KR100540548B1 - 양자점 발광 소자 및 그의 제조 방법 - Google Patents
양자점 발광 소자 및 그의 제조 방법 Download PDFInfo
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- KR100540548B1 KR100540548B1 KR1020020078067A KR20020078067A KR100540548B1 KR 100540548 B1 KR100540548 B1 KR 100540548B1 KR 1020020078067 A KR1020020078067 A KR 1020020078067A KR 20020078067 A KR20020078067 A KR 20020078067A KR 100540548 B1 KR100540548 B1 KR 100540548B1
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- light emitting
- quantum dot
- type semiconductor
- emitting device
- insulating layer
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- 239000002096 quantum dot Substances 0.000 title claims abstract description 51
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 11
- 239000004065 semiconductor Substances 0.000 claims abstract description 42
- 238000000034 method Methods 0.000 claims abstract description 18
- 239000000758 substrate Substances 0.000 claims abstract description 17
- 238000000151 deposition Methods 0.000 claims abstract description 9
- 230000004888 barrier function Effects 0.000 claims description 7
- 230000008021 deposition Effects 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 4
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 2
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 2
- 229910002601 GaN Inorganic materials 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 238000001947 vapour-phase growth Methods 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/04—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
- H01L33/06—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction within the light emitting region, e.g. quantum confinement structure or tunnel barrier
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/0242—Crystalline insulating materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02636—Selective deposition, e.g. simultaneous growth of mono- and non-monocrystalline semiconductor materials
- H01L21/02639—Preparation of substrate for selective deposition
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- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/08—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a plurality of light emitting regions, e.g. laterally discontinuous light emitting layer or photoluminescent region integrated within the semiconductor body
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- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/20—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
- H01L33/24—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate of the light emitting region, e.g. non-planar junction
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- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
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- Led Devices (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
Description
또한, 상기 나노-홀(131)은 증착 시간에 따라 그 크기 및 밀도가 상관 관계를 가지며 제어되는데, 가령 그레인이 형성되는 증착 초기단계에서 시간이 조절되면 나노-홀(131)의 밀도 제어가 용이하고, 증착 후기 단계에서 시간이 조절되면 나노-홀(131)의 크기 제어가 용이하며, 증착 중기 단계에서 시간이 조절되면 나노-홀(131)의 밀도 및 크기가 함께 제어될 수 있다.
Claims (6)
- 기판 및, 상기 기판의 상면에 형성되는 n형 반도체층과,상기 n형 반도체층의 상면으로 증착되고, 증착 중에 다수개의 나노-홀이 관통되어 형성된 절연층과,상기 관통된 나노-홀의 내부가 반도체 물질로 채워져 형성되는 양자점과,상기 절연층의 상면에 형성되는 p형 반도체층이 포함되는 것을 특징으로 하는 양자점 발광 소자.
- 제 1 항에 있어서,상기 절연층은 장벽층을 매개로 다수가 적층 형성되는 것을 특징으로 하는 양자점 발광 소자.
- 제 1 항에 있어서,상기 양자점의 크기는 1~100나노미터인 것을 특징으로 하는 양자점 발광 소자.
- 기판 위에 n형 반도체층이 형성되는 공정,상기 n형 반도체층의 상면에 나노-홀이 관통되어 형성되도록 절연층이 증착되는 공정,상기 관통된 나노-홀의 내부가 반도체 물질로 채워져 양자점이 형성되는 공정, 및상기 절연층 위에 p형 반도체층이 형성되는 공정이 포함되는 것을 특징으로 하는 양자점 발광 소자의 제조 방법.
- 제 4 항에 있어서,상기 양자점이 형성되는 공정후에 다른 나노-홀이 포함되는 또 다른 절연층이 증착되고, 상기 나노-홀의 내부가 채워져 양자점이 형성되는 공정이 적어도 한번 더 반복되는 것을 특징으로 하는 양자점 발광 소자의 제조 방법.
- 제 4 항 또는 제 5 항에 있어서,상기 절연층이 증착되는 공정에서, 상기 나노-홀의 크기 또는 밀도는 상기 절연층이 증착되는 시간에 의해서 결정되는 것을 특징으로 하는 양자점 발광 소자의 제조 방법.
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020078067A KR100540548B1 (ko) | 2002-12-10 | 2002-12-10 | 양자점 발광 소자 및 그의 제조 방법 |
US10/538,078 US8017931B2 (en) | 2002-12-10 | 2003-12-08 | LED and fabrication method thereof |
PCT/KR2003/002683 WO2004054006A1 (en) | 2002-12-10 | 2003-12-08 | Led and fabrication method thereof |
CNB2003801054047A CN100382339C (zh) | 2002-12-10 | 2003-12-08 | Led及其制造方法 |
AU2003302837A AU2003302837A1 (en) | 2002-12-10 | 2003-12-08 | Led and fabrication method thereof |
Applications Claiming Priority (1)
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KR1020020078067A KR100540548B1 (ko) | 2002-12-10 | 2002-12-10 | 양자점 발광 소자 및 그의 제조 방법 |
Publications (2)
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KR20040050279A KR20040050279A (ko) | 2004-06-16 |
KR100540548B1 true KR100540548B1 (ko) | 2006-01-11 |
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KR1020020078067A KR100540548B1 (ko) | 2002-12-10 | 2002-12-10 | 양자점 발광 소자 및 그의 제조 방법 |
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Country | Link |
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US (1) | US8017931B2 (ko) |
KR (1) | KR100540548B1 (ko) |
CN (1) | CN100382339C (ko) |
AU (1) | AU2003302837A1 (ko) |
WO (1) | WO2004054006A1 (ko) |
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KR20120067159A (ko) * | 2010-12-15 | 2012-06-25 | 삼성엘이디 주식회사 | 그래핀 발광 소자 및 그 제조 방법 |
KR20190047363A (ko) | 2017-10-27 | 2019-05-08 | 경희대학교 산학협력단 | 전하 생성 접합층을 포함하는 박막형 발광소자 및 그 제조 방법 |
KR101980979B1 (ko) | 2017-12-07 | 2019-05-21 | 경희대학교 산학협력단 | 전자 수송층을 포함하는 박막형 발광소자 및 그 제조 방법 |
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- 2003-12-08 AU AU2003302837A patent/AU2003302837A1/en not_active Abandoned
- 2003-12-08 US US10/538,078 patent/US8017931B2/en not_active Expired - Fee Related
- 2003-12-08 CN CNB2003801054047A patent/CN100382339C/zh not_active Expired - Fee Related
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Publication number | Priority date | Publication date | Assignee | Title |
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US11189810B2 (en) | 2016-09-26 | 2021-11-30 | University-Industry Cooperation Group Of Kyung Hee University | Quantum-dot light emitting device comprising solution processed charge generation junction and manufacturing method thereof |
US11818907B2 (en) | 2016-09-26 | 2023-11-14 | University-Industry Cooperation Group Of Kyung Hee University | Quantum-dot light emitting device comprising solution processed charge generation junction and manufacturing method thereof |
KR20190047363A (ko) | 2017-10-27 | 2019-05-08 | 경희대학교 산학협력단 | 전하 생성 접합층을 포함하는 박막형 발광소자 및 그 제조 방법 |
US11430966B2 (en) | 2017-10-27 | 2022-08-30 | University-Industry Cooperation Group Of Kyung Hee University | Thin-film light-emitting device including charge generating junction layer and method of fabricating thin-film light-emitting device |
US11638381B2 (en) | 2017-10-27 | 2023-04-25 | University-Industry Cooperation Group Of Kyung Hee University | Thin-film light-emitting device including charge generating junction layer and method of fabricating thin-film light-emitting device |
KR101980979B1 (ko) | 2017-12-07 | 2019-05-21 | 경희대학교 산학협력단 | 전자 수송층을 포함하는 박막형 발광소자 및 그 제조 방법 |
Also Published As
Publication number | Publication date |
---|---|
CN100382339C (zh) | 2008-04-16 |
AU2003302837A1 (en) | 2004-06-30 |
CN1723574A (zh) | 2006-01-18 |
KR20040050279A (ko) | 2004-06-16 |
US20060163560A1 (en) | 2006-07-27 |
US8017931B2 (en) | 2011-09-13 |
WO2004054006A1 (en) | 2004-06-24 |
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