KR102386369B1 - 편광판의 검사 방법 및 검사 장치 - Google Patents

편광판의 검사 방법 및 검사 장치 Download PDF

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Publication number
KR102386369B1
KR102386369B1 KR1020160125736A KR20160125736A KR102386369B1 KR 102386369 B1 KR102386369 B1 KR 102386369B1 KR 1020160125736 A KR1020160125736 A KR 1020160125736A KR 20160125736 A KR20160125736 A KR 20160125736A KR 102386369 B1 KR102386369 B1 KR 102386369B1
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KR
South Korea
Prior art keywords
polarizing plate
defect candidate
long
defect
polarizer
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KR1020160125736A
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English (en)
Korean (ko)
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KR20170038727A (ko
Inventor
슈야 후루사와
다다아키 스기와키
마사히로 야에가시
마키코 기무라
Original Assignee
닛토덴코 가부시키가이샤
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Publication of KR20170038727A publication Critical patent/KR20170038727A/ko
Priority to KR1020210128329A priority Critical patent/KR20210124118A/ko
Application granted granted Critical
Publication of KR102386369B1 publication Critical patent/KR102386369B1/ko

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3033—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/14—Protective coatings, e.g. hard coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8874—Taking dimensions of defect into account
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Polarising Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
KR1020160125736A 2015-09-30 2016-09-29 편광판의 검사 방법 및 검사 장치 KR102386369B1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020210128329A KR20210124118A (ko) 2015-09-30 2021-09-28 편광판의 검사 방법 및 검사 장치

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JPJP-P-2015-195322 2015-09-30
JP2015195322 2015-09-30
JPJP-P-2016-170417 2016-09-01
JP2016170417A JP6784540B2 (ja) 2015-09-30 2016-09-01 偏光板の検査方法および検査装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020210128329A Division KR20210124118A (ko) 2015-09-30 2021-09-28 편광판의 검사 방법 및 검사 장치

Publications (2)

Publication Number Publication Date
KR20170038727A KR20170038727A (ko) 2017-04-07
KR102386369B1 true KR102386369B1 (ko) 2022-04-13

Family

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Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020160125736A KR102386369B1 (ko) 2015-09-30 2016-09-29 편광판의 검사 방법 및 검사 장치
KR1020210128329A KR20210124118A (ko) 2015-09-30 2021-09-28 편광판의 검사 방법 및 검사 장치

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1020210128329A KR20210124118A (ko) 2015-09-30 2021-09-28 편광판의 검사 방법 및 검사 장치

Country Status (3)

Country Link
JP (3) JP6784540B2 (zh)
KR (2) KR102386369B1 (zh)
CN (3) CN112817083B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7310101B2 (ja) * 2017-08-03 2023-07-19 東レ株式会社 ガス拡散電極の検査方法およびガス拡散電極
JP7299219B2 (ja) * 2018-07-30 2023-06-27 日本化薬株式会社 マーキング装置、マーキング方法、偏光板の製造方法および偏光板
JP2023018822A (ja) 2021-07-28 2023-02-09 パナソニックＩｐマネジメント株式会社 検査方法および検査装置

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JP2004198163A (ja) 2002-12-17 2004-07-15 Sumitomo Chem Co Ltd 保護フィルム粘着偏光板の欠陥検査方法
JP2007212442A (ja) 2006-01-11 2007-08-23 Nitto Denko Corp 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置
JP2008175609A (ja) 2007-01-17 2008-07-31 Sekisui Chem Co Ltd 光学フィルムの検査方法及び光学フィルム
JP2013007689A (ja) 2011-06-27 2013-01-10 Fujifilm Corp 欠陥検査装置及び方法
JP2014211548A (ja) 2013-04-19 2014-11-13 住友化学株式会社 偏光能を示さない領域を有する偏光性積層フィルムの製造方法及び偏光板

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Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004198163A (ja) 2002-12-17 2004-07-15 Sumitomo Chem Co Ltd 保護フィルム粘着偏光板の欠陥検査方法
JP2007212442A (ja) 2006-01-11 2007-08-23 Nitto Denko Corp 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置
JP2008175609A (ja) 2007-01-17 2008-07-31 Sekisui Chem Co Ltd 光学フィルムの検査方法及び光学フィルム
JP2013007689A (ja) 2011-06-27 2013-01-10 Fujifilm Corp 欠陥検査装置及び方法
JP2014211548A (ja) 2013-04-19 2014-11-13 住友化学株式会社 偏光能を示さない領域を有する偏光性積層フィルムの製造方法及び偏光板

Also Published As

Publication number Publication date
KR20210124118A (ko) 2021-10-14
CN106940320B (zh) 2021-03-16
KR20170038727A (ko) 2017-04-07
CN112782798A (zh) 2021-05-11
CN112817083B (zh) 2022-12-30
CN106940320A (zh) 2017-07-11
JP2021012393A (ja) 2021-02-04
CN112782798B (zh) 2023-06-09
JP2021012392A (ja) 2021-02-04
JP2017068244A (ja) 2017-04-06
JP6967131B2 (ja) 2021-11-17
JP6801142B1 (ja) 2020-12-16
JP6784540B2 (ja) 2020-11-11
CN112817083A (zh) 2021-05-18

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