JP6784540B2 - 偏光板の検査方法および検査装置 - Google Patents

偏光板の検査方法および検査装置 Download PDF

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Publication number
JP6784540B2
JP6784540B2 JP2016170417A JP2016170417A JP6784540B2 JP 6784540 B2 JP6784540 B2 JP 6784540B2 JP 2016170417 A JP2016170417 A JP 2016170417A JP 2016170417 A JP2016170417 A JP 2016170417A JP 6784540 B2 JP6784540 B2 JP 6784540B2
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Japan
Prior art keywords
defect candidate
polarizing plate
defect
periodicity
size
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JP2016170417A
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English (en)
Japanese (ja)
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JP2017068244A (ja
Inventor
修也 古澤
修也 古澤
正晃 杉脇
正晃 杉脇
将寛 八重樫
将寛 八重樫
真規子 木村
真規子 木村
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Nitto Denko Corp
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Nitto Denko Corp
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Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to CN202110202953.6A priority Critical patent/CN112782798B/zh
Priority to CN202110204125.6A priority patent/CN112817083B/zh
Priority to KR1020160125736A priority patent/KR102386369B1/ko
Priority to CN201610868195.0A priority patent/CN106940320B/zh
Publication of JP2017068244A publication Critical patent/JP2017068244A/ja
Priority to JP2020178050A priority patent/JP6967131B2/ja
Application granted granted Critical
Publication of JP6784540B2 publication Critical patent/JP6784540B2/ja
Priority to KR1020210128329A priority patent/KR20210124118A/ko
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Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3033—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/14—Protective coatings, e.g. hard coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8874—Taking dimensions of defect into account
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Polarising Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
JP2016170417A 2015-09-30 2016-09-01 偏光板の検査方法および検査装置 Active JP6784540B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
CN202110202953.6A CN112782798B (zh) 2015-09-30 2016-09-29 偏振板的制造方法
CN202110204125.6A CN112817083B (zh) 2015-09-30 2016-09-29 偏振板的制造方法
KR1020160125736A KR102386369B1 (ko) 2015-09-30 2016-09-29 편광판의 검사 방법 및 검사 장치
CN201610868195.0A CN106940320B (zh) 2015-09-30 2016-09-29 纵长状的偏振板的检查方法、制造方法以及外观检查装置
JP2020178050A JP6967131B2 (ja) 2015-09-30 2020-10-23 偏光板の検査方法および検査装置
KR1020210128329A KR20210124118A (ko) 2015-09-30 2021-09-28 편광판의 검사 방법 및 검사 장치

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015195322 2015-09-30
JP2015195322 2015-09-30

Related Child Applications (2)

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JP2020178049A Division JP6801142B1 (ja) 2015-09-30 2020-10-23 偏光板の検査方法および検査装置
JP2020178050A Division JP6967131B2 (ja) 2015-09-30 2020-10-23 偏光板の検査方法および検査装置

Publications (2)

Publication Number Publication Date
JP2017068244A JP2017068244A (ja) 2017-04-06
JP6784540B2 true JP6784540B2 (ja) 2020-11-11

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JP2016170417A Active JP6784540B2 (ja) 2015-09-30 2016-09-01 偏光板の検査方法および検査装置
JP2020178049A Active JP6801142B1 (ja) 2015-09-30 2020-10-23 偏光板の検査方法および検査装置
JP2020178050A Active JP6967131B2 (ja) 2015-09-30 2020-10-23 偏光板の検査方法および検査装置

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JP2020178050A Active JP6967131B2 (ja) 2015-09-30 2020-10-23 偏光板の検査方法および検査装置

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JP (3) JP6784540B2 (zh)
KR (2) KR102386369B1 (zh)
CN (3) CN112817083B (zh)

Families Citing this family (3)

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JP7310101B2 (ja) * 2017-08-03 2023-07-19 東レ株式会社 ガス拡散電極の検査方法およびガス拡散電極
JP7299219B2 (ja) * 2018-07-30 2023-06-27 日本化薬株式会社 マーキング装置、マーキング方法、偏光板の製造方法および偏光板
JP2023018822A (ja) 2021-07-28 2023-02-09 パナソニックＩｐマネジメント株式会社 検査方法および検査装置

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Also Published As

Publication number Publication date
KR20210124118A (ko) 2021-10-14
CN106940320B (zh) 2021-03-16
KR20170038727A (ko) 2017-04-07
CN112782798A (zh) 2021-05-11
CN112817083B (zh) 2022-12-30
CN106940320A (zh) 2017-07-11
JP2021012393A (ja) 2021-02-04
CN112782798B (zh) 2023-06-09
JP2021012392A (ja) 2021-02-04
JP2017068244A (ja) 2017-04-06
JP6967131B2 (ja) 2021-11-17
JP6801142B1 (ja) 2020-12-16
CN112817083A (zh) 2021-05-18
KR102386369B1 (ko) 2022-04-13

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