) 2020-11-27
TW202004191A (zh) 2020-01-16
WO2019225441A1 (ja) 2019-11-28

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AMND Amendment
E701 Decision to grant or registration of patent right
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GRNT Written decision to grant