TWI734985B - Probe - Google Patents

Abstract

The probe includes a first contact spring portion and a second contact spring portion, and an intermediate portion and a buffer spring portion arranged in series between the first contact spring portion and the second contact spring portion. The buffer spring portion is configured to be elastically deformable in a second direction relative to the middle portion, the second direction being the first direction of the arrangement direction of the first contact spring portion, the middle portion, the buffer spring portion, and the second contact spring portion Cross, the first contact spring portion and the second contact spring portion are configured to be elastically deformable in a third direction intersecting the first direction and the second direction with respect to the intermediate portion.

Description

Probe

The present disclosure relates to a probe pin that can be disposed on a connector, and the connector can be connected to a connection object.

For electronic component modules such as Universal Serial Bus (USB) components, generally, continuity inspections and operating characteristics inspections are performed in the manufacturing steps. These inspections are performed by connecting the inspection device with the electronic component module using a connector.

As such a connector, there is a connector described in Patent Document 1. The connector includes a base portion that can be arranged on a substrate, a fitting portion that extends from the upper portion of the base portion in parallel with the upper surface of the substrate and can be fitted with an electronic component module, and a plurality of connecting members mounted on the base portion . In the connector, the movement restricting portion provided on the base portion and the movement restricting portion provided on the fitting portion are engaged with a gap, so that the fitting portion can move relative to the base portion within the range of the gap. Thereby, even when the electronic component module is connected in a direction inclined with respect to the fitting direction, the electronic component module can be smoothly fitted and connected.

[Prior Art Literature]

[Patent Literature]

[Patent Document 1] Japanese Patent Laid-Open No. 2015-158990

However, in the above-mentioned connector, a movement restricting portion is provided at both ends in the longitudinal direction of each of the base portion and the fitting portion. Therefore, if the members of the base portion and the fitting portion are not formed with high precision, sometimes It is difficult to move the fitting part as designed. At this time, if the electronic component module is connected in a direction inclined with respect to the fitting direction, a stress in a direction crossing the predetermined contact direction may be applied to the connecting member, which may cause damage to the connecting member.

The subject of the present disclosure is to provide a probe that is not easily damaged even if a stress in a direction crossing a predetermined contact direction is applied.

The probe of an example of the present disclosure can be arranged in a connector that can be connected to a connection object. The probe includes: a first contact spring portion and a second contact spring portion; and a middle portion and a buffer spring portion. The first contact spring portion and the second contact spring portion are arranged in series, and both end portions of the intermediate portion in the first direction are respectively connected to the first contact spring portion and the buffer spring portion , Both ends of the buffer spring portion in the first direction are respectively connected to the intermediate portion and the second contact spring portion, and the buffer spring portion is configured to be opposite to the intermediate portion The second direction is elastically deformable, and the second direction is in contact with the first contact spring portion, the intermediate portion, the buffer spring portion, and the second contact spring portion. The first direction of the arrangement direction of the spring portions crosses, and the first contact spring portion and the second contact spring portion are configured to cross the first direction and the second direction with respect to the intermediate portion. It can be elastically deformed in three directions.

According to the probe, the probe includes a first contact spring portion and a second contact spring portion, and an intermediate portion and a buffer spring portion arranged in series between the first contact spring portion and the second contact spring portion, and the buffer spring portion is configured as It is elastically deformable in a second direction with respect to the middle portion, and the second direction intersects the first direction of the arrangement direction of the first contact spring portion, the middle portion, the buffer spring portion, and the second contact spring portion, and the first contact spring The portion and the second contact spring portion are configured to be elastically deformable in a third direction intersecting the first direction and the second direction with respect to the intermediate portion. With this structure, even if a stress in a direction intersecting the predetermined contact direction is applied, the stress is dispersed by the buffer spring portion, and damage to the probe can be reduced. As a result, a probe that is not easily damaged can be realized.

1: connector

10: Connector housing

11: Upper shell

12: Lower shell

13: open side

14: Opening

15: gap

16: Coil spring housing part

17: Second Containment Department

18: Third Containment Department

20: The first terminal connection part

21: Connect the shell

22: First Containment Department

23, 111, 121, 212, 214, 215: recess

24: Confirmation window

25: Shell

26: Ground terminal

30: force department

31: coil spring

32: leaf spring

40: substrate

41: Connection terminal

50: second terminal connection part

60: Probe

61: First contact spring part

62: second contact spring part

63: middle

64: Buffer spring part

65, 67: gap

66, 68: Contact

71: left shell

72: Right shell

100: Inspection device

163: The middle body

164: Auxiliary middle part

200: Check object

201: first end

202: second end

211: Support Department

213: End

611, 612, 613, 621, 622, 623: elastic sheet

614: front end

631: first positioning part

641: The second positioning part

642: protruding part

643: first connection part

644: second connection part

645: third connection part

646: Through Hole

647: rib

648: prominence

649: protruding part

D1, D2, W2: shortest distance

L1, L2: center line

P: Reference position

W1: Board thickness

X: first direction

Y: second direction

Z: Third party

Fig. 1 is a perspective view showing the connector of the first embodiment of the present disclosure.

Fig. 2 is a cross-sectional view taken along the line II-II in Fig. 1.

Fig. 3 is a cross-sectional view taken along the line III-III of Fig. 1.

Fig. 4 is a side view of the first terminal connecting portion side of the connector of Fig. 1.

Fig. 5 is a perspective view showing a first terminal connection portion of the connector of Fig. 1.

Fig. 6 is a cross-sectional view taken along the line VI-VI of Fig. 1.

Fig. 7 is a perspective view showing a probe of the connector of Fig. 1.

Fig. 8 is a cross-sectional view taken along the line VIII-VIII in Fig. 1.

Fig. 9 is a perspective view showing a first modification of the connector of Fig. 1.

Fig. 10 is a side view of the first terminal connecting portion side of the connector of Fig. 9 with the connector housing removed.

Fig. 11 is a perspective view showing a second modification of the connector of Fig. 1.

Fig. 12 is a perspective view showing a first terminal connection portion of a third modification of the connector of Fig. 1.

Fig. 13 is a cross-sectional view taken along line II-II of Fig. 1 showing a fourth modification of the connector of Fig. 1.

Fig. 14 is a plan view showing a state before the first contact spring portion of the probe of Fig. 7 is elastically deformed.

15 is a plan view showing a state after the first contact spring portion of the probe of FIG. 7 is elastically deformed.

Fig. 16 is a perspective view showing a fifth modification of the connector of Fig. 1.

Fig. 17 is a perspective view showing a first modification of the probe of Fig. 7.

Fig. 18 is a perspective view showing a second modification of the probe of Fig. 7.

Fig. 19 is a perspective view showing a third modification of the probe of Fig. 7.

Fig. 20 is a perspective view showing a fourth modification of the probe of Fig. 7.

Fig. 21 is a perspective view showing a fifth modification of the probe of Fig. 7.

Fig. 22 is a perspective view showing a sixth modification of the probe of Fig. 7.

Fig. 23 is a perspective view showing a seventh modification of the probe of Fig. 7.

Fig. 24 is a perspective view showing an eighth modification of the probe of Fig. 7.

Fig. 25 is a perspective view showing a ninth modification of the probe of Fig. 7.

Fig. 26 is a plan view showing a state before the first contact spring portion and the second contact spring portion of the probe of Fig. 25 are elastically deformed.

Fig. 27 is a plan view showing a state after the first contact spring portion and the second contact spring portion of the probe of Fig. 25 are elastically deformed.

Fig. 28 is a perspective view showing the probe of the second embodiment of the present disclosure.

29 is a plan view showing a state before the first contact spring portion of the probe of FIG. 28 is elastically deformed.

Fig. 30 is a plan view showing a state after the first contact spring portion of the probe of Fig. 28 is elastically deformed.

Fig. 31 is a perspective view showing a modification of the probe of Fig. 28.

32 is a plan view showing a state before the first contact spring portion and the second contact spring portion of the probe of FIG. 31 are elastically deformed.

33 is a plan view showing a state after the first contact spring portion and the second contact spring portion of the probe of FIG. 32 are elastically deformed.

Hereinafter, an example of the present disclosure will be described in accordance with the accompanying drawings. Furthermore, in the following description, terms that indicate a specific direction or position (for example, terms including "up", "down", "right", and "left") are used as necessary, but these terms are used to make The present disclosure with reference to the drawings is easy to understand, and is not based on the meaning of these terms The technical scope of this disclosure is limited. In addition, the following description is merely illustrative in nature, and is not intended to limit the present disclosure, its applications, or uses. Furthermore, the drawings are schematic, and the ratios of the dimensions, etc., do not necessarily correspond to reality.

(First Embodiment)

The connector 1 of the first embodiment of the present disclosure is configured to be connectable to an inspection device 100 and an inspection target 200 which are an example of a connection object (refer to FIG. 3). As shown in FIG. 1, a connector housing 10, And the first terminal connecting portion 20 (an example of the housing of the connector 1) that is swingably supported by the connector housing 10. Inside the connector housing 10, a force applying portion 30 is provided as shown in FIG. 2.

As an example, as shown in FIG. 1, the connector housing 10 has a substantially rectangular box shape, and is composed of an upper housing 11 and a lower housing 12 that overlap in the thickness direction (ie, the vertical direction in FIG. 1 ). The connector housing 10 has an opening surface 13 on one of the side surfaces facing each other in the longitudinal direction (ie, the first direction X), and the opening surface 13 is provided with an opening 14 having a substantially elliptical shape.

As shown in FIG. 3, inside the connector housing 10, a substrate 40 and a second terminal connection part 50 connectable to the inspection device 100 are provided. The substrate 40 is electrically connected to the first terminal connection portion 20 and the second terminal connection portion 50 via connection terminals 41 (shown in FIG. 6) provided at both ends of the board surface in the first direction X. The second terminal connection portion 50 is arranged on the opposite side of the first terminal connection portion 20 in the first direction X with respect to the substrate 40.

As shown in FIG. 3, the first terminal connecting portion 20 is a first end portion 201 that is an end portion in the first direction X intersecting (for example, orthogonal to) the opening surface 13 in the connector housing The inside of the body 10 and the second end 202 which is the other end in the first direction X is exposed to the outside of the connector housing 10 to which the inspection object 200 can be connected. Furthermore, the inspection object 200 is, for example, an electronic component module having a Universal Serial Bus (USB) connector or a High-Definition Multimedia Interface (HDMI) connector.

In addition, as shown in FIG. 4, the first terminal connecting portion 20 is disposed in the opening portion 14 and has a reference position P with a gap 15 between the edge portion of the opening portion 14 and the opening surface 13 relative to FIG. 4 The connector housing 10 is supported by the connector housing 10 in a swingable state in any direction of up, down, left, and right. In this embodiment, the gap 15 is provided at the reference position P over the entire circumference of the first terminal connection portion 20 in the first direction X (that is, the paper penetration direction in FIG. 2 ).

In detail, as shown in FIG. 3, the first terminal connecting portion 20 has a plate-shaped probe 60 and a connecting housing 21. The connecting housing 21 extends in the first direction X and has a plate surface in the same direction The intersecting (for example, orthogonal) second direction Y (shown in FIG. 4) is provided with a first accommodating portion 22 capable of accommodating the probe 60 so as to face each other. In this embodiment, as shown in FIG. 2, the first terminal connecting portion 20 has a plurality of probes 60, and the connecting housing 21 is provided with a plurality of pairs of first receiving portions 22 arranged at intervals along the second direction Y. The probe 60 is accommodated in each first accommodating part 22, respectively. Thereby, when viewed from the first direction X, each pair of the first accommodating portion 22 is relative to the center line of the third direction Z that intersects (for example, orthogonal) to the first direction X and the second direction Y of the first terminal connecting portion 20 L1 is arranged symmetrically and is electrically independent of each other. That is, the probe 60 accommodated in each pair of the first accommodating portion 22 can be clamped and inspected from the third direction Z by the first contact spring portion 61 described later. The object 200 is constructed in such a way that the substrate 40 can be clamped from the third direction Z by the second contact spring portion 62 described later.

As shown in FIG. 3, at the end on the side of the first end 201 of the connection housing 21, there is provided a support portion 211 that supports the urging member (ie, the coil spring 31) of the urging portion 30 described later, and is attached to the connecting housing The end portion on the second end portion 202 side of the body 21 is provided with a recess 23 that opens in the first direction X and can accommodate the inspection object 200 from the first direction X, and a confirmation window 24. Inside the recessed part 23, the first contact spring part 61 of each probe 60 mentioned later is arrange|positioned. That is, the inspection object 200 is connected to the first terminal connection portion 20 in the first direction X. In addition, the confirmation window 24 communicates with the outside of the first accommodating portion 22 and the connecting housing 21, and the first contact spring portion 61 of each probe 60 can be confirmed from the outside of the connecting housing 21.

In addition, as shown in FIG. 5, the first terminal connection portion 20 has a conductive housing portion 25 that covers the outer surface of the connection housing 21 and is provided with a ground terminal disposed inside the connector housing 10 26. In this embodiment, the housing part 25 is made of metal such as iron, and covers the outer surface of the connection housing 21 except for the second end 202 in a state that is electrically independent of each probe 60. With this configuration, when a connection object such as the inspection object 200 is connected to the first terminal connection portion 20, the connection object such as the inspection object 200 does not come into contact with the housing portion 25, and the connection to the first terminal connection portion 20 can be reduced. Check subject 200 for damage. In addition, a pair of ground terminals 26 are provided at both ends of the housing portion 25 in the second direction Y, respectively.

On the outer surface of the connecting housing 21, as shown in FIG. The recess 212 is the outer surface of the housing 25 It is configured to be located on the same plane with respect to the outer surface of the portion of the connecting housing 21 where the recess 212 is not provided (for example, the end 213 on the second end 202 side of the connecting housing 21).

As shown in FIG. 6, each pair of ground terminals 26 are arranged so as to face each other in the third direction Z, and are configured to be in contact with the connection terminals 41 of the substrate 40 in a state where they are elastically deformed in the third direction Z.

As shown in FIG. 2, the urging part 30 is arranged inside the connector housing 10 and urges the first terminal connection part 20 to the reference position P with respect to the connector housing 10. In detail, the urging portion 30 is composed of a plurality of urging members (four coil springs 31 in this embodiment). The four coil springs 31 are opposed to a virtual straight line (for example, the first The center line L1 of the third direction Z of the one terminal connecting portion 20 is arranged symmetrically.

Each coil spring 31 is accommodated in the coil spring accommodating portion 16, which is composed of a substantially cylindrical recess 214 provided in the support portion 211 connected to the housing 21, and provided in each of the housing 11 and the lower housing 12. And it is comprised of the recessed part 111 and the recessed part 121 of a substantially cylindrical shape which are mutually arrange|positioned so as to oppose the recessed part 214 of the connection housing 21, respectively. By using the coil spring 31 as an urging member, the first terminal connecting portion 20 can be swung in the first direction X in addition to any direction on the opening surface 13.

Each probe 60 has a plate shape as shown in FIG. 7 and has a first contact spring portion 61 and a second contact spring portion 62, and is arranged in a first direction between the first contact spring portion 61 and the second contact spring portion 62. X middle part 63 and buffer spring part arranged in series 64. That is, the first contact spring portion 61, the intermediate portion 63, the cushion spring portion 64, and the second contact spring portion 62 are arranged in the first direction X. In addition, each probe 60 is formed by, for example, an electroforming method, and the first contact spring portion 61, the intermediate portion 63, the cushion spring portion 64, and the second contact spring portion 62 are integrally formed.

Viewed from the second direction Y, the first contact spring portion 61 and the second contact spring portion 62 each have a serpentine shape, and are configured to be elastically deformable in the third direction Z with respect to the intermediate portion 63. In addition, the first contact spring portion 61 is composed of a plurality of elastic pieces (in this embodiment, two band-shaped elastic pieces 611 and elastic pieces 612 as an example) arranged with a gap 65 therebetween. As an example, the first contact spring portion 61 has a wave shape or a serpentine shape bent in two places in the first direction X. Each elastic piece 611 and the elastic piece 612 are connected to each other at an end portion away from the middle portion 63 in the extending direction of the first contact spring portion 61 (ie, the first direction X). That is, the gap 65 is surrounded by the respective elastic pieces 611 and 612 and the intermediate portion 63 and extends from one end to the other end in the extending direction of the first contact spring portion 61. In the vicinity of the bent portion of the first contact spring portion 61 away from the intermediate portion 63 in the first direction X, there is provided a contact portion 66 that is accessible from the third direction Z to the inspection object 200 accommodated in the recess 23 via the opening portion 14 (Refer to Figure 3). The contact portion 66 is configured as follows: in a state where a force in the third direction Z is applied by the inspection object 200 connected to the connector 1 (refer to FIGS. 14 and 15), in addition to elastic deformation in the third direction Z, It is also elastically deformed in the direction in which the area in contact with the inspection object 200 expands, so that the gap 65 is narrowed. That is, the first contact spring portion 61 is in a state where a force in the third direction Z is applied by the inspection object 200 connected to the connector 1, in addition to being elastically deformable in the third direction Z, it is also in contact with the inspection object 200 The contact area is configured to be elastically deformable in the direction in which the area of contact is expanded, and the gap 65 between adjacent elastic pieces of the plurality of elastic pieces 611 and 612 is configured to be narrow. With this configuration, the first contact spring portion 61 can be elastically deformed more smoothly, and the durability of the first contact spring portion 61 can be improved. In addition, the first contact spring portion 61 elastically deforms more smoothly, so that damage to the inspection object 200 caused by the contact of the first contact spring portion 61 can be more reliably reduced. Furthermore, in the present embodiment, a plurality of elastic pieces 611, 612 constitute the first contact spring portion 61, and the first contact spring portion 61 is compatible with the inspection object that is more frequently inserted and removed from the connector 1 than the substrate 40. 200 contacts.

Furthermore, the second contact spring portion 62 has the same structure as the first contact spring portion 61 except that it is composed of one elastic piece. That is, the second contact spring portion 62 has a wave shape or a serpentine shape that is bent at two places in the first direction X. In the vicinity of the bent portion away from the buffer spring portion 64 in the first direction X, a counter substrate 40 is provided. The contact part 68 which can be contacted in the third direction Z (refer to FIG. 3).

The intermediate portion 63 has a substantially rectangular shape, and both ends in the first direction X are respectively connected to the first contact spring portion 61 and the buffer spring portion 64. At the end of the intermediate portion 63 on the side of the buffer spring portion 64, a first positioning portion 631 is provided. Movement in the first direction X and toward the direction of the second contact spring portion 62. The first positioning portion 631 is formed by a plane extending in a direction away from the buffer spring portion 64 in the third direction Z.

The buffer spring portion 64 has a substantially rectangular frame shape protruding from the middle portion 63 in the third direction Z, and both ends in the first direction X are respectively connected to the middle portion 63 and the second The contact spring portion 62 is configured to be elastically deformable in the second direction Y (that is, the plate thickness direction) with respect to the intermediate portion 63. At the end of the buffer spring portion 64 on the side of the intermediate portion 63, a second positioning portion 641 is provided. Movement in one direction X and toward the direction of the first contact spring portion 61. The second positioning portion 641 is constituted by a plane extending in a direction away from the buffer spring portion 64 in the third direction Z and in the direction opposite to the first positioning portion 631 of the intermediate portion 63.

In addition, at an end of the second positioning portion 641 away from the intermediate portion 63 in the third direction Z, a protrusion 642 extending from the second positioning portion 641 in the first direction X to the first contact spring portion 61 is provided. As shown in FIG. 3, the protruding portion 642 is accommodated in a recess 215 provided in the support portion 211 of the connection housing 21 in the third direction Z and arranged between the coil spring 31 and the intermediate portion 63.

As shown in FIG. 3, the second contact spring portion 62 and the buffer spring portion 64 are respectively located outside the connecting housing 21 and inside the connector housing 10. The buffer spring portion 64 is accommodated in the second accommodating portion 17 provided inside the connector housing 10, and the second contact spring portion 62 is accommodated in the third accommodating portion 18 provided inside the connector housing 10.

In addition, as shown in FIG. 8, the shortest distance D1 between the plate surface of the intermediate portion 63 in the second direction Y and the first accommodating portion 22 is shorter than the plate surface of the buffer spring portion 64 in the second direction Y and the second accommodating portion 17 The shortest distance between D2 is smaller. Furthermore, it is comprised so that the board thickness W1 of each probe 60 becomes 1/2 or less (preferably 1/3 or less) of the shortest distance W2 between the board surfaces of adjacent probes 60. Furthermore, although not shown, the gap between the plate surface of the second contact spring portion 62 and the third receiving portion 18 in the second direction Y The shortest distance is approximately the same as the shortest distance D1 between the plate surface of the intermediate portion 63 in the second direction Y and the first receiving portion 22.

The connector 1 includes: a connector housing 10 having an opening surface 13 provided with an opening 14; The reference position P of the gap 15 is supported by the connector housing 10 in a swingable state on the opening surface 13; With this structure, even when the inspection object 200 is connected from a direction that intersects the connection direction to the first terminal connection portion 20 (ie, the first direction X), it can resist the force of the urging portion 30. After the first terminal connecting portion 20 deviates from the reference position P, the application force of the urging portion 30 returns the first terminal connecting portion 20 to the reference position P. Therefore, the first terminal connection portion 20 can be self-aligned with respect to the inspection object 200, and thus the connector 1 that can be connected without damaging the connection object such as the inspection object 200 can be realized.

In addition, the first terminal connection portion 20 has a conductive housing portion 25 covering its outer surface and provided with a ground terminal 26 arranged inside the connector housing 10. With the housing part 25, the signal loss flowing through the high frequency region of the connector can be reduced.

In addition, inside the connector housing 10, there is provided a substrate 40 electrically connected to the first terminal connection portion 20, and the ground terminal 26 is capable of contacting the connection terminal 41 of the substrate 40 in an elastically deformed state. Mode composition. With this structure, the contact pressure of the ground terminal 26 to the connection terminal 41 of the substrate 40 can be increased, and the contact reliability between the ground terminal 26 and the connection terminal 41 can be improved.

In addition, the urging part 30 is composed of a plurality of urging members (for example, coil springs 31) With the structure, the plurality of urging members are arranged symmetrically with respect to the virtual straight line L1 orthogonal to the first direction X. With this structure, the deviation of the force applied to the first terminal connection portion 20 can be reduced, and the first terminal connection portion 20 can be more reliably swung as designed. As a result, the first terminal connection portion 20 can be more reliably self-aligned with respect to the connection object such as the inspection object 200.

In addition, the first terminal connection portion 20 has a plate-shaped probe 60, and a connection with a first receiving portion 22 that can accommodate the probe 60 so that the plate extends in the first direction X and faces the second direction Y. The housing 21, the probe 60 includes a first contact spring portion 61 and a second contact spring portion 62, and an intermediate portion 63 arranged in series in the first direction X between the first contact spring portion 61 and the second contact spring portion 62 And the buffer spring portion 64. The first contact spring portion 61 and the second contact spring portion 62 are configured to be elastically deformable in the third direction Z with respect to the intermediate portion 63, and both ends of the intermediate portion 63 in the first direction X are respectively connected to the first contact The spring portion 61 and the buffer spring portion 64, both ends of the buffer spring portion 64 in the first direction X are connected to the middle portion 63 and the second contact spring portion 62, respectively, and the buffer spring portion 64 is positioned in the first direction relative to the middle portion 63. It is constructed in a way that the two directions Y can be elastically deformed. The second contact spring portion 62 and the buffer spring portion 64 are located outside the connecting housing 21 and inside the connector housing 10. The connector housing 10 is provided with a first extending in the first direction X and capable of accommodating the buffer spring portion 64 Two housing part 17. Furthermore, the shortest distance D1 between the plate surface of the intermediate portion 63 in the second direction Y and the first housing portion 22 is shorter than the shortest distance D2 between the plate surface of the buffer spring portion 64 in the second direction Y and the second housing portion 17 smaller. With this structure, even if the inspection object 200 is connected to the first The terminal connecting portion 20 applies a stress in a direction (for example, the second direction Y) intersecting the predetermined contact direction to the probe 60, and the stress is dispersed by the buffer spring portion 64, so that damage to the probe 60 can be reduced. That is, it is possible to realize the probe 60 which is not easily damaged even when a connection object such as the inspection target 200 is connected to the first terminal connection portion 20 from a direction intersecting the contact direction.

In addition, the connection housing 21 has a confirmation window 24 that communicates with the outside of the first accommodating portion 22 and the connection housing 21, and the first contact spring portion 61 can be confirmed from the outside of the connection housing 21. With this confirmation window 24, the storage state of the first contact spring portion 61 of the probe 60 stored in the first storage portion 22 can be easily confirmed.

In addition, the first terminal connection portion 20 has a plurality of probes 60 and a plurality of first accommodating portions 22 arranged at intervals in the second direction Y and respectively accommodating the probes 60. The thickness of each probe 60 is W1 is 1/2 or less of the shortest distance W2 between the plate surfaces of adjacent probes 60. With this structure, the insulation of each probe 60 can be reliably ensured.

In addition, the probe 60 further includes a positioning portion 631 and a positioning portion 641. The positioning portion 631 and the positioning portion 641 are provided between the first contact spring portion 61 and the second contact spring portion 62, and are determined to be accommodated in the first receiving portion. The position at 22 o'clock in the first direction X with respect to the first terminal connecting portion 20. With the positioning portion 631 and the positioning portion 641, the probe 60 can be reduced from falling off from the first receiving portion 22.

In addition, the positioning portion has: a first positioning portion 631, which is provided on one side of the middle portion 63 in the third direction Z, and restricts the movement toward one side of the first direction X (for example, the direction toward the second contact spring portion 62) Move; and the second positioning portion 641, It is provided on the other side of the third direction Z of the cushion spring portion 64 and restricts movement to the other side of the first direction X (for example, the direction toward the second contact spring portion 61). With this structure, it is possible to further reduce the falling of the probe 60 from the first receiving portion 22.

Furthermore, in the connector 1, the connector housing 10 is composed of an upper housing 11 and a lower housing 12 laminated in the third direction Z, but it is not limited to this. For example, as shown in FIG. 9, it may be composed of a left housing 71 and a right housing 72 laminated in the second direction Y. At this time, as shown in FIG. 10, viewed from the first direction X (ie, the paper penetration direction of FIG. 10), the four coil springs 31 of the urging portion 30 can be opposed to the second direction Y of the first terminal connecting portion 20. The center line L2 is symmetrically arranged.

In addition, the shortest distance D1 between the plate surface of the intermediate portion 63 of the probe 60 accommodated in the first accommodating portion 22 and the first accommodating portion 22 is smaller than the plate surface of the buffer spring portion 64 of the probe 60 and the second accommodating portion. The shortest distance D2 between the portions 17 is configured to be smaller, but it is not limited to this. For example, the shortest distance D1 and the shortest distance D2 may be configured in the same manner.

The housing part 25 is not limited to the case where it is configured to cover a part of the connection housing 21. For example, it may be configured to cover the entire connection housing 21 as shown in FIG. It can also be omitted.

The ground terminal 26 is not limited to being configured to be in contact with the connection terminal 41 of the substrate 40 in an elastically deformed state, and may be configured to be in contact with the connection terminal 41 of the substrate 40 in a non-elastically deformed state. At this time, for example, the ground terminal 26 may be connected to the connection terminal 41 of the substrate 40 by welding or the like, thereby improving contact reliability.

The urging part 30 is not limited to the case where it consists of four coil springs 31, For example, it may consist of one to three coil springs 31, and may consist of five or more coil springs 31. In addition, the urging part 30 is not limited to the case where the plurality of coil springs 31 are arranged up and down in the third direction Z, and the plurality of coil springs 31 may be arranged in the second direction Y in addition to being arranged up and down in the third direction Z. One or both of the left and right.

The urging member is not limited to the coil spring 31, and may be composed of a leaf spring 32 as shown in FIG. 12, for example. In FIG. 12, two leaf springs 32 are respectively arranged above and below the third direction Z (only three leaf springs 32 are shown in FIG. 12), and two leaf springs 32 are respectively arranged on the left and right sides of the second direction Y.

The structure of the terminal connection portion can be appropriately changed according to the design of the connector 1 and the like.

For example, the probe of the first terminal connecting portion 20 is not limited to the probe 60, and probes of other structures may also be used. For example, as the probe of the first terminal connection portion 20, a probe formed by a method other than the electroforming method may be used, or a probe not provided with the positioning portion 631 and the positioning portion 641 may also be used.

In addition, the connecting housing 21 is not limited to the case where there are a plurality of pairs of first receiving portions 22 arranged at intervals along the second direction Y. For example, as shown in FIG. 13, only the center line L1 relative to the third direction Z A plurality of first accommodating portions 22 are provided on one of the sides (in FIG. 13 is the upper housing 11 side of the center line L1 of the third direction Z). At this time, the ground terminal 26 of the housing portion 25 may also be provided only on one side of the center line L1 in the third direction Z.

In addition, the plurality of probes 60 of the first terminal connecting portion 20 are shown in FIG. 5, The front ends of the first contact spring portion 61 and the second contact spring portion 62 are arranged in a straight line along the second direction Y (only the second contact spring portion 62 is shown in FIG. 5), but it is not limited to this. For example, the plurality of probes 60 may be arranged in a zigzag shape in which the tip portions of the first contact spring portion 61 and the second contact spring portion 62 are alternately shifted in the first direction X.

In addition, as shown in FIG. 16, the confirmation window 24 may be omitted.

In addition, it is not limited to the case where the plate thickness W1 of each probe 60 becomes 1/2 or less (preferably 1/3 or less) of the shortest distance W2 between the plate surfaces of adjacent probes 60, and each may be The thickness W1 of the probe 60 is larger than 1/2 of the shortest distance W2 between the surfaces of the adjacent probes 60.

The probe 60 only needs to have a first contact spring portion 61 and a second contact spring portion 62, and an intermediate portion 63 and a buffer spring portion 64 arranged in series between the first contact spring portion 61 and the second contact spring portion 62, and buffer The spring portion 64 is elastically deformable in the second direction Y relative to the intermediate portion 63, and the first contact spring portion 61 and the second contact spring portion 62 are each elastically deformable in the third direction Z relative to the intermediate portion 63, then Arbitrary structure.

For example, as shown in FIG. 17, one elastic piece may constitute the first contact spring portion 61, and a plurality of elastic pieces may constitute the second contact spring portion 62. In the probe 60 of FIG. 17, the second contact spring portion 62 is composed of two elastic pieces 621 and 622 arranged with a gap 67 therebetween.

In addition, as shown in FIG. 18, each of the first contact spring portion 61 and the second contact spring portion 62 may be constituted by a plurality of elastic pieces. In the probe 60 of FIG. 18, the first contact spring portion 61 is composed of three elastic pieces 611 and elastic pieces arranged with a gap 65 therebetween. 612, an elastic piece 613, and the second contact spring portion 62 is composed of three elastic pieces 621, an elastic piece 622, and an elastic piece 623 that are arranged with a gap 67 from each other.

The buffer spring portion 64 is not limited to a frame shape, and any structure may be adopted as long as it is elastically deformable in the second direction Y with respect to the intermediate portion 63. For example, as shown in FIG. 19, the buffer spring portion 64 may consist of a first connecting portion 643 connected to the middle portion 63, a second connecting portion 644 connected to the second contact spring portion 62, and a first connecting portion 643 and The second connecting portion 644 is formed by a third connecting portion 645 having a wavy or serpentine shape extending in the first direction X. The third connecting portion 645 may also be in the shape of a rod extending in the first direction X as shown in FIG. 20.

In addition, as shown in FIGS. 21 and 22, the buffer spring portion 64 may have a rib 647 that partitions a through hole 646 that penetrates the buffer spring portion 64 in the second direction Y. In the probe 60 of FIG. 21, a rib 647 that divides the through hole 646 into two in the third direction Z may be provided. The probe 60 of FIG. 22 is provided with two ribs 647 that partition the through hole 646 into three in the first direction X.

The protruding portion 642 of the buffer spring portion 64 may be omitted as shown in FIG. 23. In addition, as shown in FIG. 24, protrusions 648 for press-fitting may be provided on both sides of the protrusion 642 in the third direction Z. The protrusions 648 protrude in directions away from each other in the third direction Z from the intermediate portion 63 toward the second contact spring portion 62 in the first direction X.

As shown in FIG. 25, a protruding portion 649 may be provided at the end portion of the buffer spring portion 64 on the second contact spring portion 62 side in the first direction X. The protruding portion 649 is arranged at one end in the first direction X of the cushion spring portion 64 in the third direction Z to the side surface to which the second contact spring portion 62 is connected. In addition, the protrusion 649 is accommodated in the front end The connector housing 10 is configured to be in contact with the inner surface of the connector housing 10 in the state. Furthermore, the second contact spring portion 62 is connected to the other end in the third direction Z of the side surface of the buffer spring portion 64 provided with the protruding portion 649. In addition, in the probe 60 of FIG. 25, in the first direction X of the first contact spring portion 61, the front end 614 away from the intermediate portion 63 is integrated with two elastic pieces 611 and 612.

As shown in FIGS. 26 and 27, the probe 60 of FIG. 25 is configured as follows: the contact portion 66 of the first contact spring portion 61 is applied with a force in the third direction Z by the inspection object 200 connected to the connector 1. In the state of, in addition to elastic deformation in the third direction Z, it also elastically deforms in the direction in which the area in contact with the inspection object 200 expands, so that the gap 65 is narrowed. In addition, it is configured as follows: the contact portion 68 of the second contact spring portion 62 is in contact with the substrate 40 in addition to being elastically deformed in the third direction Z in a state in which a force in the third direction Z is applied by the substrate 40 The area is elastically deformed in the direction in which the area expands, so that the gap 67 becomes narrower.

Each of the first contact spring portion 61 and the second contact spring portion 62 is not limited to having a wave shape or a meandering shape bent at two places in the first direction X, and may be bent at one place in the first direction X, for example. Folded roughly L-shaped or roughly J-shaped.

(Second Embodiment)

As shown in FIG. 28, the probe 60 of the second embodiment of the present disclosure is different from the probe 60 of the first embodiment in that it does not include a buffer spring portion 64. In addition, in the second embodiment, the same reference numerals are assigned to the same parts as those in the first embodiment, and the description is omitted, and the points different from the first embodiment will be described.

As shown in FIG. 28, in the probe 60 of the second embodiment, the intermediate portion 63 It is composed of an intermediate body 163 and an auxiliary intermediate portion 164. The middle part body 163 has the same shape and structure as the middle part 63 of the probe 60 of FIG. 7. The auxiliary intermediate portion 164 has the same shape and structure as the buffer spring portion 64 of the probe 60 of FIG. 7 except that the through hole 646 is not provided. That is, the auxiliary intermediate portion 164 has higher rigidity than the buffer spring portion 64 and is configured to be inelastically deformable in the second direction Y with respect to the intermediate portion main body 163 in comparison with the buffer spring portion 64.

As shown in FIGS. 29 and 30, the probe 60 of FIG. 28 is the same as the probe 60 of FIG. In a state where the inspection object 200 is applied with a force in the third direction Z, in addition to elastic deformation in the third direction Z, it also elastically deforms in a direction in which the area of contact with the inspection object 200 expands, so that the gap 65 is narrowed.

The probe 60 of the second embodiment is also the same as the probe 60 of the first embodiment, and is configured such that it can be placed in the connector 1 in a state where the first contact spring portion 61 can be in contact with the inspection target 200 (see FIG. 3). In this way, in a state where the first contact spring portion 61 can be in contact with the inspection target 200, the probe 60 is arranged in the connector 1, and conduction inspection, operation characteristic inspection, and the like are performed. In this type of inspection, the repetition frequency of the connection and disconnection of the inspection object 200 to the connector 1 is higher than that of the inspection device 100 and the substrate 40 that is electrically connected to the second terminal connection portion 50 that can be connected to the inspection device 100 (that is, , The inspection device 100 and the substrate 40 are an example of the first connection object, and the inspection object 200 is an example of the second connection object).

In addition, the inspection probe usually repeatedly performs connection and disconnection of the connection object frequently, and therefore durability is required. If nickel is used to ensure durability If the probe is formed of a material with high hardness such as alloy or titanium alloy, there is a risk of damage to the connected object. Conversely, if the probe is formed of a material with low hardness such as beryllium steel or phosphor bronze, the probe may not have sufficient durability. Deterioration of points.

According to the probe 60 of the second embodiment, the first contact spring portion 61 can be elastically deformed more smoothly, the durability of the first contact spring portion 61 is improved, and the contact force caused by the first contact spring portion 61 is more reliably reduced. Caused damage to the connected object. That is, the life of the connector 1 on which the probe 60 is arranged can be extended.

Furthermore, by forming the probe 60 with a material with high hardness, such as a nickel alloy or a titanium alloy, and reducing the thickness of the first contact spring portion 61, the contact portion 66 contacting the inspection object 200 can be made larger. The soft displacement allows the first contact spring portion 61 to be elastically deformed more smoothly. In addition, by connecting the front ends of the elastic pieces 611 and the elastic pieces 612 of the first contact spring portion 61 to each other, and the gap 65 is enclosed by the elastic pieces 611, the elastic pieces 612, and the intermediate portion 63, the first contact spring portion The increased strength of 61 can further improve the durability of the first contact spring portion 61. Furthermore, the first contact spring portion 61 is composed of a plurality of elastic pieces 611 and 612, so that a plurality of electrical paths are formed from the contact portion with the inspection object 200 to the intermediate portion 63, and the resistance of the probe 60 can be reduced.

In the probe 60 shown in FIG. 28, the first contact spring portion 61 and the second contact spring portion 62 each extend in the first direction X, but it is not limited to this case. For example, the second contact spring portion 62 may also be arranged to extend in the second direction Y. Furthermore, the second contact spring portion 62 only needs to be in a direction intersecting the extension direction and the second direction Y. It is only required to be constructed in an elastically deformable manner.

In addition, as shown in FIG. 31, in the probe 60 of FIG. 28, the second contact spring portion 62 may be composed of a plurality of elastic pieces. In the probe 60 of FIG. 31, two elastic pieces 621 and 622 constitute the second contact spring portion 62.

As shown in FIGS. 32 and 33, the probe 60 of FIG. 31 is also configured in the same manner as the probe 60 of FIG. 25: the contact portion 66 of the first contact spring portion 61 is connected to the connector 1 by the In a state where the inspection object 200 is applied with a force in the third direction Z, in addition to elastic deformation in the third direction Z, it also elastically deforms in a direction in which the area of contact with the inspection object 200 expands, so that the gap 65 is narrowed. In addition, it is configured in the following manner: the contact portion 68 of the second contact spring portion 62, in a state where a force in the third direction Z is applied by the substrate 40, is not only elastically deformed in the third direction, but also in contact with the substrate 40 The area expands elastically and deforms so that the gap 67 becomes narrower.

Above, various embodiments of the present disclosure have been described in detail with reference to the drawings, and finally, various modes of the present disclosure have been described. In addition, in the following description, as an example, reference signs are also attached and described.

The probe 60 of the first aspect of the present disclosure can be arranged in the connector 1, and the connector 1 can be connected to the connection object 100 and the connection object 200. The probe 60 includes a first contact spring portion 61 and a first contact spring portion 61. Two contact spring portions 62; and an intermediate portion 63 and a buffer spring portion 64, arranged in series between the first contact spring portion 61 and the second contact spring portion 62, the intermediate portion 63 in the first direction X Both ends are respectively connected to the first For the contact spring portion 61 and the buffer spring portion 64, the first direction X is relative to the intermediate portion 63 as the first contact spring portion 61, the intermediate portion 63, the buffer spring portion 64, and the In the arrangement direction of the second contact spring portion 62, both ends of the buffer spring portion 64 in the first direction X are respectively connected to the intermediate portion 63 and the second contact spring portion 62, and the buffer spring portion The spring portion 64 is configured to be elastically deformable in a second direction Y intersecting the first direction X, and the first contact spring portion 61 and the second contact spring portion 62 are opposed to the intermediate portion 63 The third direction Z intersecting the first direction X and the second direction Y is configured to be elastically deformable.

According to the probe 60 of the first aspect, even if a stress in a direction intersecting the predetermined contact direction is applied, the stress is dispersed by the buffer spring portion 64, and damage to the probe 60 can be reduced. As a result, a probe 60 that is not easily damaged can be realized.

The probe 60 of the second form of the present disclosure further includes a positioning portion 631 and a positioning portion 641, which are provided between the first contact spring portion 61 and the second contact spring portion 62, and are determined to be accommodated in the connector The position of the housing 10 with respect to the housing 10 in the first direction X when the housing 10 is set to 1.

According to the probe 60 of the second aspect, the positioning portion 631 and the positioning portion 641 can reduce the falling of the probe 60 from the first receiving portion 22.

In the probe 60 of the third aspect of the present disclosure, the positioning portion has: a first positioning portion 631, which is provided in the third direction Z of the intermediate portion 63 The middle side restricts movement to one side of the first direction X; and a second positioning portion 641 is provided on the other side of the third direction Z of the buffer spring portion 64 to restrict movement to the Movement on the other side of the first direction X.

According to the probe 60 of the third aspect, the falling of the probe 60 from the first housing portion 22 can be further reduced.

In the probe 60 of the fourth aspect of the present disclosure, at least one of the first contact spring portion 61 and the second contact spring portion 62 is formed by a plurality of elastic pieces 611 arranged with a gap 65 therebetween. 612 constituted.

In the probe 60 of the fifth aspect of the present disclosure, the first contact spring portion 61 is also in a state where the force of the third direction Z is applied due to the contact of the connected object 200 to be connected. It is configured to be elastically deformable in the direction in which the area in contact with the connection object 200 expands.

In the probe 60 of the sixth aspect of the present disclosure, the first contact spring portion 61 is in a state where the force of the third direction Z is applied due to the contact of the connected object 200 to be connected, so The plurality of elastic pieces 611 and the elastic piece 612 are configured such that the gap 65 between adjacent elastic pieces is narrowed.

According to the probes 60 of the fourth to sixth forms, the first contact spring portion 61 can be elastically deformed more smoothly, the durability of the first contact spring portion 61 is improved, and the amount of the first contact spring portion 61 can be reduced more reliably. Damage to the connected object caused by the contact.

The probe 60 of the seventh aspect of the present disclosure can be arranged in the connector 1, and the connector 1 can be connected to the connection object 100 and the connection object 200, and the probe 60 includes: a plate-shaped first contact spring portion 61, extending in the first direction X; a plate-shaped second contact spring portion 62; and an intermediate portion 63 disposed between the first contact spring portion 61 and the second contact spring portion 62, the first The contact spring portion 61 is composed of a plurality of elastic pieces 611 and an elastic piece 612. The third direction Z intersecting the second direction Y of the plate thickness direction of each second contact spring portion 62 is elastically deformable, and is disposed with a gap 65 therebetween. The extending direction of the contact spring portion and the direction Z intersecting the second direction are configured to be elastically deformable, and each of the plurality of elastic pieces 611 and 612 has an end away from the middle portion in the first direction. Connect with each other.

According to the probe 60 of the seventh aspect, the first contact spring portion 61 can be elastically deformed more smoothly, the durability of the first contact spring portion 61 can be improved, and the contact caused by the first contact spring portion 61 can be reduced more reliably. Damage to the connected object.

In the probe 60 of the eighth aspect of the present disclosure, as the connection object 100 and the connection object 200, a first connection object 100 is included, and compared to the first connection object 100, the connection Device 1 The second connection object 200 with a higher frequency of repeated connection and disconnection of the connection can be arranged in the connector 1 in a state where the first contact spring portion 61 can contact the second connection object 200 Way of composition.

According to the probe 60 of the eighth aspect, the first contact spring portion 61 is configured so that the second connection object 200 that is more frequently connected to and disconnected from the connector 1 can be contacted, so that the arranged connector 1 can be extended. Life.

In the probe 60 of the ninth aspect of the present disclosure, the first contact spring portion 61 is in a state where the force of the third direction Z is applied due to the contact of the connected object 200 to be connected. The plurality of elastic pieces 611 and the elastic piece 612 are configured such that the gap 65 between adjacent elastic pieces is narrowed.

In the probe 60 of the tenth aspect of the present disclosure, the first contact spring portion 61 is also in a state where the force of the third direction Z is applied due to the contact of the connected object 200 to be connected. It is configured to be elastically deformable in the direction in which the area in contact with the connection object 200 expands.

According to the probes 60 of the ninth and tenth forms, the first contact spring portion 61 can be elastically deformed more smoothly, the durability of the first contact spring portion 61 can be improved, and the damage caused by the first contact spring portion 61 can be reduced more reliably. Damage to the connected object caused by the contact.

The inspection method of the eleventh aspect of the present disclosure uses a probe 60, which can be arranged in the connector 1, and the connector 1 can be connected to the connection object 100 and the connection object 200, and the probe 60 include: A plate-shaped first contact spring portion 61 extending in the first direction X; a plate-shaped second contact spring portion 62; and an intermediate portion 63 disposed on the first contact spring portion 61 and the second contact spring portion 62, the first contact spring portion 61 is composed of a plurality of elastic pieces 611 and 612, the plurality of elastic pieces 611, the elastic pieces 612 in the first direction X, and as the first The third direction Z intersecting the second direction Y of the plate thickness direction of each of the one contact spring portion 61 and the second contact spring portion 62 is elastically deformable and is disposed with a gap 65 therebetween, the second contact spring portion 62 is configured to be elastically deformable in a direction intersecting with the extending direction of the second contact spring portion 62 and the second direction Y, and the plurality of elastic pieces 611 and 612 are respectively connected to the first The ends of the direction X away from the intermediate portion 63 are connected to each other, and in the inspection method, as the connection object 100 and the connection object 200, a first connection object 100 and a comparison with the first connection object 100 are included. The second connection object 200 that is more frequently connected to the connector 1 and disconnected from the connection object 100 is connected to the second connection object 200 where the first contact spring portion 61 can contact the second connection object 200 In the state, the probe 60 is arranged on the connector 1.

According to the inspection method of the eleventh aspect, the probe 60 is arranged so that the first contact spring portion 61 with high durability comes into contact with the second connection object 200 with a high frequency of repeated connection to and disconnection of the connector 1于Connector 1. With this structure, the life of the connector 1 can be extended.

Furthermore, by appropriately combining any of the aforementioned various embodiments or modifications, the effects possessed by each can be exerted. In addition, a combination of embodiments, a combination of embodiments, or a combination of embodiments and embodiments can be performed, and a combination of features in different embodiments or embodiments can also be performed.

On the one hand, the present disclosure fully describes the preferred embodiments with reference to the accompanying drawings, but those who are familiar with the technology are aware of various modifications or corrections. Such deformations or corrections should be understood as being included therein as long as they do not deviate from the scope of the present disclosure obtained from the scope of the attached patent application.

[Industrial availability]

The probe of the present disclosure can be applied to, for example, a connector used for inspection of USB components or HDMI components.

60‧‧‧Probe

61‧‧‧First contact spring part

62‧‧‧Second contact spring part

63‧‧‧Middle

64‧‧‧Cushion spring part

621, 622‧‧‧elastic sheet

631‧‧‧First positioning part

641‧‧‧Second positioning part

642‧‧‧Protrusion

X‧‧‧First direction

Y‧‧‧Second direction

Z‧‧‧Third Party

Claims (11)

A probe that can be arranged in a connector, the connector can be connected to a connection object, the probe includes: a first contact spring part and a second contact spring part; and a middle part and a buffer spring part, in the The first contact spring portion and the second contact spring portion are arranged in series, and both end portions in the first direction of the intermediate portion are respectively connected to the first contact spring portion and the buffer spring portion, and the first contact spring portion One direction is the arrangement direction of the first contact spring portion, the intermediate portion, the buffer spring portion, and the second contact spring portion relative to the intermediate portion, and the first contact spring portion of the buffer spring portion The opposite ends of the direction are respectively connected to the intermediate portion and the second contact spring portion, and the buffer spring portion is configured to be elastically deformable in a second direction intersecting the first direction, and the first The contact spring portion and the second contact spring portion are configured to be elastically deformable in a third direction intersecting the first direction and the second direction with respect to the intermediate portion. As described in the first item of the scope of patent application, the probe further includes: a positioning portion, which is provided between the first contact spring portion and the second contact spring portion, and when it is determined to be accommodated in the connector housing的 position relative to the first direction of the housing. The probe according to item 2 of the scope of patent application, wherein the positioning part has: The first positioning portion is provided on one side of the third direction of the intermediate portion to restrict movement to the side of the first direction; and the second positioning portion is provided on the buffer spring portion. The other side of the third direction restricts movement to the other side of the first direction. The probe according to any one of claims 1 to 3, wherein at least one of the first contact spring portion and the second contact spring portion is arranged by opening a gap with each other. Consists of a flexible sheet. The probe according to claim 4, wherein the first contact spring portion is configured to be in a state where the force of the third direction is applied due to the contact of the connected object to be connected. The direction in which the area in contact with the connection object expands can be elastically deformed. The probe according to claim 4, wherein the first contact spring portion is configured to be in a state where the force of the third direction is applied due to the contact of the connected object to be connected, so The gap between adjacent elastic pieces among the plurality of elastic pieces becomes narrow. A probe that can be arranged in a connector that can be connected to an object to be connected. The probe includes: a plate-shaped first contact spring portion extending in a first direction; and a plate-shaped second contact spring portion And an intermediate portion, disposed between the first contact spring portion and the second contact spring portion, the first contact spring portion is composed of a plurality of elastic pieces, the plurality of elastic pieces It is elastically deformable in a third direction that intersects the first direction and the second direction of the thickness direction of each of the first contact spring portion and the second contact spring portion, and is disposed with a gap therebetween, The second contact spring portion is configured to be elastically deformable in a direction intersecting the extension direction of the second contact spring portion and the second direction, and the plurality of elastic pieces are each away from each other in the first direction. The ends of the middle part are connected to each other. The probe according to claim 7, wherein as the connection object, a first connection object and a second connection object are included, and the second connection object is compared with the first connection object The connection to the connector and the disconnection of the connection are more frequently repeated, and the first contact spring portion is configured to be able to be arranged in the connector while being connectable to the second connection target object. The probe according to claim 7 or 8, wherein the first contact spring portion is configured to apply the force in the third direction due to the contact of the connected object to be connected In the state, the gap between adjacent elastic pieces among the plurality of elastic pieces becomes narrow. The probe according to claim 7 or 8, wherein the first contact spring portion is configured to apply the force in the third direction due to the contact of the connected object to be connected In the state, it can be elastically deformed in the direction in which the area in contact with the connection object expands. An inspection method using probes that can be configured to connect The connector can be connected to an object to be connected, and the probe includes: a plate-shaped first contact spring portion extending in a first direction; a plate-shaped second contact spring portion; and an intermediate portion arranged at all Between the first contact spring portion and the second contact spring portion, the first contact spring portion is composed of a plurality of elastic pieces that are in contact with the first direction and the first direction. The first contact spring portion and the second contact spring portion are elastically deformable in the third direction intersecting the second direction of the plate thickness direction, and are arranged with a gap therebetween. The second contact spring portion is configured to The extending direction of the second contact spring portion and the direction intersecting the second direction can be elastically deformed. In the inspection method, as the connection object, a first connection object and a second connection object are included, and the connection of the second connection object to the connector and the connection of the second connection object compared to the first connection object The repetitive frequency of the disconnection is higher, and the probe is arranged in the connector in a state where the first contact spring portion can contact the second connection object.

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