KR101762158B1 - 외관 검사 장치 - Google Patents

외관 검사 장치 Download PDF

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Publication number
KR101762158B1
KR101762158B1 KR1020127017899A KR20127017899A KR101762158B1 KR 101762158 B1 KR101762158 B1 KR 101762158B1 KR 1020127017899 A KR1020127017899 A KR 1020127017899A KR 20127017899 A KR20127017899 A KR 20127017899A KR 101762158 B1 KR101762158 B1 KR 101762158B1
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KR
South Korea
Prior art keywords
shape
image
section
inspected object
inspected
Prior art date
Application number
KR1020127017899A
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English (en)
Korean (ko)
Other versions
KR20120109547A (ko
Inventor
신야 마츠다
히로시 아오키
Original Assignee
다이이치지쯔교 비스위루 가부시키가이샤
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Application filed by 다이이치지쯔교 비스위루 가부시키가이샤 filed Critical 다이이치지쯔교 비스위루 가부시키가이샤
Publication of KR20120109547A publication Critical patent/KR20120109547A/ko
Application granted granted Critical
Publication of KR101762158B1 publication Critical patent/KR101762158B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9508—Capsules; Tablets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
KR1020127017899A 2009-12-11 2010-11-25 외관 검사 장치 KR101762158B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2009281084 2009-12-11
JPJP-P-2009-281084 2009-12-11
PCT/JP2010/070986 WO2011070914A1 (ja) 2009-12-11 2010-11-25 外観検査装置

Publications (2)

Publication Number Publication Date
KR20120109547A KR20120109547A (ko) 2012-10-08
KR101762158B1 true KR101762158B1 (ko) 2017-07-27

Family

ID=44145461

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020127017899A KR101762158B1 (ko) 2009-12-11 2010-11-25 외관 검사 장치

Country Status (4)

Country Link
JP (1) JP5654486B2 (ja)
KR (1) KR101762158B1 (ja)
CN (1) CN102713580B (ja)
WO (1) WO2011070914A1 (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6506914B2 (ja) * 2013-07-16 2019-04-24 株式会社キーエンス 三次元画像処理装置、三次元画像処理方法及び三次元画像処理プログラム並びにコンピュータで読み取り可能な記録媒体及び記録した機器
JP5457599B1 (ja) * 2013-09-12 2014-04-02 株式会社Ｗｉｎｄｙ 薬剤分包システム
JP6336735B2 (ja) * 2013-11-11 2018-06-06 第一実業ビスウィル株式会社 外観検査装置
JP6251049B2 (ja) * 2014-01-17 2017-12-20 Nok株式会社 表面形状検査装置
JP6693757B2 (ja) * 2016-01-27 2020-05-13 倉敷紡績株式会社 距離画像生成装置および方法
KR20230109104A (ko) * 2022-01-12 2023-07-19 시바우라 메카트로닉스 가부시끼가이샤 정제 검사 장치 및 정제 인쇄 장치

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3344995B2 (ja) * 2000-09-22 2002-11-18 東芝アイティー・ソリューション株式会社 錠剤表面検査装置
JP2004317126A (ja) 2003-04-10 2004-11-11 Renesas Technology Corp はんだ印刷装置
JP3640247B2 (ja) * 2002-06-21 2005-04-20 シーケーディ株式会社 錠剤の外観検査装置及びｐｔｐ包装機
JP6093776B2 (ja) 2011-11-29 2017-03-08 ゼネラル エレクトリック テクノロジー ゲゼルシャフト ミット ベシュレンクテル ハフツングＧｅｎｅｒａｌ Ｅｌｅｃｔｒｉｃ Ｔｅｃｈｎｏｌｏｇｙ ＧｍｂＨ 電気集塵装置のクリーニングのための方法および装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60200103A (ja) * 1984-03-26 1985-10-09 Hitachi Ltd 光切断線抽出回路
JPS61290311A (ja) * 1985-06-19 1986-12-20 Hitachi Ltd はんだ付部の検査装置及びその方法
CN1260876A (zh) * 1997-06-17 2000-07-19 株式会社之技术综合 片材包装检查装置
JP2004061196A (ja) * 2002-07-26 2004-02-26 Toei Denki Kogyo Kk ２次元レーザ変位センサによる起伏形状検査装置
JP4166587B2 (ja) * 2003-01-24 2008-10-15 株式会社サキコーポレーション 外観検査装置および体積検査方法
JP4278536B2 (ja) * 2004-02-27 2009-06-17 サンクス株式会社 表面形状検出器
CN101082562B (zh) * 2007-06-28 2010-12-29 中国科学院安徽光学精密机械研究所 基于图像监测微颗粒形状与散射的装置
JP5025442B2 (ja) * 2007-12-10 2012-09-12 株式会社ブリヂストン タイヤ形状検査方法とその装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3344995B2 (ja) * 2000-09-22 2002-11-18 東芝アイティー・ソリューション株式会社 錠剤表面検査装置
JP3640247B2 (ja) * 2002-06-21 2005-04-20 シーケーディ株式会社 錠剤の外観検査装置及びｐｔｐ包装機
JP2004317126A (ja) 2003-04-10 2004-11-11 Renesas Technology Corp はんだ印刷装置
JP6093776B2 (ja) 2011-11-29 2017-03-08 ゼネラル エレクトリック テクノロジー ゲゼルシャフト ミット ベシュレンクテル ハフツングＧｅｎｅｒａｌ Ｅｌｅｃｔｒｉｃ Ｔｅｃｈｎｏｌｏｇｙ ＧｍｂＨ 電気集塵装置のクリーニングのための方法および装置

Also Published As

Publication number Publication date
CN102713580B (zh) 2014-11-12
WO2011070914A1 (ja) 2011-06-16
CN102713580A (zh) 2012-10-03
JP5654486B2 (ja) 2015-01-14
KR20120109547A (ko) 2012-10-08
JPWO2011070914A1 (ja) 2013-04-22

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