KR101326992B1 - 기판 처리 장치 - Google Patents
기판 처리 장치 Download PDFInfo
- Publication number
- KR101326992B1 KR101326992B1 KR1020110058552A KR20110058552A KR101326992B1 KR 101326992 B1 KR101326992 B1 KR 101326992B1 KR 1020110058552 A KR1020110058552 A KR 1020110058552A KR 20110058552 A KR20110058552 A KR 20110058552A KR 101326992 B1 KR101326992 B1 KR 101326992B1
- Authority
- KR
- South Korea
- Prior art keywords
- chamber
- guide rail
- lid
- cover
- vacuum
- Prior art date
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67196—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the transfer chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67201—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67745—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2010-144125 | 2010-06-24 | ||
JP2010144125A JP5585238B2 (ja) | 2010-06-24 | 2010-06-24 | 基板処理装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20110140084A KR20110140084A (ko) | 2011-12-30 |
KR101326992B1 true KR101326992B1 (ko) | 2013-11-13 |
Family
ID=45359373
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020110058552A KR101326992B1 (ko) | 2010-06-24 | 2011-06-16 | 기판 처리 장치 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP5585238B2 (zh) |
KR (1) | KR101326992B1 (zh) |
CN (1) | CN102299046B (zh) |
TW (1) | TW201205711A (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5575558B2 (ja) * | 2010-06-30 | 2014-08-20 | 東京エレクトロン株式会社 | 処理装置 |
JP6596372B2 (ja) * | 2016-03-22 | 2019-10-23 | 株式会社荏原製作所 | 基板ホルダ及びめっき装置 |
WO2018008113A1 (ja) * | 2016-07-06 | 2018-01-11 | 富士機械製造株式会社 | 回路形成装置 |
JP7090469B2 (ja) * | 2018-05-15 | 2022-06-24 | 東京エレクトロン株式会社 | 基板処理装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6565662B2 (en) | 1999-12-22 | 2003-05-20 | Tokyo Electron Limited | Vacuum processing apparatus for semiconductor process |
KR20060025214A (ko) * | 2003-05-30 | 2006-03-20 | 동경 엘렉트론 주식회사 | 진공 처리실의 덮개 개폐 기구 및 덮개 개폐 방법 |
KR20080080923A (ko) * | 2007-03-02 | 2008-09-05 | 에이에스엠 저펜 가부시기가이샤 | 클러스터형 반도체 처리 장치 |
KR20090111585A (ko) * | 2008-04-22 | 2009-10-27 | 주식회사 에이디피엔지니어링 | 기판처리장치 및 기판처리장치 내부의 공정공간을 개폐하는방법 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0745684A (ja) * | 1993-07-27 | 1995-02-14 | Kokusai Electric Co Ltd | 半導体製造装置の処理室 |
JP3694388B2 (ja) * | 1997-05-26 | 2005-09-14 | 株式会社日立国際電気 | 半導体製造装置 |
JPH1140643A (ja) * | 1997-07-22 | 1999-02-12 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
JP2000021946A (ja) * | 1998-06-29 | 2000-01-21 | C Bui Res:Kk | 半導体製造装置 |
US7211461B2 (en) * | 2003-02-14 | 2007-05-01 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing apparatus |
JP4285642B2 (ja) * | 2003-08-12 | 2009-06-24 | 東京エレクトロン株式会社 | 真空容器 |
KR20050086265A (ko) * | 2004-02-25 | 2005-08-30 | 주식회사 에이디피엔지니어링 | 분리형 진공챔버 |
KR100661752B1 (ko) * | 2005-02-04 | 2006-12-27 | 주식회사 에이디피엔지니어링 | 운반용 호이스트 지그 |
JP4642608B2 (ja) * | 2005-08-31 | 2011-03-02 | 東京エレクトロン株式会社 | 基板処理装置および基板処理システム |
JP4355314B2 (ja) * | 2005-12-14 | 2009-10-28 | 東京エレクトロン株式会社 | 基板処理装置、及び該装置の蓋釣支装置 |
KR101446225B1 (ko) * | 2008-07-11 | 2014-10-01 | 주식회사 원익아이피에스 | 진공처리시스템의 반송챔버 |
JP5526988B2 (ja) * | 2010-04-28 | 2014-06-18 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理システム |
JP5488227B2 (ja) * | 2010-06-07 | 2014-05-14 | 東京エレクトロン株式会社 | 基板処理装置 |
-
2010
- 2010-06-24 JP JP2010144125A patent/JP5585238B2/ja not_active Expired - Fee Related
-
2011
- 2011-06-16 KR KR1020110058552A patent/KR101326992B1/ko not_active IP Right Cessation
- 2011-06-22 CN CN201110177543.7A patent/CN102299046B/zh not_active Expired - Fee Related
- 2011-06-23 TW TW100121991A patent/TW201205711A/zh unknown
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6565662B2 (en) | 1999-12-22 | 2003-05-20 | Tokyo Electron Limited | Vacuum processing apparatus for semiconductor process |
KR20060025214A (ko) * | 2003-05-30 | 2006-03-20 | 동경 엘렉트론 주식회사 | 진공 처리실의 덮개 개폐 기구 및 덮개 개폐 방법 |
KR20080080923A (ko) * | 2007-03-02 | 2008-09-05 | 에이에스엠 저펜 가부시기가이샤 | 클러스터형 반도체 처리 장치 |
KR20090111585A (ko) * | 2008-04-22 | 2009-10-27 | 주식회사 에이디피엔지니어링 | 기판처리장치 및 기판처리장치 내부의 공정공간을 개폐하는방법 |
Also Published As
Publication number | Publication date |
---|---|
KR20110140084A (ko) | 2011-12-30 |
TW201205711A (en) | 2012-02-01 |
CN102299046A (zh) | 2011-12-28 |
CN102299046B (zh) | 2014-07-30 |
JP2012009620A (ja) | 2012-01-12 |
JP5585238B2 (ja) | 2014-09-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
LAPS | Lapse due to unpaid annual fee |