KR102442364B1 - probe pin - Google Patents

Abstract

The probe pin has a first contact spring portion and a second contact spring portion, and a buffer spring portion and an intermediate portion disposed in series between the first contact spring portion and the second contact spring portion. The buffer spring portion is configured to be elastically deformable in a second direction intersecting the first direction, which is an arrangement direction of the first contact spring portion, the intermediate portion, the buffer spring portion, and the second contact spring portion with respect to the intermediate portion, the first contact spring The portion and the second contact spring portion are configured to be elastically deformable in a third direction intersecting the first direction and the second direction with respect to the intermediate portion.

Description

probe pin

The present disclosure relates to a probe pin that can be disposed in a connector connectable to a connection object.

BACKGROUND ART In electronic component modules such as USB devices, continuity inspection, operation characteristic inspection, and the like are generally performed in the manufacturing process thereof. These inspections are performed by connecting an inspection apparatus and an electronic component module with a connector.

As such a connector, there exists a thing described in patent document 1. The connector includes a base portion that can be disposed on a substrate, a fitting portion extending from an upper portion of the base portion in parallel with the upper surface of the substrate and capable of being fitted with an electronic component module, and a plurality of contact members provided in the base portion. . In the connector, the movement regulating portion provided on the base portion and the movement regulating portion provided on the fitting portion are engaged with a gap, and the fitting portion is relatively movable with respect to the base portion within the gap. . Thereby, even when an electronic component module is connected in the diagonal direction with respect to the fitting direction, it is possible to fit-connect smoothly an electronic component module.

Japanese Patent Laid-Open No. 2015-158990

However, in the above connector, since movement regulating portions are respectively provided at both ends in the long side direction of the base portion and the fitting portion, if each member of the base portion and the fitting portion is not formed with high precision, the fitting portion is moved as designed. There are times when things become difficult. In this case, when the electronic component module is connected in an oblique direction with respect to the fitting direction, a stress in a direction intersecting the predetermined contact direction is applied to the contact member, and there is a possibility that the contact member may be damaged. .

An object of the present disclosure is to provide a probe pin that is hardly damaged even when a stress in a direction intersecting a predetermined contact direction is applied.

A probe pin of an example of the present disclosure includes:

A probe pin that can be placed in a connector that can be connected to a connection object,

a first contact spring portion and a second contact spring portion;

An intermediate portion and a buffer spring portion disposed in series between the first contact spring portion and the second contact spring portion

to provide

The middle part, both ends in the first direction are respectively connected to the first contact spring part and the buffer spring part,

The buffer spring part has both ends in the first direction connected to the intermediate part and the second contact spring part, respectively, and the first contact spring part, the intermediate part, and the buffer spring part are connected to the intermediate part. and elastically deformable in a second direction intersecting a first direction, which is an arrangement direction of the second contact spring part,

The first contact spring portion and the second contact spring portion are configured to be elastically deformable with respect to the intermediate portion in a third direction intersecting the first and second directions.

According to the probe pin, the first contact spring portion and the second contact spring portion, and the intermediate portion and the buffer spring portion disposed in series between the first contact spring portion and the second contact spring portion, the buffer spring portion, The intermediate portion is configured to be elastically deformable in a second direction intersecting the first direction, which is an arrangement direction of the first contact spring portion, the intermediate portion, the buffer spring portion, and the second contact spring portion, the first contact spring portion and the second contact spring portion The contact spring portion is configured to be elastically deformable in a third direction intersecting the first direction and the second direction with respect to the intermediate portion. With such a configuration, even if a stress in a direction intersecting the predetermined contact direction is applied, the stress is dispersed by the buffer spring portion and damage to the probe pin can be reduced. As a result, a probe pin that is hard to be damaged can be realized.

BRIEF DESCRIPTION OF THE DRAWINGS It is a perspective view which shows the connector of 1st Embodiment of this indication.
FIG. 2 is a cross-sectional view taken along line II-II of FIG. 1 ;
3 is a cross-sectional view taken along line III-III of FIG. 1 ;
Fig. 4 is a side view of the connector of Fig. 1 on the side of a first terminal connecting portion;
Fig. 5 is a perspective view showing a first terminal connecting portion of the connector of Fig. 1;
6 is a cross-sectional view taken along line VI-VI of FIG. 1 ;
Fig. 7 is a perspective view showing a probe pin of the connector of Fig. 1;
FIG. 8 is a cross-sectional view taken along line VIII-VIII of FIG. 1 .
Fig. 9 is a perspective view showing a first modified example of the connector of Fig. 1;
Fig. 10 is a side view of the connector of Fig. 9 on the side of the first terminal connecting portion in a state in which the connector housing is removed;
Fig. 11 is a perspective view showing a second modified example of the connector of Fig. 1;
Fig. 12 is a perspective view of a first terminal connecting portion showing a third modified example of the connector of Fig. 1;
Fig. 13 is a cross-sectional view taken along line II-II in Fig. 1 showing a fourth modified example of the connector of Fig. 1;
FIG. 14 is a plan view showing a state before the first contact spring part of the probe pin of FIG. 7 is elastically deformed;
Fig. 15 is a plan view showing a state after the first contact spring portion of the probe pin of Fig. 7 is elastically deformed;
Fig. 16 is a perspective view showing a fifth modified example of the connector of Fig. 1;
Fig. 17 is a perspective view showing a first modified example of the probe pin of Fig. 7;
Fig. 18 is a perspective view showing a second modified example of the probe pin of Fig. 7;
Fig. 19 is a perspective view showing a third modified example of the probe pin of Fig. 7;
Fig. 20 is a perspective view showing a fourth modified example of the probe pin of Fig. 7;
Fig. 21 is a perspective view showing a fifth modified example of the probe pin of Fig. 7;
Fig. 22 is a perspective view showing a sixth modified example of the probe pin of Fig. 7;
Fig. 23 is a perspective view showing a seventh modification of the probe pin of Fig. 7;
Fig. 24 is a perspective view showing an eighth modification of the probe pin of Fig. 7;
Fig. 25 is a perspective view showing a ninth modification of the probe pin of Fig. 7;
FIG. 26 is a plan view showing a state before elastic deformation of the first contact spring part and the second contact spring part of the probe pin of FIG. 25; FIG.
Fig. 27 is a plan view showing a state after the first contact spring portion and the second contact spring portion of the probe pin of Fig. 25 are elastically deformed;
Fig. 28 is a perspective view showing a probe pin according to a second embodiment of the present disclosure;
Fig. 29 is a plan view showing a state before the first contact spring portion of the probe pin of Fig. 28 is elastically deformed;
Fig. 30 is a plan view showing a state after the first contact spring part of the probe pin of Fig. 28 is elastically deformed;
Fig. 31 is a perspective view showing a modified example of the probe pin of Fig. 28;
Fig. 32 is a plan view showing a state before elastic deformation of the first contact spring portion and the second contact spring portion of the probe pin of Fig. 31;
Fig. 33 is a plan view showing a state after the first contact spring portion and the second contact spring portion of the probe pin of Fig. 32 are elastically deformed;

Hereinafter, an example of the present disclosure will be described with reference to the accompanying drawings. In addition, in the following description, terms indicating a specific direction or position (for example, terms including "up", "down", "right", and "left") are used as necessary, but the use of these terms is This is for facilitating the understanding of the present disclosure with reference to the drawings, and the technical scope of the present disclosure is not limited by the meaning of those terms. In addition, the following description is merely illustrative in nature and is not intended to limit the present disclosure, its application, or its use. In addition, the drawings are schematic, and the ratio of each dimension does not necessarily agree with an actual thing.

(First embodiment)

The connector 1 of the first embodiment of the present disclosure is configured to be connectable to the inspection apparatus 100 and the inspection object 200, which are examples of a connection object (see FIG. 3 ), and as shown in FIG. 1 , The connector housing 10 is provided with the 1st terminal connection part 20 (an example of the housing of the connector 1) supported by this connector housing 10 so that it can swing. In the inside of the connector housing 10, as shown in FIG. 2, the pressing part 30 is provided.

As shown in FIG. 1 , the connector housing 10 has, for example, a substantially rectangular box shape, and includes an upper housing 11 and a lower housing 12 stacked in the thickness direction (that is, in the vertical direction in FIG. 1 ). Consists of. The connector housing 10 has an opening face 13 on one side of the side opposite to the longitudinal direction (that is, the first direction X), and the opening face 13 has an opening 14 having a substantially elliptical shape. is provided.

As shown in FIG. 3 , inside the connector housing 10 , a board 40 and a second terminal connection part 50 connectable to the inspection apparatus 100 are provided. The board|substrate 40 is connected to the 1st terminal connection part 20 and the 2nd terminal connection part 50 via the connection terminals 41 (shown in FIG. 6) provided at the both ends in the 1st direction X in the board surface. electrically connected. The second terminal connecting portion 50 is disposed on the opposite side of the first terminal connecting portion 20 in the first direction X with respect to the substrate 40 .

As shown in FIG. 3 , the first terminal connecting portion 20 has a first end 201 that is one end in the first direction X that intersects (eg, orthogonal) to the opening surface 13 in the connector housing 10 . ), and the second end 202 , which is the other end in the first direction X, is exposed to the outside of the connector housing 10 so that the inspection object 200 can be connected. In addition, the test object 200 is an electronic component module which has a USB connector or an HDMI connector, for example.

Moreover, as shown in FIG. 4, the 1st terminal connection part 20 is inside the opening part 14, and the clearance gap 15 is arrange|positioned at the reference position P between the edge part of the opening part 14, and the opening surface It is supported by the connector housing 10 in a state where it can rock|fluctuate with respect to the arbitrary direction of up, down, left, and right in FIG. In this embodiment, the gap 15 is provided at the reference position P over the entire circumference of the first terminal connection portion 20 in the first direction X (ie, the paper penetration direction in FIG. 2 ).

Specifically, as shown in FIG. 3 , the first terminal connecting portion 20 extends in the first direction X with the plate-shaped probe pin 60 and intersects (eg, perpendicular to) the first direction X. and a connection housing 21 provided with a first accommodating portion 22 capable of accommodating the probe pin 60 so that the plate surface faces the second direction Y (shown in Fig. 4). In this embodiment, as shown in FIG. 2 , the first terminal connection portion 20 has a plurality of probe pins 60 , and is disposed on the connection housing 21 at intervals along the second direction Y. A plurality of pairs of the first accommodating parts 22 are provided, and the probe pins 60 are accommodated in each of the first accommodating parts 22 , respectively. As a result, the first accommodating portions 22 of each pair intersect (eg, orthogonal) the first direction X and the second direction Y of the first terminal connection portion 20 when viewed from the first direction X. They are arranged symmetrically with respect to the center line L1 of the three directions Z, and are electrically independent from each other. That is, the probe pin 60 accommodated in the first accommodating part 22 of each pair is capable of clamping the inspection object 200 from the third direction Z by the first contact spring part 61 to be described later. The board|substrate 40 is comprised so that clamping is possible from the 3rd direction Z by the 2nd contact spring part 62 mentioned later.

As shown in FIG. 3 , at the end of the connection housing 21 on the side of the first end 201 , a support part 211 for supporting a pressing member (ie, a coil spring 31 ) of a pressing part 30 , which will be described later, is provided. ) is provided, at the end of the connection housing 21 on the second end 202 side, a recess 23 that is opened in the first direction X and can accommodate the inspection object 200 from the first direction X; A dragon window 24 is provided. Inside the recessed part 23, the 1st contact spring part 61 mentioned later of each probe pin 60 is arrange|positioned. That is, the inspection object 200 is connected to the first terminal connection part 20 along the first direction X. In addition, the confirmation window 24 communicates with the first accommodating portion 22 and the outside of the connection housing 21 , and connects the first contact spring portion 61 of each probe pin 60 to the connection housing 21 . can be confirmed from the outside.

Further, as shown in FIG. 5 , the first terminal connection portion 20 covers the outer surface of the connection housing 21 , and a conductive outer shell provided with a ground terminal 26 disposed inside the connector housing 10 . It has a section (25). In this embodiment, the outer shell portion 25 is made of a metal such as iron, and is electrically independent from each probe pin 60 and covers a region except for the second end 202 of the outer surface of the connection housing 21 . is covering By configuring in this way, when a connection object such as the inspection object 200 is connected to the first terminal connection portion 20, the connection object such as the inspection object 200 does not come into contact with the outer shell portion 25, so that the first Damage to connection objects, such as the inspection object 200, at the time of connection to the terminal connection part 20 can be reduced. In addition, a pair of ground terminals 26 are provided at each of both ends of the outer shell part 25 in the second direction Y.

On the outer surface of the connection housing 21, as shown in FIG. 3, the recessed part 212 which can accommodate the outer shell part 25 is provided. The concave portion 212 is a portion where the outer surface of the accommodated outer shell 25 is not provided with the concave portion 212 of the connection housing 21 (eg, the second end 202 of the connection housing 21 ). ) side edge part 213), it is comprised so that it may be located on the same plane.

As shown in FIG. 6 , the ground terminals 26 of each pair are disposed to face the third direction Z, and are elastically deformed in the third direction Z with respect to the connection terminals 41 of the substrate 40 . It is designed to be contactable.

As shown in FIG. 2 , the pressing portion 30 is disposed inside the connector housing 10 , and presses the first terminal connection portion 20 with respect to the connector housing 10 toward the reference position P . In detail, the pressing part 30 is comprised by the some pressing member (four coil springs 31 in this embodiment), and the four coil springs 31 are an imaginary straight line (orthogonal to the 1st direction X) ( For example, they are arranged symmetrically with respect to the center line L1 of the first terminal connection part 20 in the third direction Z.

Each coil spring 31 has a substantially cylindrical concave portion 214 provided in the support portion 211 of the connection housing 21 , and a connection housing provided in each of the upper housing 11 and the lower housing 12 . It is accommodated in the coil spring accommodating part 16 comprised with the substantially cylindrical recessed parts 111 and 121 arranged so that the recessed part 214 of 21 may respectively oppose. By using the coil spring 31 as the urging member, the first terminal connecting portion 20 can be oscillated in the first direction X in addition to any direction on the opening surface 13 .

Each probe pin 60 is plate-shaped, as shown in FIG. 7, The 1st contact spring part 61 and the 2nd contact spring part 62, The 1st contact spring part 61, and the 2nd contact spring part Between the parts 62, the intermediate part 63 and the buffer spring part 64 arrange|positioned serially along the 1st direction X are provided. That is, the 1st contact spring part 61, the intermediate|middle part 63, the buffer spring part 64, and the 2nd contact spring part 62 are arranged along the 1st direction X. In addition, each probe pin 60 is formed, for example by the electroforming method, and the 1st contact spring part 61, the intermediate|middle part 63, the buffer spring part 64, and the 2nd contact spring part 62 are It is composed integrally.

Each of the first contact spring portion 61 and the second contact spring portion 62 has a meander shape as viewed from the second direction Y, and is configured to be elastically deformable with respect to the intermediate portion 63 in the third direction Z, have. Moreover, the 1st contact spring part 61 is comprised with the some elastic piece (two belt-shaped elastic pieces 611 and 612 as an example in this embodiment) arranged with the clearance gap 65 mutually. The first contact spring portion 61 has, as an example, a wavy shape or a meander shape bent at two locations in the first direction X. As shown in FIG. Each of the elastic pieces 611 and 612 is connected to each other at the end farther from the intermediate portion 63 in the extending direction of the first contact spring portion 61 (that is, in the first direction X). That is, the gap 65 is surrounded by each of the elastic pieces 611 and 612 and the intermediate portion 63 and extends from one end of the first contact spring portion 61 in the extending direction to the other end. In the vicinity of the bent part on the far side from the intermediate part 63 in the 1st direction X of the 1st contact spring part 61, with respect to the test object 200 accommodated in the recessed part 23 through the opening part 14, the 3rd A contact portion 66 that can be contacted from the direction Z is provided (see Fig. 3). The contact portion 66 is inspected in addition to the third direction Z in a state in which a force in the third direction Z is applied by the inspection object 200 connected to the connector 1 (see FIGS. 14 and 15 ). It is elastically deformed also in the direction in which the area in contact with the object 200 is widened, so that the gap 65 is narrowed. That is, the first contact spring part 61 is in a state in which a force in the third direction Z is applied by the inspection object 200 connected to the connector 1, in addition to the third direction Z, the inspection object 200 . By configuring in this way, the first contact spring part 61 can be elastically deformed more smoothly, and durability of the first contact spring part 61 can be improved. In addition, since the first contact spring part 61 is elastically deformed more smoothly, damage to the inspection object 200 due to the contact of the first contact spring part 61 can be more reliably reduced. In addition, in this embodiment, the first contact spring part 61 in contact with the inspection object 200 which is drawn out/inserted more frequently than the board 40 with respect to the connector 1 is made of a plurality of elastic pieces 611 and 612 . composing

In addition, the 2nd contact spring part 62 has the same structure as the 1st contact spring part 61 except the point comprised with one elastic piece. That is, the second contact spring part 62 has a wavy shape or a meander shape bent at two places in the first direction X, and in the vicinity of the bent part on the far side from the buffer spring part 64 in the first direction X, A contact portion 68 contactable from the third direction Z is provided with respect to the substrate 40 (refer to FIG. 3).

The intermediate portion 63 has a substantially rectangular shape, and both ends in the first direction X are connected to the first contact spring portion 61 and the buffer spring portion 64 , respectively. An end of the intermediate portion 63 on the buffer spring portion 64 side is in the first direction X of the probe pin 60 when accommodated in the first accommodation portion 22 of the connection housing 21, and A first positioning portion 631 for regulating the movement in the direction toward the two contact spring portion 62 is provided. The 1st positioning part 631 is comprised with the plane extending in the direction away from the buffer spring part 64 in the 3rd direction Z.

The buffer spring portion 64 has a substantially rectangular frame shape protruding from the intermediate portion 63 in the third direction Z, and both ends in the first direction X have the intermediate portion 63 and the second contact spring portion ( 62 , and configured to be elastically deformable in the second direction Y (that is, in the plate thickness direction) with respect to the intermediate portion 63 . At the end of the buffer spring part 64 on the intermediate part 63 side, the probe pin 60 when accommodated in the first accommodating part 22 of the connection housing 21 is in the first direction X, and A second positioning portion 641 for regulating movement in the direction toward the contact spring portion 61 is provided. The second positioning portion 641 is a direction spaced apart from the buffer spring portion 64 in the third direction Z, and is a plane extending in the opposite direction to the first positioning portion 631 of the intermediate portion 63 . is composed of

Further, at an end of the second positioning portion 641 on the far side from the intermediate portion 63 in the third direction Z, a first contact spring portion along the first direction X from the second positioning portion 641 . A projection 642 extending toward 61 is provided. As shown in FIG. 3 , this projection 642 is provided in the support part 211 of the connection housing 21 in the third direction Z, and is disposed between the coil spring 31 and the intermediate part 63 . It is accommodated in the arranged recessed portion 215 .

As shown in FIG. 3 , each of the second contact spring portion 62 and the buffer spring portion 64 is located outside the connection housing 21 and inside the connector housing 10 . The buffer spring part 64 is accommodated in the second accommodating part 17 provided inside the connector housing 10 , and the second contact spring part 62 is a third accommodating part provided inside the connector housing 10 . It is housed in section 18 .

8, the shortest distance D1 between the plate surface of the intermediate part 63 in the second direction Y and the first accommodating part 22 is the buffer spring part ( 64) is smaller than the shortest distance D2 between the plate surface and the second accommodating portion 17 . Moreover, it is comprised so that the plate|board thickness W1 of each probe pin 60 may become 1/2 or less (preferably 1/3 or less) of the shortest distance W2 between the plate surfaces of the adjacent probe pins 60. In addition, although not shown in figure, the shortest distance between the plate surface of the 2nd contact spring part 62 and the 3rd accommodating part 18 in the 2nd direction Y is that of the intermediate part 63 in the 2nd direction Y. It is approximately equal to the shortest distance D1 between the plate surface and the first accommodating portion 22 .

In the connector (1), a gap (15) is provided between a connector housing (10) having an opening surface (13) provided with an opening (14), and an edge portion of the opening (14) in the opening (14). The first terminal connecting portion 20 disposed at the reference position P and supported by the connector housing 10 in a swingable state on the opening surface 13, and the first terminal connecting portion 20 being pressed toward the reference position P It is provided with the pressing part 30 which says. With this configuration, even when the inspection object 200 is connected from a direction crossing with respect to the connection direction to the first terminal connection part 20 (that is, the first direction X), it resists the pressing force of the pressing part 30 and After the first terminal connection part 20 is once deviated from the reference position P, it is possible to return the first terminal connection part 20 to the reference position P by the pressing force of the pressing part 30 . Accordingly, since the first terminal connection portion 20 can be self-aligned with respect to the inspection object 200 , the connector 1 connectable can be realized without damaging the connection object such as the inspection object 200 .

Moreover, the 1st terminal connection part 20 has the electrically conductive outer shell part 25 provided with the ground terminal 26 arrange|positioned inside the connector housing 10 while covering the outer surface. With the outer shell 25, it is possible to reduce the loss of signals in the high-frequency region flowing through the connector.

In addition, a board 40 electrically connected to the first terminal connection part 20 is provided inside the connector housing 10 , and the ground terminal 26 is elastically deformed for connection of the board 40 . It is comprised so that contact with the terminal 41 is possible. With this configuration, the contact pressure of the ground terminal 26 to the connection terminal 41 of the substrate 40 can be increased, and the contact reliability between the ground terminal 26 and the connection terminal 41 can be improved.

Further, the pressing unit 30 is composed of a plurality of pressing members (eg, coil springs 31), and the plurality of pressing members are arranged symmetrically with respect to an imaginary straight line L1 orthogonal to the first direction X, have. With such a configuration, variations in the pressing force applied to the first terminal connecting portion 20 can be reduced, and the first terminal connecting portion 20 can be oscillated as designed more reliably. As a result, the self-alignment of the 1st terminal connection part 20 with respect to the connection object, such as the inspection object 200, can be made more reliably.

In addition, the first terminal connecting portion 20 includes a plate-shaped probe pin 60 and a first accommodating portion 22 that can accommodate the probe pin 60 so as to extend in the first direction X and face the plate surface in the second direction Y. ) is provided, and the probe pin 60 includes a first contact spring portion 61 and a second contact spring portion 62 , and a first contact spring portion 61 and a second contact spring. Between the parts 62, the intermediate part 63 and the buffer spring part 64 arrange|positioned serially along the 1st direction X are provided. The first contact spring portion 61 and the second contact spring portion 62 are configured to be elastically deformable in the third direction Z with respect to the intermediate portion 63 , and the intermediate portion 63 is disposed in the first direction X. Both ends are connected to the first contact spring part 61 and the buffer spring part 64, respectively, and, as for the buffer spring part 64, both ends in the first direction X are respectively an intermediate part 63 and a second contact spring part ( 62 ) and elastically deformable in the second direction Y with respect to the intermediate portion 63 . The second contact spring portion 62 and the buffer spring portion 64 are located outside the connection housing 21 and inside the connector housing 10 , and extend in the connector housing 10 in the first direction X, A second accommodating portion 17 capable of accommodating the buffer spring portion 64 is provided. And the shortest distance D1 between the plate surface of the intermediate part 63 and the 1st accommodation part 22 in the 2nd direction Y is the plate surface of the buffer spring part 64 in the 2nd direction Y, and the 2nd accommodation The shortest distance between the portions 17 is less than D2. With this configuration, the inspection object 200 is connected to the first terminal connecting portion 20 from a direction intersecting the contact direction (that is, the first direction X), and intersecting the predetermined contact direction for the probe pin 60 . Even if the stress in the direction to be performed (for example, the second direction Y) is applied, the stress is dispersed by the buffer spring portion 64 and damage to the probe pin 60 can be reduced. That is, even when a connection object such as the inspection object 200 is connected to the first terminal connection portion 20 from a direction intersecting the contact direction, the probe pin 60 that is less likely to be damaged can be realized.

In addition, the connection housing 21 communicates with the first accommodating portion 22 and the outside of the connection housing 21 , and the first contact spring portion 61 can be confirmed from the outside of the connection housing 21 . It has a window (24). The reception state of the first contact spring part 61 of the probe pin 60 accommodated in the first accommodating part 22 can be easily confirmed by this confirmation window 24 .

In addition, the first terminal connection portion 20 includes a plurality of probe pins 60 and a plurality of first accommodation portions 22 arranged at intervals in the second direction Y and each of the probe pins 60 accommodated therein. and the plate thickness W1 of each probe pin 60 is 1/2 or less of the shortest distance W2 between the plate surfaces of the adjacent probe pins 60 . With such a structure, the insulation of each probe pin 60 can be reliably ensured.

In addition, the probe pin 60 is provided between the first contact spring part 61 and the second contact spring part 62, and a first terminal connection part ( 20), further comprising positioning units 631 and 641 for determining the position of the first direction X with respect to the first direction X. With these positioning portions 631 and 641 , drop-off of the probe pin 60 from the first accommodating portion 22 can be reduced.

Moreover, the positioning part is provided in the one side of the 3rd direction Z of the intermediate part 63, and movement to the one side of the 1st direction X (for example, the direction toward the 2nd contact spring part 62). is provided on the other side of the third direction Z of the first positioning portion 631 that regulates ) and a second positioning unit 641 for regulating the movement in the direction toward ). With such a configuration, the drop-off of the probe pin 60 from the first accommodating portion 22 can be further reduced.

Moreover, in the said connector 1, although the connector housing 10 is comprised from the upper housing 11 and the lower housing 12 laminated|stacked in the 3rd direction Z, it is not limited to this. For example, as shown in FIG. 9, you may comprise with the left housing 71 and the right housing 72 laminated|stacked in the 2nd direction Y. As shown in FIG. In this case, as shown in FIG. 10 , the four coil springs 31 of the pressing part 30 have the first terminal connection part 20 as viewed from the first direction X (that is, the paper penetration direction in FIG. 10 ). may be disposed symmetrically with respect to the center line L2 of the second direction Y.

In addition, the shortest distance D1 between the plate surface of the intermediate part 63 of the probe pin 60 accommodated in the first accommodating part 22 and the first accommodating part 22 is the buffer spring part ( 64), although it is comprised so that it may become smaller than the shortest distance D2 between the board surface and the 2nd accommodating part 17, it is not limited to this, For example, you may comprise so that the shortest distance D1 and the shortest distance D2 may become the same.

The outer shell portion 25 is not limited to the case where it is configured to cover a part of the connection housing 21, and may be configured to cover the entire connection housing 21, for example, as shown in FIG. 9 . , may be omitted when it is not necessary to consider the signal loss in the high-frequency region.

The ground terminal 26 is not limited to the case where it is configured to contact the connection terminal 41 of the substrate 40 in an elastically deformed state, and the connection terminal 41 of the substrate 40 in an elastically deformed state. ) may be configured to contact. In this case, for example, the ground terminal 26 may be connected to the connection terminal 41 of the board 40 by soldering or the like to improve contact reliability.

The pressing part 30 is not limited to the case where it is comprised from the four coil springs 31, For example, you may comprise from 1 to 3 coil springs 31, and 5 or more coil springs 31. may be configured as In addition, the pressing part 30 is not limited to the case where the plurality of coil springs 31 are arranged up and down in the third direction Z, and by adding the plurality of coil springs 31 up and down in the third direction Z, You may arrange|position on either one or both of the left and right of the 2nd direction Y.

The biasing member is not limited to the coil spring 31, and may be configured as a leaf spring 32, for example, as shown in FIG. 12 . In Fig. 12, two leaf springs 32 are respectively arranged up and down in the third direction Z (only three leaf springs 32 are shown in Fig. 12), and the leaf springs ( 32), two each.

The configuration of the terminal connection portion can be appropriately changed according to the design of the connector 1 or the like.

For example, the probe pin of the first terminal connection unit 20 is not limited to the probe pin 60 , and a probe pin having a different configuration may be used. For example, as a probe pin of the 1st terminal connection part 20, the probe pin formed by the method other than the electroforming method may be used, and the probe pin which is not provided with the positioning parts 631 and 641 may be used.

In addition, the connection housing 21 is not limited to the case where it has a several pair of 1st accommodating part 22 arrange|positioned at intervals along the 2nd direction Y, For example, as shown in FIG. You may provide the some 1st accommodating part 22 only in one side with respect to the center line L1 of three directions Z (in FIG. 13, the upper housing 11 side of the center line L1 of 3rd direction Z). In this case, the ground terminal 26 of the outer shell portion 25 may also be provided only on one side of the center line L1 in the third direction Z.

Further, as shown in FIG. 5 , each of the plurality of probe pins 60 of the first terminal connection part 20 includes the tip ends of the first contact spring part 61 and the second contact spring part 62 , the second Although arranged so as to be arranged in a straight line along the direction Y (only the second contact spring portion 62 is shown in FIG. 5), the present invention is not limited thereto. For example, you may arrange|position the some probe pin 60 in the zigzag shape in which the front-end|tip of the 1st contact spring part 61 and the 2nd contact spring part 62 shifted alternately in the 1st direction X. As shown in FIG.

In addition, as shown in FIG. 16, you may abbreviate|omit the window 24 for confirmation.

In addition, it is limited to the case where it is comprised so that the plate|board thickness W1 of each probe pin 60 may become 1/2 or less (preferably 1/3 or less) of the shortest distance W2 between the plate surfaces of adjacent probe pins 60. Alternatively, the thickness W1 of each probe pin 60 may be configured to be larger than 1/2 of the shortest distance W2 between the plate surfaces of the adjacent probe pins 60 .

The probe pin 60 is disposed in series between the first contact spring portion 61 and the second contact spring portion 62 , and the first contact spring portion 61 and the second contact spring portion 62 . The intermediate portion 63 and the buffer spring portion 64 are provided, and the buffer spring portion 64 is elastically deformable in the second direction Y with respect to the intermediate portion 63, the first contact spring portion 61 and Any configuration may be adopted as long as each of the second contact spring portions 62 is elastically deformable in the third direction Z with respect to the intermediate portion 63 .

For example, as shown in FIG. 17, the 1st contact spring part 61 can be comprised with one elastic piece, and the 2nd contact spring part 62 can be comprised with a plurality of elastic pieces. In the probe pin 60 of FIG. 17, the 2nd contact spring part 62 is comprised with the two elastic pieces 621, 622 arrange|positioned with the clearance gap 67 mutually.

Moreover, as shown in FIG. 18, each of the 1st contact spring part 61 and the 2nd contact spring part 62 can be comprised with a some elastic piece. In the probe pin 60 of FIG. 18, the first contact spring part 61 is composed of three elastic pieces 611, 612, 613 arranged with a gap 65 from each other, and the second contact spring part ( 62 is composed of three elastic pieces 621 , 622 , 623 arranged with a gap 67 from each other.

The buffer spring part 64 is not limited to the frame type, and any configuration can be adopted as long as it can elastically deform with respect to the intermediate part 63 in the second direction Y. For example, the buffer spring part 64 is, as shown in FIG. 19, the 1st connection part 643 connected to the intermediate part 63, and the 2nd connection part connected to the 2nd contact spring part 62. As shown in FIG. 644 , and a third connecting portion 645 of a wavy or meandering shape connected to the first connecting portion 643 and the second connecting portion 644 and extending in the first direction X. As shown in FIG. 20, the 3rd connection part 645 may be rod-shaped extending in the 1st direction X. As shown in FIG.

In addition, as shown in FIGS. 21 and 22, the buffer spring part 64 may have a rib 647 partitioning the through hole 646 penetrating the buffer spring part 64 in the second direction Y. have. In the probe pin 60 of FIG. 21, one rib 647 is provided for dividing the through hole 646 into two in the third direction Z. In the probe pin 60 of FIG. 22, the two ribs 647 which divide the through-hole 646 into three in the 1st direction X are provided.

As shown in FIG. 23, the protrusion part 642 of the buffer spring part 64 can be abbreviate|omitted. Moreover, as shown in FIG. 24, the protrusion 648 for press-fitting can also be provided in the both sides of the 3rd direction Z of the protrusion part 642. Each projection 648 protrudes in a direction away from each other in the third direction Z as it goes from the intermediate portion 63 to the second contact spring portion 62 in the first direction X. As shown in FIG.

As shown in FIG. 25, the protrusion part 649 can also be provided in the edge part by the side of the 2nd contact spring part 62 in the 1st direction X of the buffer spring part 64. As shown in FIG. This protrusion 649 is disposed at one end of the buffer spring 64 in the third direction Z on the side surface to which the second contact spring 62 in the first direction X is connected. Moreover, the protrusion part 649 is comprised so that the front-end|tip can contact with the inner surface of the connector housing 10 in the state accommodated in the connector housing 10 . Moreover, the 2nd contact spring part 62 is connected to the other end of the 3rd direction Z in the side surface of the buffer spring part 64 provided with the protrusion part 649. As shown in FIG. Moreover, in the probe pin 60 of FIG. 25, in the front-end|tip 614 of the 1st contact spring part 61 on the far side from the intermediate part 63 in the 1st direction X, the two elastic pieces 611 , 612) are integrated.

As shown in FIGS. 26 and 27 , in the probe pin 60 of FIG. 25 , the contact part 66 of the first contact spring part 61 is attached to the test target 200 connected to the connector 1 . In a state in which the force in the third direction Z is applied by the . Further, the contact portion 68 of the second contact spring portion 62 is in contact with the substrate 40 in addition to the third direction Z in a state in which a force in the third direction Z is applied by the substrate 40 . It is elastically deformed also in the direction in which the area to be used widens, and it is comprised so that the clearance gap 67 may become narrow.

Each of the first contact spring portion 61 and the second contact spring portion 62 is not limited to a case in which it has a wavy shape or a meander shape bent at two locations in the first direction X, for example, the first A substantially L-shape or a substantially J-shape bent at one location in the direction X may be sufficient.

(Second embodiment)

The probe pin 60 of 2nd Embodiment of this indication differs from the probe pin 60 of 1st Embodiment in the point which is not provided with the buffer spring part 64, as shown in FIG. . In addition, in 2nd Embodiment, the same reference number is attached|subjected to the same part as 1st Embodiment, description is abbreviate|omitted, and the point different from 1st Embodiment is demonstrated.

As shown in FIG. 28 , in the probe pin 60 of the second embodiment, the intermediate portion 63 is composed of an intermediate portion main body 163 and an auxiliary intermediate portion 164 . The intermediate part main body 163 has the same shape and structure as the intermediate part 63 of the probe pin 60 of FIG. The auxiliary intermediate portion 164 has the same shape and configuration as the buffer spring portion 64 of the probe pin 60 of FIG. 7 , except that the through hole 646 is not provided. That is, the auxiliary intermediate portion 164 has a higher rigidity than the buffer spring portion 64 and is configured not to be elastically deformed in the second direction Y with respect to the intermediate portion main body 163 as compared with the buffer spring portion 64 . .

29 and 30 , the probe pin 60 of FIG. 28 is similar to the probe pin 60 of FIG. 7 , the contact portion 66 of the first contact spring portion 61 is connected to the connector 1 . ), in a state in which the force in the third direction Z is applied by the inspection object 200 connected to the It is comprised so that the clearance gap 65 may become narrow.

Similarly to the probe pin 60 of the first embodiment, the probe pin 60 of the second embodiment is also disposed in the connector 1 in a state where the first contact spring part 61 can contact the inspection object 200 . It is configured to be possible (see Fig. 3). In this way, the probe pin 60 is disposed on the connector 1 in a state in which the first contact spring part 61 can contact the inspection object 200 , and conduction inspection or operation characteristic inspection is performed. In this inspection, the repetition frequency of the connection and disconnection of the inspection object 200 to the connector 1 is electrically connected to the inspection apparatus 100 and the second terminal connection part 50 connectable to the inspection apparatus 100 . is higher than the substrate 40 connected to (that is, the inspection apparatus 100 and the substrate 40 are an example of the first connection object, and the inspection object 200 is an example of the second connection object).

By the way, since the connection and disconnection with respect to a connection object are generally repeated frequently, durability is calculated|required by the probe pin for inspection. In order to ensure durability, when a probe pin is formed of a material with high hardness, such as a nickel alloy or a titanium alloy, there exists a possibility that a connection object may be damaged. Conversely, if the probe pin is formed of a material with low hardness, such as beryllium steel or phosphor bronze, the probe pin cannot have sufficient durability, and the contact is caused by abrasion of sliding due to repeated connection and disconnection to and from the object to be connected. There is a case where the addition deteriorates.

According to the probe pin 60 of the second embodiment, the first contact spring portion 61 is elastically deformed more smoothly to improve the durability of the first contact spring portion 61, and the first contact spring portion 61 is ), the damage to the connection object due to the contact can be reduced more reliably. That is, the life of the connector 1 on which the probe pin 60 is disposed can be extended.

In addition, by making the plate thickness of the first contact spring part 61 thin while forming the probe pin 60 from a material with high hardness, such as a nickel alloy or a titanium alloy, the contact part 66 that comes into contact with the inspection object 200 . ) to be more flexibly displaced, so that the first contact spring part 61 can be elastically deformed more smoothly. In addition, by connecting the front ends of the respective elastic pieces 611 and 612 of the first contact spring portion 61 to each other, and surrounding the gap 65 with the respective elastic pieces 611 and 612 and the intermediate portion 63, The strength of the first contact spring unit 61 may be increased, and durability of the first contact spring unit 61 may be further increased. In addition, since the first contact spring unit 61 is composed of a plurality of elastic pieces 611 and 612, a plurality of electrical paths from the contact portion with the inspection target 200 to the intermediate portion 63 are formed, The electrical resistance of the probe pin 60 can be reduced.

In the probe pin 60 illustrated in FIG. 28 , each of the first contact spring portion 61 and the second contact spring portion 62 extends along the first direction X, but it is not limited to this case. For example, the 2nd contact spring part 62 may be arrange|positioned so that it may extend along the 2nd direction Y. As shown in FIG. In addition, the 2nd contact spring part 62 should just be comprised so that it can elastically deform in the direction which cross|intersects the extension direction and the 2nd direction Y. As shown in FIG.

Moreover, as shown in FIG. 31, in the probe pin 60 of FIG. 28, the 2nd contact spring part 62 may be comprised with a some elastic piece. In the probe pin 60 of FIG. 31, the 2nd contact spring part 62 is comprised by the two elastic pieces 621 and 622. As shown in FIG.

32 and 33 , in the probe pin 60 of FIG. 31 , similarly to the probe pin 60 of FIG. 25 , the contact portion 66 of the first contact spring portion 61 is connected to the connector 1 . ), in a state in which the force in the third direction Z is applied by the inspection object 200 connected to the It is comprised so that the clearance gap 65 may become narrow. Further, in a state in which the contact portion 68 of the second contact spring portion 62 is applied with a force in the third direction Z by the substrate 40 , in addition to the third direction, the contact portion 68 is in contact with the substrate 40 . It is elastically deformed also in the direction in which an area expands, and it is comprised so that the clearance gap 67 may become narrow.

In the above, various embodiments of the present disclosure have been described in detail with reference to the drawings, but finally, various aspects of the present disclosure will be described. In addition, in the following description, the reference numeral is also attached and described as an example.

The probe pin 60 of the first aspect of the present disclosure includes:

It is a probe pin (60) that can be placed in the connector (1) connectable to the connection object (100, 200),

a first contact spring portion 61 and a second contact spring portion 62;

An intermediate portion 63 and a buffer spring portion 64 disposed in series between the first contact spring portion 61 and the second contact spring portion 62 .

to provide

The intermediate portion 63 includes the first contact spring portion 61 , the intermediate portion 63 , the buffer spring portion 64 and the second contact spring portion 62 with respect to the intermediate portion 63 . Both ends in the first direction X, which is the arrangement direction of

The buffer spring portion 64 has both ends in the first direction X connected to the intermediate portion 63 and the second contact spring portion 62, respectively, and a third intersecting first direction X. It is configured to be elastically deformable in two directions Y,

The first contact spring part 61 and the second contact spring part 62 elastically deform with respect to the intermediate part 63 in a third direction Z crossing the first direction X and the second direction Y. made possible.

According to the probe pin 60 of the first aspect, even if a stress in a direction crossing the predetermined contact direction is applied, the stress is dispersed by the buffer spring part 64 to reduce damage to the probe pin 60 can do. As a result, the probe pin 60 which is hard to be damaged can be realized.

The probe pin 60 of the second aspect of the present disclosure includes:

It is provided between the first contact spring portion 61 and the second contact spring portion 62 , and the first to the housing 20 when accommodated in the housing 20 of the connector 1 . It further includes positioning units 631 and 641 for determining a position in the direction X.

According to the probe pin 60 of a 2nd aspect, drop-off|omission of the probe pin 60 from the 1st accommodation part 22 by the positioning parts 631 and 641 can be reduced.

The probe pin 60 of the third aspect of the present disclosure includes:

The positioning unit,

a first positioning part (631) provided on one side of the third direction Z of the intermediate part (63) and regulating movement in one side of the first direction X;

A second positioning part 641 provided on the other side of the buffer spring part 64 in the third direction Z and regulating movement to the other side in the first direction X.

has a

According to the probe pin 60 of a 3rd aspect, drop-off|omission from the 1st accommodating part 22 of the probe pin 60 can be reduced more.

The probe pin 60 of the fourth aspect of the present disclosure includes:

At least one of the first contact spring portion 61 and the second contact spring portion 62 is constituted by a plurality of elastic pieces 611 and 612 arranged with a gap 65 from each other.

The probe pin 60 of the fifth aspect of the present disclosure includes:

In a state in which the force in the third direction Z is applied to the first contact spring part 61 by the contact of the connection object 200 to which it is connected, the area in which the contact area in contact with the connection object 200 is widened It is also configured to be elastically deformable.

The probe pin 60 of the sixth aspect of the present disclosure,

In a state in which the force in the third direction Z is applied by the contact of the connection object 200 to which the first contact spring part 61 is connected, the elastic pieces adjacent to the plurality of elastic pieces 611 and 612 are elastic. It is configured such that the gap 65 between the pieces is narrowed.

According to the probe pins 60 of the fourth to sixth aspects, the first contact spring portion 61 is elastically deformed more smoothly to improve durability of the first contact spring portion 61, and the first contact spring portion The damage to the connection object by the contact of (61) can be reduced more reliably.

The probe pin 60 of the seventh aspect of the present disclosure,

It is a probe pin (60) that can be placed in the connector (1) connectable to the connection object (100, 200),

A plate-shaped first contact spring portion 61 extending along the first direction X;

a plate-shaped second contact spring portion 62;

An intermediate part 63 disposed between the first contact spring part 61 and the second contact spring part 62 .

to provide

The first contact spring part 61 intersects the first direction X and the second direction Y which is the plate thickness direction of each of the first contact spring part 61 and the second contact spring part 62 . It is elastically deformable in the third direction Z, and is composed of a plurality of elastic pieces 611 and 612 arranged with a gap 65 from each other,

The second contact spring part 62 is configured to be elastically deformable in a direction Z crossing the extension direction of the second contact spring part and the second direction,

Each of the plurality of elastic pieces 611 and 612 has an end portion that is farther from the middle portion in the first direction connected to each other.

According to the probe pin 60 of the seventh aspect, the first contact spring portion 61 is elastically deformed more smoothly to improve the durability of the first contact spring portion 61, and the first contact spring portion 61 is It is possible to more reliably reduce the damage to the connection object due to the contact.

The probe pin 60 of the eighth aspect of the present disclosure includes:

As the connection objects 100 and 200 , a first connection object 100 and a second connection object 200 having a higher repetition frequency of connection and disconnection to the connector 1 than the first connection object 100 . ) is included,

The first contact spring part 61 is configured to be disposed in the connector 1 in a state in which the first contact spring part 61 can contact the second connection object 200 .

According to the probe pin 60 of the eighth aspect, since the first contact spring part 61 is configured to be able to contact the second connection object 200 that is connected to and disconnected from the connector 1 more frequently, The life of the arranged connector 1 can be extended.

The probe pin 60 of the ninth aspect of the present disclosure includes:

In a state in which the force in the third direction Z is applied by the contact of the connection object 200 to which the first contact spring part 61 is connected, the elastic pieces adjacent to the plurality of elastic pieces 611 and 612 are elastic. It is configured such that the gap 65 between the pieces is narrowed.

The probe pin 60 of the tenth aspect of the present disclosure,

In a state in which the force in the third direction Z is applied to the first contact spring part 61 by the contact of the connection object 200 to which it is connected, the area in which the contact area in contact with the connection object 200 is widened It is also configured to be elastically deformable.

According to the probe pin 60 of the ninth aspect and the tenth aspect, the first contact spring portion 61 is elastically deformed more smoothly to improve the durability of the first contact spring portion 61, and the first contact spring Damage to the object to be connected due to the contact of the portion 61 can be reduced more reliably.

The inspection method of the eleventh aspect of the present disclosure,

It is a probe pin (60) that can be placed in the connector (1) connectable to the connection object (100, 200),

A plate-shaped first contact spring portion 61 extending along the first direction X;

a plate-shaped second contact spring part 62;

An intermediate portion 63 disposed between the first contact spring portion 61 and the second contact spring portion 62 .

to provide

The first contact spring part 61 intersects the first direction X and the second direction Y which is the plate thickness direction of each of the first contact spring part 61 and the second contact spring part 62 . It is elastically deformable in the third direction Z, and is composed of a plurality of elastic pieces 611 and 612 arranged with a gap 65 from each other,

The second contact spring part 62 is configured to be elastically deformable in a direction crossing the extension direction of the second contact spring part 62 and the second direction Y,

Each of the plurality of elastic pieces (611, 612) is an inspection method using a probe pin (60) in which the ends farther from the intermediate portion (63) in the first direction X are connected to each other,

As the connection objects 100 and 200 , a first connection object 100 and a second connection object 200 having a higher repetition frequency of connection and disconnection to the connector 1 than the first connection object 100 . ) is included,

The probe pin 60 is disposed on the connector 1 in a state where the first contact spring part 61 can contact the second connection object 200 .

According to the inspection method of the eleventh aspect, with respect to the second connection object 200 having a high repetition frequency of connection and disconnection to the connector 1, the first contact spring portion 61 with high durability is brought into contact with the probe. A pin 60 is disposed on the connector 1 . With this configuration, the life of the connector 1 can be extended.

In addition, by appropriately combining any of the above various embodiments or modifications, the effects of each can be exhibited. In addition, a combination of embodiments, a combination of examples, or a combination of an embodiment and an example is possible, and a combination of features in other embodiments or examples is also possible.

Although this indication is fully described in relation to preferred embodiments with reference to the accompanying drawings, various modifications and corrections are apparent to those skilled in the art. Such variations and modifications are to be understood as being included therein unless they depart from the scope of the present disclosure by the appended claims.

The probe pin of the present disclosure is applicable to, for example, a connector used for inspection of a USB device or an HDMI device.

1: Connector
10: connector housing
11: Upper housing
111: recess
12: lower housing
121: recess
13: aperture
14: opening
15: gap
16: coil spring receiving part
17: second receiving unit
18: third receiving unit
20: first terminal connection part
201: first end
202: second end
21: connection housing
211: support
212: recess
213: end
214, 215: recesses
22: first receiving unit
23: recess
24: window for confirmation
25: outer shell
26: ground terminal
30: pressurized part
31: coil spring
32: leaf spring
40: substrate
50: second terminal connection part
60: probe pin
61: first contact spring part
611, 612, 613: elastic piece
614:
62: second contact spring part
621, 622, 623: elastic piece
63: middle part
163: middle body
164: secondary middle part
631: first positioning unit
64: buffer spring part
641: second positioning unit
642: protrusion
643: first connection part
644: second connection part
645: third connection part
646: through hole
647: rib
648: turn
649: protrusion
65, 67: gap
66, 68: contact part
71: left housing
72: right housing
100: inspection device
200: inspection target
L1, L2: center line
P: reference position
X: first direction
Y: second direction
Z: third direction
D1, D2: Shortest distance
W1: plate thickness
W2: shortest distance

Claims (11)

A probe pin that can be placed in a connector that can be connected to a connection object,
a first contact spring portion and a second contact spring portion;
An intermediate portion and a buffer spring portion disposed in series between the first contact spring portion and the second contact spring portion
to provide
The intermediate portion, the first contact spring portion and the buffering portion, respectively, both ends in the first direction in the arrangement direction of the first contact spring portion, the intermediate portion, the buffer spring portion and the second contact spring portion with respect to the intermediate portion with respect to the intermediate portion connected to the spring,
The buffer spring portion is configured to be elastically deformable in a second direction intersecting the first direction, while both ends in the first direction are connected to the intermediate portion and the second contact spring portion, respectively,
The first contact spring part and the second contact spring part are configured to be elastically deformable in a third direction intersecting the first direction and the second direction with respect to the intermediate part,
a positioning portion provided between the first contact spring portion and the second contact spring portion and configured to determine a position in the first direction with respect to the housing when accommodated in the housing of the connector;
The positioning unit,
It is provided at an end of the intermediate part close to the buffer spring part in the first direction, and regulates only movement of the probe pin in the first direction and in a direction from the first contact spring part to the second contact spring part. a first positioning unit;
It is provided at an end portion close to the intermediate portion in the first direction of the buffer spring portion, and regulates only movement of the probe pin in the first direction and in a direction from the second contact spring portion to the first contact spring portion the second positioning unit
The probe pin you have. According to claim 1, When accommodated in the housing, the first positioning portion is in contact with the second contact spring portion to a substrate provided in the interior of the housing, in the first direction and the first contact and regulating only movement of the probe pin in a direction from the spring portion toward the second contact spring portion. The probe pin according to claim 1 or 2, wherein each of the first positioning portion and the second positioning portion is constituted by a plane extending in the third direction. The probe pin according to claim 1 or 2, wherein the first positioning part and the second positioning part are arranged spaced apart from each other without overlapping when the probe pin is viewed along the first direction. The probe pin according to claim 4, wherein the first positioning portion is disposed closer to the first contact spring portion than the second positioning portion in the first direction. The probe pin according to claim 1 or 2, wherein at least one of the first contact spring portion and the second contact spring portion is composed of a plurality of elastic pieces arranged with a gap from each other. The method according to claim 6, wherein the first contact spring part is elastically deformable in a direction in which an area in contact with the connection object expands in a state in which the force in the third direction is applied by contact of the connected object to be connected. Consisting of probe pins. The method according to claim 6, wherein in a state in which the force in the third direction is applied by the contact of the connected object to the first contact spring unit, the gap between adjacent elastic pieces among the plurality of elastic pieces is narrowed. Consisting of probe pins. A probe pin that can be placed in a connector connectable to a connection object, comprising:
a first contact spring portion and a second contact spring portion;
An intermediate portion and a buffer spring portion disposed in series between the first contact spring portion and the second contact spring portion
to provide
The intermediate portion, the first contact spring portion and the buffering portion, respectively, both ends in the first direction in the arrangement direction of the first contact spring portion, the intermediate portion, the buffer spring portion and the second contact spring portion with respect to the intermediate portion with respect to the intermediate portion connected to the spring,
The buffer spring portion is configured to be elastically deformable in a second direction intersecting the first direction, while both ends in the first direction are connected to the intermediate portion and the second contact spring portion, respectively,
The first contact spring part and the second contact spring part are configured to be elastically deformable in a third direction intersecting the first direction and the second direction with respect to the intermediate part,
a positioning portion provided between the first contact spring portion and the second contact spring portion and configured to determine a position in the first direction with respect to the housing when accommodated in the housing of the connector;
The positioning unit,
It is provided at an end of the intermediate part close to the buffer spring part in the first direction, and regulates only movement of the probe pin in the first direction and in a direction from the first contact spring part to the second contact spring part. a first positioning unit;
It is provided at an end portion close to the intermediate portion in the first direction of the buffer spring portion, and regulates only movement of the probe pin in the first direction and in a direction from the second contact spring portion to the first contact spring portion the second positioning unit
have,
It is an inspection method using a probe pin,
The connector includes a connector housing, a first terminal connecting portion that is the housing supported by the connector housing and having the probe pin, and a second terminal connecting portion provided inside the connector housing and electrically connected to the first terminal connecting portion. a terminal connection part; a board provided inside the connector housing to be electrically connected to the second terminal connection part and to which the second contact spring part contacts;
The connection object includes a first connection object connectable to the second terminal connection part, and a second connection object connectable to the first terminal connection part in a state in which it can contact the first contact spring part of the probe pin,
the first positioning portion regulates, by the substrate, only movement of the probe pin in the first direction and in a direction from the first contact spring portion to the second contact spring portion;
the first terminal so that the second positioning portion regulates, by the first terminal connecting portion, only movement of the probe pin in the first direction and in a direction from the second contact spring portion toward the first contact spring portion accommodated in the junction,
connecting the first connection object to the second terminal connection part,
and connecting the second object to be connected to the first terminal connecting portion so that the first contact spring portion is brought into contact with the second object to be connected. delete delete

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