KR100788733B1 - 편광필름 검사장치 및 방법 - Google Patents

편광필름 검사장치 및 방법 Download PDF

Info

Publication number
KR100788733B1
KR100788733B1 KR1020050117594A KR20050117594A KR100788733B1 KR 100788733 B1 KR100788733 B1 KR 100788733B1 KR 1020050117594 A KR1020050117594 A KR 1020050117594A KR 20050117594 A KR20050117594 A KR 20050117594A KR 100788733 B1 KR100788733 B1 KR 100788733B1
Authority
KR
South Korea
Prior art keywords
polarizing film
carrier
loading
inspection
unloading
Prior art date
Application number
KR1020050117594A
Other languages
English (en)
Korean (ko)
Other versions
KR20070058829A (ko
Inventor
장민석
Original Assignee
에버테크노 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 에버테크노 주식회사 filed Critical 에버테크노 주식회사
Priority to KR1020050117594A priority Critical patent/KR100788733B1/ko
Priority to TW095144948A priority patent/TWI312062B/zh
Priority to CNB2006101618844A priority patent/CN100462777C/zh
Priority to JP2006328454A priority patent/JP4522986B2/ja
Publication of KR20070058829A publication Critical patent/KR20070058829A/ko
Application granted granted Critical
Publication of KR100788733B1 publication Critical patent/KR100788733B1/ko

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nonlinear Science (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Textile Engineering (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Polarising Elements (AREA)
  • Liquid Crystal (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
KR1020050117594A 2005-12-05 2005-12-05 편광필름 검사장치 및 방법 KR100788733B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020050117594A KR100788733B1 (ko) 2005-12-05 2005-12-05 편광필름 검사장치 및 방법
TW095144948A TWI312062B (en) 2005-12-05 2006-12-04 Apparatus and method for inspecting polarizing film
CNB2006101618844A CN100462777C (zh) 2005-12-05 2006-12-05 偏振光膜检查装置及方法
JP2006328454A JP4522986B2 (ja) 2005-12-05 2006-12-05 偏光フィルム検査装置及び方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050117594A KR100788733B1 (ko) 2005-12-05 2005-12-05 편광필름 검사장치 및 방법

Publications (2)

Publication Number Publication Date
KR20070058829A KR20070058829A (ko) 2007-06-11
KR100788733B1 true KR100788733B1 (ko) 2007-12-26

Family

ID=38130484

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020050117594A KR100788733B1 (ko) 2005-12-05 2005-12-05 편광필름 검사장치 및 방법

Country Status (4)

Country Link
JP (1) JP4522986B2 (ja)
KR (1) KR100788733B1 (ja)
CN (1) CN100462777C (ja)
TW (1) TWI312062B (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102564352A (zh) * 2010-12-31 2012-07-11 北京国科世纪激光技术有限公司 偏振分光棱镜镀膜面角度测量装置和测量方法
KR102298108B1 (ko) * 2020-11-27 2021-09-03 주식회사 머신앤비전 글라스 기판의 복합 검사 장치
KR102298110B1 (ko) * 2020-12-08 2021-09-03 주식회사 머신앤비전 난반사 개선형 글라스 기판 비전 검사 장치

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100804033B1 (ko) * 2007-10-04 2008-02-18 주식회사 쓰리비 시스템 광학 필름 검사장치
KR101448556B1 (ko) * 2014-05-16 2014-10-14 에스맥 (주) 전도성 필름의 인쇄 배선 경도 시험기
JP6774176B2 (ja) * 2015-11-05 2020-10-21 日東電工株式会社 シートの検査装置及び検査方法
CN105629535B (zh) * 2016-03-22 2019-01-15 深圳市华星光电技术有限公司 贴片检测系统
CN107490578B (zh) * 2016-06-12 2020-10-09 英泰克普拉斯有限公司 半导体元件检查装置
CN108387518A (zh) * 2018-03-22 2018-08-10 南京图思灵智能科技有限责任公司 无托盘架升降装置的切片装卸系统和病理切片扫描仪
CN108254316A (zh) * 2018-03-22 2018-07-06 南京图思灵智能科技有限责任公司 一种抽屉式切片装卸系统和病理切片扫描仪
CN108226041A (zh) * 2018-03-22 2018-06-29 南京图思灵智能科技有限责任公司 设有支撑组件的切片装卸系统和病理切片扫描仪
CN108189068A (zh) * 2018-03-22 2018-06-22 南京图思灵智能科技有限责任公司 一种切片装卸系统和病理切片扫描仪
CN108152208A (zh) * 2018-03-22 2018-06-12 南京图思灵智能科技有限责任公司 设有水平引导臂的切片装卸系统和病理切片扫描仪
CN114355640A (zh) * 2021-12-31 2022-04-15 深圳市深科达智能装备股份有限公司 偏光片贴合检测设备、系统及方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0560832A (ja) * 1991-09-02 1993-03-12 Advantest Corp Ｉｃ試験装置
JPH1179389A (ja) 1997-09-16 1999-03-23 Mitsui Eng & Shipbuild Co Ltd 基板ガラス検査加工システム
JP2002196038A (ja) 2000-12-25 2002-07-10 Ando Electric Co Ltd オートハンドラ
KR20050096715A (ko) * 2004-03-31 2005-10-06 주식회사 디이엔티 평판 디스플레이 검사장치

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07104947B2 (ja) * 1988-11-30 1995-11-13 東芝機械株式会社 二次元配列物体の検査装置
JPH0644612A (ja) * 1991-07-04 1994-02-18 Nec Home Electron Ltd ディスク形状物体の欠陥検査装置
JP3368512B2 (ja) * 1994-08-12 2003-01-20 住友化学工業株式会社 透明シート状成形体の欠陥検査方法
JPH08189903A (ja) * 1995-01-10 1996-07-23 Sekisui Chem Co Ltd 気泡検査装置
JP3677885B2 (ja) * 1996-08-26 2005-08-03 住友化学株式会社 シート状物の欠陥検査装置
JP2001056270A (ja) * 1999-08-18 2001-02-27 Sumitomo Chem Co Ltd 直線偏光板の検査方法及び直線偏光板の検査装置
JP2003344302A (ja) * 2002-05-31 2003-12-03 Sumitomo Chem Co Ltd 偏光フィルムの検査法および検査装置
JP2004198163A (ja) * 2002-12-17 2004-07-15 Sumitomo Chem Co Ltd 保護フィルム粘着偏光板の欠陥検査方法
CN1677140A (zh) * 2004-03-30 2005-10-05 力特光电科技股份有限公司 偏光板检测装置及方法
JP2006300913A (ja) * 2005-04-20 2006-11-02 Selcon Technologies Inc 導光板外観検査装置
KR100670977B1 (ko) * 2005-05-11 2007-01-17 에버테크노 주식회사 편광필름 캐리어

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0560832A (ja) * 1991-09-02 1993-03-12 Advantest Corp Ｉｃ試験装置
JPH1179389A (ja) 1997-09-16 1999-03-23 Mitsui Eng & Shipbuild Co Ltd 基板ガラス検査加工システム
JP2002196038A (ja) 2000-12-25 2002-07-10 Ando Electric Co Ltd オートハンドラ
KR20050096715A (ko) * 2004-03-31 2005-10-06 주식회사 디이엔티 평판 디스플레이 검사장치

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102564352A (zh) * 2010-12-31 2012-07-11 北京国科世纪激光技术有限公司 偏振分光棱镜镀膜面角度测量装置和测量方法
KR102298108B1 (ko) * 2020-11-27 2021-09-03 주식회사 머신앤비전 글라스 기판의 복합 검사 장치
KR102298110B1 (ko) * 2020-12-08 2021-09-03 주식회사 머신앤비전 난반사 개선형 글라스 기판 비전 검사 장치

Also Published As

Publication number Publication date
JP4522986B2 (ja) 2010-08-11
JP2007155736A (ja) 2007-06-21
CN1979261A (zh) 2007-06-13
CN100462777C (zh) 2009-02-18
TW200732643A (en) 2007-09-01
TWI312062B (en) 2009-07-11
KR20070058829A (ko) 2007-06-11

Similar Documents

Publication Publication Date Title
KR100788733B1 (ko) 편광필름 검사장치 및 방법
KR100789659B1 (ko) 편광필름 검사장치 및 방법
KR101146722B1 (ko) 디스플레이용 패널의 검사장치
KR100670977B1 (ko) 편광필름 캐리어
JP4463797B2 (ja) 偏光フィルム検査装置及び方法
KR101032089B1 (ko) 기판검사장치
KR20130006221A (ko) 디스플레이 패널 검사장치
KR101807195B1 (ko) 어레이 테스트 장치
JP2010014552A (ja) アレイテスト装備
JP4243837B2 (ja) 透明基板の表面検査方法及び検査装置
CN111220623B (zh) 基板检测装置及基板检测方法
KR100813291B1 (ko) 기판의 검사 및 수리 장치
KR101590454B1 (ko) 발광 소자 패키지 모듈용 렌즈 편심 검사 장치
KR20180099390A (ko) 소자검사시스템
KR100797571B1 (ko) 복합 검사기
CN210128944U (zh) 基板表面检测装置
CN106645206B (zh) 一种双龙门式带材表面质量检测装置的成像系统
KR102147128B1 (ko) 기판 검사 장치
KR102571054B1 (ko) 패널 합착 장치 및 방법
KR102634944B1 (ko) 기판 표면 검사 장치 및 방법
KR101041537B1 (ko) 반도체 소자 영상 검사 시스템의 반도체 소자 고정용 디바이스 클램핑 장치
KR102612272B1 (ko) 프로브 모듈 및 이를 포함하는 어레이 테스트 장치
KR20200062416A (ko) 기판 검사 장치
KR20120081889A (ko) 탭 구조물 검사 장치

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20120118

Year of fee payment: 5

LAPS Lapse due to unpaid annual fee