KR102065932B1 - 네거티브 톤 현상에 의한 포토리소그래프 패턴 형성 방법 - Google Patents

네거티브 톤 현상에 의한 포토리소그래프 패턴 형성 방법 Download PDF

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KR102065932B1
KR102065932B1 KR1020120124459A KR20120124459A KR102065932B1 KR 102065932 B1 KR102065932 B1 KR 102065932B1 KR 1020120124459 A KR1020120124459 A KR 1020120124459A KR 20120124459 A KR20120124459 A KR 20120124459A KR 102065932 B1 KR102065932 B1 KR 102065932B1
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polymer
layer
photoresist
photoresist composition
exposure
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KR20130049165A (ko
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배영철
지빈 선
이승현
박종근
세실리 앤디즈
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롬 앤드 하스 일렉트로닉 머트어리얼즈 엘엘씨
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
    • G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F20/00—Homopolymers and copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride, ester, amide, imide or nitrile thereof
    • C08F20/02—Monocarboxylic acids having less than ten carbon atoms, Derivatives thereof
    • C08F20/10—Esters
    • C08F20/26—Esters containing oxygen in addition to the carboxy oxygen
    • C08F20/28—Esters containing oxygen in addition to the carboxy oxygen containing no aromatic rings in the alcohol moiety
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
    • G03F7/0387—Polyamides or polyimides
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/30—Imagewise removal using liquid means
    • G03F7/32—Liquid compositions therefor, e.g. developers
    • G03F7/325—Non-aqueous compositions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
    • H10P76/20—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials
    • H10P76/204—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials of organic photoresist masks
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/094—Multilayer resist systems, e.g. planarising layers
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Architecture (AREA)
  • Structural Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials For Photolithography (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
KR1020120124459A 2011-11-03 2012-11-05 네거티브 톤 현상에 의한 포토리소그래프 패턴 형성 방법 Expired - Fee Related KR102065932B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161555462P 2011-11-03 2011-11-03
US61/555,462 2011-11-03

Publications (2)

Publication Number Publication Date
KR20130049165A KR20130049165A (ko) 2013-05-13
KR102065932B1 true KR102065932B1 (ko) 2020-01-14

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Country Status (5)

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US (1) US8790867B2 (https=)
JP (1) JP6118538B2 (https=)
KR (1) KR102065932B1 (https=)
CN (1) CN103091978B (https=)
TW (1) TWI477907B (https=)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130302735A1 (en) * 2011-11-03 2013-11-14 Rohm And Haas Electronic Materials Llc Monomers, polymers and photoresist compositions
KR102233875B1 (ko) * 2013-12-30 2021-03-30 롬엔드하스전자재료코리아유한회사 광산 발생제를 포함하는 반사방지 코팅 조성물을 이용한 패턴 형성 방법
JP6267533B2 (ja) 2014-02-14 2018-01-24 信越化学工業株式会社 パターン形成方法
CN105960419B (zh) * 2014-02-14 2018-03-16 三菱瓦斯化学株式会社 (甲基)丙烯酸酯化合物及其制造方法
US9472448B2 (en) * 2014-03-14 2016-10-18 Taiwan Semiconductor Manufacturing Company, Ltd. Contact plug without seam hole and methods of forming the same
KR102245135B1 (ko) 2014-05-20 2021-04-28 삼성전자 주식회사 패턴 형성 방법 및 이를 이용한 집적회로 소자의 제조 방법
KR101989707B1 (ko) * 2014-07-08 2019-06-14 도쿄엘렉트론가부시키가이샤 네거티브톤 현상제 겸용 포토레지스트 조성물 및 이용 방법
US11092894B2 (en) 2014-12-31 2021-08-17 Rohm And Haas Electronic Materials Korea Ltd. Method for forming pattern using anti-reflective coating composition comprising photoacid generator
KR102374049B1 (ko) 2015-06-02 2022-03-14 삼성전자주식회사 포토레지스트를 이용한 패턴 형성 방법
US10061199B2 (en) * 2015-06-24 2018-08-28 Tokyo Electron Limited Methods of forming a mask for substrate patterning
US9685507B2 (en) 2015-06-25 2017-06-20 International Business Machines Corporation FinFET devices
US10211051B2 (en) * 2015-11-13 2019-02-19 Canon Kabushiki Kaisha Method of reverse tone patterning
TWI587093B (zh) * 2016-04-11 2017-06-11 台灣積體電路製造股份有限公司 三層型光阻結構和其製造方法
CN106784398B (zh) * 2016-12-15 2019-12-03 武汉华星光电技术有限公司 Oled封装方法与oled封装结构
US10727055B2 (en) * 2017-02-10 2020-07-28 International Business Machines Corporation Method to increase the lithographic process window of extreme ultra violet negative tone development resists
JP6937648B2 (ja) * 2017-09-28 2021-09-22 東京応化工業株式会社 レジスト組成物及びレジストパターン形成方法
CN107799402A (zh) * 2017-10-24 2018-03-13 德淮半导体有限公司 二次图形的形成方法
CN109679020B (zh) * 2018-12-28 2020-12-29 厦门恒坤新材料科技股份有限公司 含立方烷的丙烯酸酯系成膜树脂和ArF光刻胶及其制备方法和光刻方法
CN115699255A (zh) * 2020-07-02 2023-02-03 应用材料公司 用于光刻应用的光刻胶层上的碳的选择性沉积
CN112129237B (zh) * 2020-08-17 2022-05-20 江苏大学 基于石英晶体微天平评估光刻胶光刻效率的方法
US11656550B2 (en) 2020-09-01 2023-05-23 Tokyo Electron Limited Controlling semiconductor film thickness
CN115729046B (zh) * 2021-08-30 2025-06-13 长鑫存储技术有限公司 关键尺寸的控制方法与控制系统

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011122336A1 (ja) * 2010-03-30 2011-10-06 Jsr株式会社 感放射線性樹脂組成物およびパターン形成方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2715881B2 (ja) 1993-12-28 1998-02-18 日本電気株式会社 感光性樹脂組成物およびパターン形成方法
JP2002193895A (ja) 2000-12-27 2002-07-10 Daicel Chem Ind Ltd 環式骨格を有する３−アクリロイルオキシプロピオン酸エステル誘導体、及びアクリル酸エステル混合物
JP2002221796A (ja) 2001-01-26 2002-08-09 Fuji Photo Film Co Ltd ポジ型感光性樹脂組成物
JP4474246B2 (ja) 2003-09-19 2010-06-02 富士フイルム株式会社 ポジ型レジスト組成物及びそれを用いたパターン形成方法
JP4622579B2 (ja) * 2004-04-23 2011-02-02 住友化学株式会社 化学増幅型ポジ型レジスト組成物及び（メタ）アクリル酸誘導体とその製法
WO2005108343A1 (ja) 2004-05-10 2005-11-17 Idemitsu Kosan Co., Ltd. アダマンタン誘導体、その製造方法及びフォトレジスト用感光材料
JP4991326B2 (ja) * 2006-01-24 2012-08-01 富士フイルム株式会社 ポジ型感光性組成物及びそれを用いたパターン形成方法
US8034547B2 (en) 2007-04-13 2011-10-11 Fujifilm Corporation Pattern forming method, resist composition to be used in the pattern forming method, negative developing solution to be used in the pattern forming method and rinsing solution for negative development to be used in the pattern forming method
JP4982288B2 (ja) * 2007-04-13 2012-07-25 富士フイルム株式会社 パターン形成方法
JP5337579B2 (ja) * 2008-12-04 2013-11-06 東京応化工業株式会社 ポジ型レジスト組成物、レジストパターン形成方法
WO2011026036A1 (en) 2009-08-28 2011-03-03 Inova Diagnostics, Inc. Detecting circulating cartilage oligomeric matrix protein in liver cirrhosis
JPWO2011034007A1 (ja) * 2009-09-16 2013-02-14 Jsr株式会社 感放射線性樹脂組成物及びレジストパターン形成方法
JP5440468B2 (ja) * 2010-01-20 2014-03-12 信越化学工業株式会社 パターン形成方法
JP5775701B2 (ja) 2010-02-26 2015-09-09 富士フイルム株式会社 パターン形成方法及びレジスト組成物
EP2363749B1 (en) 2010-03-05 2015-08-19 Rohm and Haas Electronic Materials, L.L.C. Methods of forming photolithographic patterns
JP2011227463A (ja) * 2010-03-30 2011-11-10 Jsr Corp 感放射線性樹脂組成物およびパターン形成方法
JP5557625B2 (ja) * 2010-06-30 2014-07-23 富士フイルム株式会社 感活性光線性又は感放射線性樹脂組成物並びに該組成物を用いたレジスト膜及びパターン形成方法
JP5685919B2 (ja) * 2010-12-13 2015-03-18 Jsr株式会社 感放射線性樹脂組成物及びレジストパターン形成方法
US20130302735A1 (en) 2011-11-03 2013-11-14 Rohm And Haas Electronic Materials Llc Monomers, polymers and photoresist compositions

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011122336A1 (ja) * 2010-03-30 2011-10-06 Jsr株式会社 感放射線性樹脂組成物およびパターン形成方法

Also Published As

Publication number Publication date
US20130115559A1 (en) 2013-05-09
TW201327046A (zh) 2013-07-01
CN103091978B (zh) 2015-01-28
JP2013137513A (ja) 2013-07-11
JP6118538B2 (ja) 2017-04-19
CN103091978A (zh) 2013-05-08
US8790867B2 (en) 2014-07-29
KR20130049165A (ko) 2013-05-13
TWI477907B (zh) 2015-03-21

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