KR102311432B1 - 전기 검사 장치 및 보유 지지 유닛 - Google Patents

전기 검사 장치 및 보유 지지 유닛 Download PDF

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Publication number
KR102311432B1
KR102311432B1 KR1020200077514A KR20200077514A KR102311432B1 KR 102311432 B1 KR102311432 B1 KR 102311432B1 KR 1020200077514 A KR1020200077514 A KR 1020200077514A KR 20200077514 A KR20200077514 A KR 20200077514A KR 102311432 B1 KR102311432 B1 KR 102311432B1
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KR
South Korea
Prior art keywords
electrical inspection
substrate
switching unit
electrical
inspected
Prior art date
Application number
KR1020200077514A
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English (en)
Korean (ko)
Other versions
KR20210006285A (ko
Inventor
도루 이시이
Original Assignee
야마하 파인 테크 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 야마하 파인 테크 가부시키가이샤 filed Critical 야마하 파인 테크 가부시키가이샤
Publication of KR20210006285A publication Critical patent/KR20210006285A/ko
Application granted granted Critical
Publication of KR102311432B1 publication Critical patent/KR102311432B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020200077514A 2019-07-08 2020-06-25 전기 검사 장치 및 보유 지지 유닛 KR102311432B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2019-126813 2019-07-08
JP2019126813A JP7371885B2 (ja) 2019-07-08 2019-07-08 電気検査装置及び保持ユニット

Publications (2)

Publication Number Publication Date
KR20210006285A KR20210006285A (ko) 2021-01-18
KR102311432B1 true KR102311432B1 (ko) 2021-10-12

Family

ID=74006517

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020200077514A KR102311432B1 (ko) 2019-07-08 2020-06-25 전기 검사 장치 및 보유 지지 유닛

Country Status (4)

Country Link
JP (1) JP7371885B2 (ja)
KR (1) KR102311432B1 (ja)
CN (1) CN112198414B (ja)
TW (1) TWI748549B (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116316278B (zh) * 2023-05-22 2023-09-22 国网山东省电力公司诸城市供电公司 一种供电用的线路检修装置

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JP2002107410A (ja) 2000-09-29 2002-04-10 Ando Electric Co Ltd Ｔａｂ用オートハンドラ
JP2002107411A (ja) 2000-09-29 2002-04-10 Ando Electric Co Ltd テストヘッドの支持台
JP2002164396A (ja) 2000-09-05 2002-06-07 Cascade Microtech Inc プローブステーション用チャック組立体
WO2005093820A1 (ja) 2004-03-25 2005-10-06 Tokyo Electron Limited 重量物の旋回装置
JP2007524814A (ja) 2003-03-31 2007-08-30 インテスト コーポレイション テストヘッド位置決めシステムと方法
JP2017028296A (ja) 2015-03-30 2017-02-02 株式会社東京精密 プローバ
JP2017126729A (ja) 2016-01-08 2017-07-20 株式会社東京精密 プローバ及びプローブコンタクト方法
JP2018041838A (ja) 2016-09-07 2018-03-15 株式会社東京精密 プローバ

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JPH02243976A (ja) * 1989-03-17 1990-09-28 Nippon Seiko Kk 回路基板検査装置における接触子移動方法及びその装置
JPH0572283A (ja) * 1991-09-10 1993-03-23 Hitachi Electron Eng Co Ltd Ｉｃテスターの測定治具
JPH0827334B2 (ja) * 1992-11-13 1996-03-21 日東精工株式会社 基板検査装置
JPH0755885A (ja) * 1993-06-30 1995-03-03 Hitachi Ltd 電気回路基板の電気特性検査装置
JP3116261B2 (ja) * 1994-05-17 2000-12-11 東京エレクトロン株式会社 プローブ装置
JPH0915302A (ja) * 1995-06-30 1997-01-17 Olympus Optical Co Ltd 回路基板検査機の位置決め装置および位置決め方法
JP3545655B2 (ja) * 1999-09-08 2004-07-21 株式会社日本マイクロニクス 電気接続装置
DE10392404T5 (de) * 2002-03-22 2005-04-14 Electro Scientific Industries, Inc., Portland Messkopfausrichtungsvorrichtung
JP3842192B2 (ja) * 2002-09-12 2006-11-08 シーケーディ株式会社 部品実装装置及び部品検査装置
GB0308550D0 (en) 2003-04-10 2003-05-21 Barker Colin Improvements to an automatic test machine
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JP5334355B2 (ja) 2005-05-27 2013-11-06 ヤマハファインテック株式会社 プリント基板の電気検査装置および電気検査方法
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JP4986130B2 (ja) 2007-01-16 2012-07-25 日本電産リード株式会社 基板検査装置
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JP6273131B2 (ja) * 2013-11-27 2018-01-31 株式会社日本マイクロニクス 検査装置、及び検査方法
KR101754175B1 (ko) * 2014-12-27 2017-07-05 싱크-테크 시스템 코포레이션 업그레이드 기능을 구비한 테스트 기기
JP6520356B2 (ja) * 2015-04-28 2019-05-29 新東工業株式会社 検査装置および検査方法
TWI631352B (zh) * 2016-08-02 2018-08-01 旺矽科技股份有限公司 Measuring system

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002164396A (ja) 2000-09-05 2002-06-07 Cascade Microtech Inc プローブステーション用チャック組立体
JP2002107410A (ja) 2000-09-29 2002-04-10 Ando Electric Co Ltd Ｔａｂ用オートハンドラ
JP2002107411A (ja) 2000-09-29 2002-04-10 Ando Electric Co Ltd テストヘッドの支持台
JP2007524814A (ja) 2003-03-31 2007-08-30 インテスト コーポレイション テストヘッド位置決めシステムと方法
WO2005093820A1 (ja) 2004-03-25 2005-10-06 Tokyo Electron Limited 重量物の旋回装置
JP2017028296A (ja) 2015-03-30 2017-02-02 株式会社東京精密 プローバ
JP2017126729A (ja) 2016-01-08 2017-07-20 株式会社東京精密 プローバ及びプローブコンタクト方法
JP2018041838A (ja) 2016-09-07 2018-03-15 株式会社東京精密 プローバ

Also Published As

Publication number Publication date
TWI748549B (zh) 2021-12-01
JP7371885B2 (ja) 2023-10-31
TW202102866A (zh) 2021-01-16
CN112198414A (zh) 2021-01-08
CN112198414B (zh) 2024-04-26
KR20210006285A (ko) 2021-01-18
JP2021012117A (ja) 2021-02-04

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