KR100661937B1 - 집적된 커패시터를 갖는 전자 패키지 - Google Patents
집적된 커패시터를 갖는 전자 패키지 Download PDFInfo
- Publication number
- KR100661937B1 KR100661937B1 KR1020027009502A KR20027009502A KR100661937B1 KR 100661937 B1 KR100661937 B1 KR 100661937B1 KR 1020027009502 A KR1020027009502 A KR 1020027009502A KR 20027009502 A KR20027009502 A KR 20027009502A KR 100661937 B1 KR100661937 B1 KR 100661937B1
- Authority
- KR
- South Korea
- Prior art keywords
- capacitor
- layer
- interconnect
- conductive
- conductive layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49838—Geometry or layout
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- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
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- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49833—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers the chip support structure consisting of a plurality of insulating substrates
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- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Geometry (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Semiconductor Integrated Circuits (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/491,302 | 2000-01-25 | ||
| US09/491,302 US7064412B2 (en) | 2000-01-25 | 2000-01-25 | Electronic package with integrated capacitor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20020069020A KR20020069020A (ko) | 2002-08-28 |
| KR100661937B1 true KR100661937B1 (ko) | 2006-12-28 |
Family
ID=23951623
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020027009502A Expired - Fee Related KR100661937B1 (ko) | 2000-01-25 | 2000-05-25 | 집적된 커패시터를 갖는 전자 패키지 |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US7064412B2 (enExample) |
| EP (1) | EP1250709B1 (enExample) |
| JP (1) | JP4878100B2 (enExample) |
| KR (1) | KR100661937B1 (enExample) |
| AT (1) | ATE345576T1 (enExample) |
| AU (1) | AU2000252898A1 (enExample) |
| DE (1) | DE60031887T2 (enExample) |
| HK (1) | HK1051087B (enExample) |
| WO (1) | WO2001056054A1 (enExample) |
Families Citing this family (54)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7064412B2 (en) * | 2000-01-25 | 2006-06-20 | 3M Innovative Properties Company | Electronic package with integrated capacitor |
| US7356952B2 (en) | 2002-06-17 | 2008-04-15 | Philip Morris Usa Inc. | System for coupling package displays to remote power source |
| US7055119B2 (en) * | 2003-07-31 | 2006-05-30 | International Business Machines Corporation | Customized mesh plane, method and computer program product for creating customized mesh planes within electronic packages |
| CN100468612C (zh) * | 2004-03-25 | 2009-03-11 | 株式会社东芝 | 半导体器件及其制造方法 |
| US20070177331A1 (en) * | 2005-01-10 | 2007-08-02 | Endicott Interconnect Technologies, Inc. | Non-flaking capacitor material, capacitive substrate having an internal capacitor therein including said non-flaking capacitor material, and method of making a capacitor member for use in a capacitive substrate |
| US8607445B1 (en) | 2005-01-10 | 2013-12-17 | Endicott Interconnect Technologies, Inc. | Substrate having internal capacitor and method of making same |
| US7772974B2 (en) * | 2005-02-28 | 2010-08-10 | Cypak Ab | Tamper evident seal system and method |
| JP4659488B2 (ja) * | 2005-03-02 | 2011-03-30 | Okiセミコンダクタ株式会社 | 半導体装置及びその製造方法 |
| JP4621049B2 (ja) * | 2005-03-25 | 2011-01-26 | 富士通株式会社 | 配線基板の製造方法 |
| US20060213957A1 (en) * | 2005-03-26 | 2006-09-28 | Addington Cary G | Conductive trace formation via wicking action |
| US7731085B2 (en) * | 2006-07-10 | 2010-06-08 | The Procter + Gamble Company | Product display |
| US20080006552A1 (en) * | 2006-07-10 | 2008-01-10 | The Procter & Gamble Company | Pallet display assembly |
| US9730078B2 (en) * | 2007-08-31 | 2017-08-08 | Fisher-Rosemount Systems, Inc. | Configuring and optimizing a wireless mesh network |
| WO2010138493A1 (en) | 2009-05-28 | 2010-12-02 | Hsio Technologies, Llc | High performance surface mount electrical interconnect |
| WO2011139619A1 (en) | 2010-04-26 | 2011-11-10 | Hsio Technologies, Llc | Semiconductor device package adapter |
| US9276336B2 (en) | 2009-05-28 | 2016-03-01 | Hsio Technologies, Llc | Metalized pad to electrical contact interface |
| US9536815B2 (en) | 2009-05-28 | 2017-01-03 | Hsio Technologies, Llc | Semiconductor socket with direct selective metalization |
| WO2012078493A1 (en) | 2010-12-06 | 2012-06-14 | Hsio Technologies, Llc | Electrical interconnect ic device socket |
| WO2013036565A1 (en) | 2011-09-08 | 2013-03-14 | Hsio Technologies, Llc | Direct metalization of electrical circuit structures |
| WO2010147934A1 (en) | 2009-06-16 | 2010-12-23 | Hsio Technologies, Llc | Semiconductor die terminal |
| US9414500B2 (en) | 2009-06-02 | 2016-08-09 | Hsio Technologies, Llc | Compliant printed flexible circuit |
| US9054097B2 (en) | 2009-06-02 | 2015-06-09 | Hsio Technologies, Llc | Compliant printed circuit area array semiconductor device package |
| US8988093B2 (en) | 2009-06-02 | 2015-03-24 | Hsio Technologies, Llc | Bumped semiconductor wafer or die level electrical interconnect |
| WO2012061008A1 (en) | 2010-10-25 | 2012-05-10 | Hsio Technologies, Llc | High performance electrical circuit structure |
| WO2010141313A1 (en) | 2009-06-02 | 2010-12-09 | Hsio Technologies, Llc | Compliant printed circuit socket diagnostic tool |
| WO2010141303A1 (en) | 2009-06-02 | 2010-12-09 | Hsio Technologies, Llc | Resilient conductive electrical interconnect |
| WO2010141266A1 (en) | 2009-06-02 | 2010-12-09 | Hsio Technologies, Llc | Compliant printed circuit peripheral lead semiconductor package |
| US9699906B2 (en) | 2009-06-02 | 2017-07-04 | Hsio Technologies, Llc | Hybrid printed circuit assembly with low density main core and embedded high density circuit regions |
| WO2010141298A1 (en) | 2009-06-02 | 2010-12-09 | Hsio Technologies, Llc | Composite polymer-metal electrical contacts |
| WO2011002709A1 (en) | 2009-06-29 | 2011-01-06 | Hsio Technologies, Llc | Compliant printed circuit semiconductor tester interface |
| US9184527B2 (en) | 2009-06-02 | 2015-11-10 | Hsio Technologies, Llc | Electrical connector insulator housing |
| US9318862B2 (en) | 2009-06-02 | 2016-04-19 | Hsio Technologies, Llc | Method of making an electronic interconnect |
| US9930775B2 (en) | 2009-06-02 | 2018-03-27 | Hsio Technologies, Llc | Copper pillar full metal via electrical circuit structure |
| US9276339B2 (en) | 2009-06-02 | 2016-03-01 | Hsio Technologies, Llc | Electrical interconnect IC device socket |
| US8618649B2 (en) | 2009-06-02 | 2013-12-31 | Hsio Technologies, Llc | Compliant printed circuit semiconductor package |
| WO2010141316A1 (en) | 2009-06-02 | 2010-12-09 | Hsio Technologies, Llc | Compliant printed circuit wafer probe diagnostic tool |
| US9093767B2 (en) | 2009-06-02 | 2015-07-28 | Hsio Technologies, Llc | High performance surface mount electrical interconnect |
| WO2011002712A1 (en) | 2009-06-29 | 2011-01-06 | Hsio Technologies, Llc | Singulated semiconductor device separable electrical interconnect |
| US9136196B2 (en) | 2009-06-02 | 2015-09-15 | Hsio Technologies, Llc | Compliant printed circuit wafer level semiconductor package |
| US9196980B2 (en) | 2009-06-02 | 2015-11-24 | Hsio Technologies, Llc | High performance surface mount electrical interconnect with external biased normal force loading |
| US9613841B2 (en) | 2009-06-02 | 2017-04-04 | Hsio Technologies, Llc | Area array semiconductor device package interconnect structure with optional package-to-package or flexible circuit to package connection |
| US8981568B2 (en) | 2009-06-16 | 2015-03-17 | Hsio Technologies, Llc | Simulated wirebond semiconductor package |
| US9320144B2 (en) * | 2009-06-17 | 2016-04-19 | Hsio Technologies, Llc | Method of forming a semiconductor socket |
| US9689897B2 (en) | 2010-06-03 | 2017-06-27 | Hsio Technologies, Llc | Performance enhanced semiconductor socket |
| US10159154B2 (en) | 2010-06-03 | 2018-12-18 | Hsio Technologies, Llc | Fusion bonded liquid crystal polymer circuit structure |
| US9350093B2 (en) | 2010-06-03 | 2016-05-24 | Hsio Technologies, Llc | Selective metalization of electrical connector or socket housing |
| US8583850B2 (en) | 2011-02-14 | 2013-11-12 | Oracle America, Inc. | Micro crossbar switch and on-die data network using the same |
| US9761520B2 (en) | 2012-07-10 | 2017-09-12 | Hsio Technologies, Llc | Method of making an electrical connector having electrodeposited terminals |
| US9552977B2 (en) * | 2012-12-10 | 2017-01-24 | Intel Corporation | Landside stiffening capacitors to enable ultrathin and other low-Z products |
| US10506722B2 (en) | 2013-07-11 | 2019-12-10 | Hsio Technologies, Llc | Fusion bonded liquid crystal polymer electrical circuit structure |
| US10667410B2 (en) | 2013-07-11 | 2020-05-26 | Hsio Technologies, Llc | Method of making a fusion bonded circuit structure |
| US10312731B2 (en) | 2014-04-24 | 2019-06-04 | Westrock Shared Services, Llc | Powered shelf system for inductively powering electrical components of consumer product packages |
| US9755335B2 (en) | 2015-03-18 | 2017-09-05 | Hsio Technologies, Llc | Low profile electrical interconnect with fusion bonded contact retention and solder wick reduction |
| KR102777475B1 (ko) * | 2019-10-17 | 2025-03-10 | 에스케이하이닉스 주식회사 | 반도체 패키지 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3780352A (en) | 1968-06-25 | 1973-12-18 | J Redwanz | Semiconductor interconnecting system using conductive patterns bonded to thin flexible insulating films |
| US4945399A (en) | 1986-09-30 | 1990-07-31 | International Business Machines Corporation | Electronic package with integrated distributed decoupling capacitors |
| FR2621173B1 (fr) | 1987-09-29 | 1989-12-08 | Bull Sa | Boitier pour circuit integre de haute densite |
| JP2592308B2 (ja) | 1988-09-30 | 1997-03-19 | 株式会社日立製作所 | 半導体パッケージ及びそれを用いたコンピュータ |
| US5027253A (en) | 1990-04-09 | 1991-06-25 | Ibm Corporation | Printed circuit boards and cards having buried thin film capacitors and processing techniques for fabricating said boards and cards |
| JPH0470818A (ja) * | 1990-07-12 | 1992-03-05 | Fujitsu Ltd | 高誘電性膜及びその形成方法並びにその高誘電性膜を用いた液晶表示パネル |
| US5212402A (en) | 1992-02-14 | 1993-05-18 | Motorola, Inc. | Semiconductor device with integral decoupling capacitor |
| JP2962951B2 (ja) * | 1992-11-19 | 1999-10-12 | 京セラ株式会社 | 半導体素子収納用パッケージ |
| US5455390A (en) * | 1994-02-01 | 1995-10-03 | Tessera, Inc. | Microelectronics unit mounting with multiple lead bonding |
| US5639989A (en) * | 1994-04-19 | 1997-06-17 | Motorola Inc. | Shielded electronic component assembly and method for making the same |
| US5633785A (en) * | 1994-12-30 | 1997-05-27 | University Of Southern California | Integrated circuit component package with integral passive component |
| JP3245329B2 (ja) * | 1995-06-19 | 2002-01-15 | 京セラ株式会社 | 半導体素子収納用パッケージ |
| US5844168A (en) * | 1995-08-01 | 1998-12-01 | Minnesota Mining And Manufacturing Company | Multi-layer interconnect sutructure for ball grid arrays |
| JP3340003B2 (ja) * | 1995-11-20 | 2002-10-28 | 京セラ株式会社 | 多層配線基板及び半導体素子収納用パッケージ |
| US5841193A (en) * | 1996-05-20 | 1998-11-24 | Epic Technologies, Inc. | Single chip modules, repairable multichip modules, and methods of fabrication thereof |
| KR100277314B1 (ko) * | 1996-11-08 | 2001-01-15 | 모기 쥰이찌 | 박막콘덴서 및 이를탑재한반도체장치 |
| JP3199664B2 (ja) * | 1997-06-30 | 2001-08-20 | 京セラ株式会社 | 多層配線基板の製造方法 |
| US6068782A (en) * | 1998-02-11 | 2000-05-30 | Ormet Corporation | Individual embedded capacitors for laminated printed circuit boards |
| EP1123565B1 (en) * | 1998-10-02 | 2011-08-17 | Raytheon Company | Embedded capacitor multi-chip modules |
| US7064412B2 (en) * | 2000-01-25 | 2006-06-20 | 3M Innovative Properties Company | Electronic package with integrated capacitor |
-
2000
- 2000-01-25 US US09/491,302 patent/US7064412B2/en not_active Expired - Fee Related
- 2000-05-25 WO PCT/US2000/014414 patent/WO2001056054A1/en not_active Ceased
- 2000-05-25 HK HK03101835.4A patent/HK1051087B/en not_active IP Right Cessation
- 2000-05-25 DE DE60031887T patent/DE60031887T2/de not_active Expired - Lifetime
- 2000-05-25 AT AT00937769T patent/ATE345576T1/de not_active IP Right Cessation
- 2000-05-25 EP EP00937769A patent/EP1250709B1/en not_active Expired - Lifetime
- 2000-05-25 AU AU2000252898A patent/AU2000252898A1/en not_active Abandoned
- 2000-05-25 KR KR1020027009502A patent/KR100661937B1/ko not_active Expired - Fee Related
- 2000-05-25 JP JP2001555112A patent/JP4878100B2/ja not_active Expired - Fee Related
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2006
- 2006-06-02 US US11/422,007 patent/US7388275B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| WO2001056054A1 (en) | 2001-08-02 |
| AU2000252898A1 (en) | 2001-08-07 |
| ATE345576T1 (de) | 2006-12-15 |
| JP2003521119A (ja) | 2003-07-08 |
| KR20020069020A (ko) | 2002-08-28 |
| DE60031887T2 (de) | 2007-07-05 |
| US7064412B2 (en) | 2006-06-20 |
| HK1051087A1 (en) | 2003-07-18 |
| US20030015787A1 (en) | 2003-01-23 |
| HK1051087B (en) | 2007-06-29 |
| US7388275B2 (en) | 2008-06-17 |
| EP1250709B1 (en) | 2006-11-15 |
| DE60031887D1 (de) | 2006-12-28 |
| EP1250709A1 (en) | 2002-10-23 |
| JP4878100B2 (ja) | 2012-02-15 |
| US20060203458A1 (en) | 2006-09-14 |
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