KR101101848B1 - 터치패널 검사장치 - Google Patents

터치패널 검사장치 Download PDF

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Publication number
KR101101848B1
KR101101848B1 KR1020100044810A KR20100044810A KR101101848B1 KR 101101848 B1 KR101101848 B1 KR 101101848B1 KR 1020100044810 A KR1020100044810 A KR 1020100044810A KR 20100044810 A KR20100044810 A KR 20100044810A KR 101101848 B1 KR101101848 B1 KR 101101848B1
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KR
South Korea
Prior art keywords
inspection
signal
axis
supply means
wiring
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KR1020100044810A
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English (en)
Korean (ko)
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KR20100123627A (ko
Inventor
무네히로 야마시타
Original Assignee
니혼덴산리드가부시키가이샤
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Application filed by 니혼덴산리드가부시키가이샤 filed Critical 니혼덴산리드가부시키가이샤
Publication of KR20100123627A publication Critical patent/KR20100123627A/ko
Application granted granted Critical
Publication of KR101101848B1 publication Critical patent/KR101101848B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
KR1020100044810A 2009-05-14 2010-05-13 터치패널 검사장치 KR101101848B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2009-118085 2009-05-14
JP2009118085A JP5391819B2 (ja) 2009-05-14 2009-05-14 タッチパネル検査装置

Publications (2)

Publication Number Publication Date
KR20100123627A KR20100123627A (ko) 2010-11-24
KR101101848B1 true KR101101848B1 (ko) 2012-01-05

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020100044810A KR101101848B1 (ko) 2009-05-14 2010-05-13 터치패널 검사장치

Country Status (4)

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JP (1) JP5391819B2 (ja)
KR (1) KR101101848B1 (ja)
CN (1) CN101887098B (ja)
TW (1) TWI396852B (ja)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011121862A1 (ja) * 2010-03-29 2011-10-06 株式会社アイテス 静電容量式タッチパネルの検査装置、及び検査方法
JP2012238066A (ja) * 2011-05-10 2012-12-06 Japan Display East Co Ltd 静電容量方式のタッチパネル、および表示装置
KR101282469B1 (ko) 2011-06-01 2013-07-04 삼성디스플레이 주식회사 터치 스크린 패널
KR101292147B1 (ko) * 2011-09-20 2013-08-09 네오뷰코오롱 주식회사 터치패널의 불량검사 방법 및 이를 이용한 터치패널 제조방법
KR101233070B1 (ko) * 2011-09-30 2013-02-25 마이크로 인스펙션 주식회사 비접촉 프로브
JP5899961B2 (ja) * 2012-01-24 2016-04-06 日本電産リード株式会社 絶縁検査装置及び絶縁検査方法
JP2013210247A (ja) * 2012-03-30 2013-10-10 Nidec-Read Corp 絶縁検査装置及び絶縁検査方法
JP5964152B2 (ja) * 2012-06-22 2016-08-03 株式会社東海理化電機製作所 静電容量検出装置
CN102955097A (zh) * 2012-10-26 2013-03-06 京东方科技集团股份有限公司 一种阵列基板检测方法、检测装置及检测系统
KR101959048B1 (ko) * 2012-11-05 2019-03-18 엘지디스플레이 주식회사 터치 패널의 불량 검사 방법과 검사 장치
KR101366037B1 (ko) * 2013-02-18 2014-02-24 (주)제이디 터치 스크린 패널의 검사방법 및 검사장치
WO2014208129A1 (ja) * 2013-06-28 2014-12-31 シャープ株式会社 タッチパネル用電極基板の検査方法
TWI510914B (zh) * 2013-11-19 2015-12-01 Henghao Technology Co Ltd 觸控面板及其測試裝置
JP6569506B2 (ja) * 2015-02-09 2019-09-04 日本電産リード株式会社 接続検査装置
CN105866606B (zh) * 2015-02-09 2020-07-31 日本电产理德股份有限公司 连接检查装置
CN110672948B (zh) 2019-09-29 2021-04-20 云谷（固安）科技有限公司 触控面板检测设备和系统
CN116235021A (zh) 2020-10-08 2023-06-06 阿尔卑斯阿尔派株式会社 静电容检测装置以及输入装置

Citations (1)

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Publication number Priority date Publication date Assignee Title
KR20070083501A (ko) * 2004-08-27 2007-08-24 오에이치티 가부시끼가이샤 검사 장치 및 검사 방법 및 검사 장치용 센서

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US5517110A (en) * 1995-04-06 1996-05-14 Yentec Inc. Contactless test method and system for testing printed circuit boards
JP4562358B2 (ja) * 2003-07-04 2010-10-13 株式会社ユニオンアロー・テクノロジー 導電パターン検査装置
JP2005274225A (ja) * 2004-03-23 2005-10-06 Kawaguchiko Seimitsu Co Ltd タッチパネル検査装置
JP4417858B2 (ja) * 2005-01-19 2010-02-17 オー・エイチ・ティー株式会社 回路パターン検査装置およびその方法
CN2777563Y (zh) * 2005-02-07 2006-05-03 梁文豪 三测头双台面可定位的触控面板测试机
US7714589B2 (en) * 2005-11-15 2010-05-11 Photon Dynamics, Inc. Array test using the shorting bar and high frequency clock signal for the inspection of TFT-LCD with integrated driver IC
JP4730904B2 (ja) * 2006-04-28 2011-07-20 日本電産リード株式会社 基板検査装置及び基板検査方法
KR100799161B1 (ko) * 2006-07-20 2008-01-29 마이크로 인스펙션 주식회사 비접촉 싱글사이드 프로브와 이를 이용한 패턴전극의 단선및 단락 검사장치 및 그 방법
JP4825083B2 (ja) * 2006-08-28 2011-11-30 株式会社アドテックエンジニアリング なぞり式回路基板検査装置
JP4291843B2 (ja) * 2006-10-19 2009-07-08 株式会社東京カソード研究所 パターン検査装置
JP4998919B2 (ja) * 2007-06-14 2012-08-15 ソニーモバイルディスプレイ株式会社 静電容量型入力装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20070083501A (ko) * 2004-08-27 2007-08-24 오에이치티 가부시끼가이샤 검사 장치 및 검사 방법 및 검사 장치용 센서

Also Published As

Publication number Publication date
KR20100123627A (ko) 2010-11-24
CN101887098B (zh) 2013-11-13
CN101887098A (zh) 2010-11-17
JP2010266338A (ja) 2010-11-25
TWI396852B (zh) 2013-05-21
JP5391819B2 (ja) 2014-01-15
TW201040552A (en) 2010-11-16

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