KR101906575B1 - 카메라모듈 검사장치 - Google Patents

카메라모듈 검사장치 Download PDF

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Publication number
KR101906575B1
KR101906575B1 KR1020160160670A KR20160160670A KR101906575B1 KR 101906575 B1 KR101906575 B1 KR 101906575B1 KR 1020160160670 A KR1020160160670 A KR 1020160160670A KR 20160160670 A KR20160160670 A KR 20160160670A KR 101906575 B1 KR101906575 B1 KR 101906575B1
Authority
KR
South Korea
Prior art keywords
probe
inspection
signal
signal probe
conductive block
Prior art date
Application number
KR1020160160670A
Other languages
English (en)
Korean (ko)
Other versions
KR20180060781A (ko
Inventor
김희철
Original Assignee
리노공업주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 리노공업주식회사 filed Critical 리노공업주식회사
Priority to KR1020160160670A priority Critical patent/KR101906575B1/ko
Priority to TW106126156A priority patent/TWI644110B/zh
Priority to PCT/KR2017/013411 priority patent/WO2018101674A1/en
Priority to CN201780070606.4A priority patent/CN109983769B/zh
Priority to JP2019519270A priority patent/JP6847208B2/ja
Publication of KR20180060781A publication Critical patent/KR20180060781A/ko
Application granted granted Critical
Publication of KR101906575B1 publication Critical patent/KR101906575B1/ko

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50—Constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/57—Mechanical or electrical details of cameras or camera modules specially adapted for being embedded in other devices
    • H04N5/2257—

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020160160670A 2016-11-29 2016-11-29 카메라모듈 검사장치 KR101906575B1 (ko)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR1020160160670A KR101906575B1 (ko) 2016-11-29 2016-11-29 카메라모듈 검사장치
TW106126156A TWI644110B (zh) 2016-11-29 2017-08-03 相機模組測試裝置
PCT/KR2017/013411 WO2018101674A1 (en) 2016-11-29 2017-11-23 Camera module test device
CN201780070606.4A CN109983769B (zh) 2016-11-29 2017-11-23 相机模块测试装置
JP2019519270A JP6847208B2 (ja) 2016-11-29 2017-11-23 カメラモジュール検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020160160670A KR101906575B1 (ko) 2016-11-29 2016-11-29 카메라모듈 검사장치

Publications (2)

Publication Number Publication Date
KR20180060781A KR20180060781A (ko) 2018-06-07
KR101906575B1 true KR101906575B1 (ko) 2018-10-11

Family

ID=62242517

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020160160670A KR101906575B1 (ko) 2016-11-29 2016-11-29 카메라모듈 검사장치

Country Status (5)

Country Link
JP (1) JP6847208B2 (zh)
KR (1) KR101906575B1 (zh)
CN (1) CN109983769B (zh)
TW (1) TWI644110B (zh)
WO (1) WO2018101674A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112213533A (zh) * 2019-07-10 2021-01-12 三赢科技（深圳）有限公司 针座结构及采用该针座结构的测试治具
CN115190233B (zh) * 2022-08-15 2024-05-28 维沃移动通信有限公司 摄像头模组和电子设备

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011086453A (ja) * 2009-10-14 2011-04-28 Unitechno Inc 高周波検査ソケット
KR101534778B1 (ko) * 2014-01-24 2015-07-09 리노공업주식회사 검사장치

Family Cites Families (19)

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Publication number Priority date Publication date Assignee Title
JP4707322B2 (ja) * 2002-02-07 2011-06-22 株式会社ヨコオ 容量装荷型プローブおよびそれを用いた検査治具
JP4242199B2 (ja) * 2003-04-25 2009-03-18 株式会社ヨコオ Ｉｃソケット
US20060066328A1 (en) * 2004-09-30 2006-03-30 Probelogic, Inc. Buckling beam probe test assembly
WO2006062911A1 (en) * 2004-12-08 2006-06-15 K & S Interconnect, Inc. Test socket and method for making
TWI323503B (en) * 2005-12-12 2010-04-11 Optopac Co Ltd Apparatus, unit and method for testing image sensor packages
JP2008070146A (ja) * 2006-09-12 2008-03-27 Yokowo Co Ltd 検査用ソケット
CN101221194B (zh) * 2007-01-09 2011-11-16 旺矽科技股份有限公司 高频探针
WO2009001731A1 (ja) * 2007-06-22 2008-12-31 Nhk Spring Co., Ltd. 導電性接触子ホルダおよび導電性接触子ユニット
TWI372248B (en) * 2008-08-21 2012-09-11 King Yuan Electronics Co Ltd A pogo tower and fabrication method thereof
US7740508B2 (en) * 2008-09-08 2010-06-22 3M Innovative Properties Company Probe block assembly
JP2010175371A (ja) * 2009-01-29 2010-08-12 Yokowo Co Ltd 検査ソケット
KR20100095142A (ko) * 2009-02-20 2010-08-30 리노공업주식회사 검사용 소켓
JP2010243303A (ja) * 2009-04-04 2010-10-28 Advanced Systems Japan Inc 低熱膨張インターポーザ
CN101865938A (zh) * 2009-04-14 2010-10-20 南茂科技股份有限公司 探针卡组件及其中的探针座
KR100985500B1 (ko) * 2009-08-17 2010-10-26 리노공업주식회사 검사용 소켓
JP5788767B2 (ja) * 2011-11-07 2015-10-07 株式会社日本マイクロニクス プローブブロックとそれを備えるプローブカード並びにプローブ装置
KR101703688B1 (ko) * 2012-05-02 2017-02-07 리노공업주식회사 테스트 소켓
KR101552552B1 (ko) * 2014-08-22 2015-09-14 리노공업주식회사 테스트 소켓
TWM514004U (zh) * 2015-07-30 2015-12-11 Cheng Yun Technology Co Ltd 積體電路的檢測裝置及檢測設備

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011086453A (ja) * 2009-10-14 2011-04-28 Unitechno Inc 高周波検査ソケット
KR101534778B1 (ko) * 2014-01-24 2015-07-09 리노공업주식회사 검사장치

Also Published As

Publication number Publication date
JP6847208B2 (ja) 2021-03-31
TWI644110B (zh) 2018-12-11
WO2018101674A1 (en) 2018-06-07
KR20180060781A (ko) 2018-06-07
JP2019537707A (ja) 2019-12-26
TW201819942A (zh) 2018-06-01
CN109983769A (zh) 2019-07-05
CN109983769B (zh) 2020-12-29

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