KR100479893B1 - 다이싱테이프를조사하는조사장치및그조사방법 - Google Patents
다이싱테이프를조사하는조사장치및그조사방법 Download PDFInfo
- Publication number
- KR100479893B1 KR100479893B1 KR1019960060273A KR19960060273A KR100479893B1 KR 100479893 B1 KR100479893 B1 KR 100479893B1 KR 1019960060273 A KR1019960060273 A KR 1019960060273A KR 19960060273 A KR19960060273 A KR 19960060273A KR 100479893 B1 KR100479893 B1 KR 100479893B1
- Authority
- KR
- South Korea
- Prior art keywords
- chamber
- light
- dicing tape
- illuminance
- lamp
- Prior art date
Links
- 230000001678 irradiating effect Effects 0.000 title claims abstract description 11
- 238000000034 method Methods 0.000 title claims description 16
- 239000000853 adhesive Substances 0.000 claims abstract description 15
- 230000001070 adhesive effect Effects 0.000 claims abstract description 14
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 12
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 10
- 239000001301 oxygen Substances 0.000 claims description 10
- 229910052760 oxygen Inorganic materials 0.000 claims description 10
- 230000033001 locomotion Effects 0.000 claims description 5
- 229910001873 dinitrogen Inorganic materials 0.000 claims description 4
- 238000007789 sealing Methods 0.000 claims 2
- 239000000463 material Substances 0.000 abstract description 13
- 239000004065 semiconductor Substances 0.000 abstract description 9
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 abstract description 4
- 229910052753 mercury Inorganic materials 0.000 abstract description 4
- 230000006698 induction Effects 0.000 abstract 2
- 238000001514 detection method Methods 0.000 abstract 1
- 238000003825 pressing Methods 0.000 description 5
- 230000006866 deterioration Effects 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 3
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910001882 dioxygen Inorganic materials 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000010926 purge Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003635 deoxygenating effect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910001507 metal halide Inorganic materials 0.000 description 1
- 150000005309 metal halides Chemical class 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 239000004945 silicone rubber Substances 0.000 description 1
- 230000003313 weakening effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Toxicology (AREA)
- High Energy & Nuclear Physics (AREA)
- Health & Medical Sciences (AREA)
- Dicing (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP33831195A JP3518786B2 (ja) | 1995-12-02 | 1995-12-02 | ダイシングテープ用光照射装置および光照射方法 |
JP95-338311 | 1995-12-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970052125A KR970052125A (ko) | 1997-07-29 |
KR100479893B1 true KR100479893B1 (ko) | 2005-06-27 |
Family
ID=18316946
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019960060273A KR100479893B1 (ko) | 1995-12-02 | 1996-11-30 | 다이싱테이프를조사하는조사장치및그조사방법 |
Country Status (6)
Country | Link |
---|---|
JP (1) | JP3518786B2 (de) |
KR (1) | KR100479893B1 (de) |
DE (1) | DE19648062B4 (de) |
GB (1) | GB2307759B (de) |
MY (1) | MY116683A (de) |
SG (1) | SG60026A1 (de) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101372394B1 (ko) * | 2012-11-23 | 2014-03-12 | 주식회사 대성엔지니어링 | 엘이디 자외선 조사장치 |
US11567247B2 (en) | 2018-11-09 | 2023-01-31 | Lg Chem, Ltd. | Plasma etching method using faraday cage |
US11932784B2 (en) | 2019-09-26 | 2024-03-19 | Lg Chem, Ltd. | Adhesive composition for dicing tape and dicing tape comprising the same |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3928372B2 (ja) * | 2001-05-22 | 2007-06-13 | ウシオ電機株式会社 | 光照射装置 |
JP2004072040A (ja) * | 2002-08-09 | 2004-03-04 | Lintec Corp | 属性表示付ダイシングテープおよびその製造方法 |
JP4488686B2 (ja) * | 2003-03-12 | 2010-06-23 | 日東電工株式会社 | 紫外線照射方法およびそれを用いた装置 |
EP1498935B1 (de) * | 2003-07-15 | 2006-04-26 | Tokyo Seimitsu Co.,Ltd. | Verfahren und Vorrichtung zum Berechnen einer Lichtmenge |
JP4578165B2 (ja) * | 2003-07-15 | 2010-11-10 | 株式会社東京精密 | 光量算出装置および光量算出方法 |
JP4638172B2 (ja) * | 2004-03-31 | 2011-02-23 | 積水化学工業株式会社 | Icチップの製造方法及びicチップの製造装置 |
JP2006324373A (ja) * | 2005-05-18 | 2006-11-30 | Matsushita Electric Ind Co Ltd | チップのピックアップ装置およびピックアップ方法 |
JP5117709B2 (ja) | 2006-12-04 | 2013-01-16 | リンテック株式会社 | 紫外線照射装置及び紫外線照射方法 |
JP5356842B2 (ja) * | 2009-01-28 | 2013-12-04 | リンテック株式会社 | 光照射装置及び光照射方法 |
JP2011040476A (ja) | 2009-08-07 | 2011-02-24 | Lintec Corp | エネルギー付与装置およびエネルギー付与方法 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5098501A (en) * | 1989-12-08 | 1992-03-24 | Sumitomo Electric Industries, Ltd. | Pickup method and the pickup apparatus for chip-type part |
JPH04212422A (ja) * | 1990-10-16 | 1992-08-04 | Sony Corp | 半導体処理装置 |
JPH0636984A (ja) * | 1992-07-13 | 1994-02-10 | Canon Inc | 露光装置 |
JPH06196554A (ja) * | 1992-12-24 | 1994-07-15 | Nitto Denko Corp | 紫外線照射装置 |
KR940022799A (ko) * | 1993-03-03 | 1994-10-21 | 윌리엄 이. 힐러 | 디엠디(dmd)를 절단한 후의 웨이퍼 처리방법 |
KR950001831A (ko) * | 1993-06-23 | 1995-01-04 | 박경팔 | 광량 자동제어 노광장치 |
KR960019124U (ko) * | 1994-11-05 | 1996-06-19 | 현대반도체주식회사 | 다이 본드 장비의 다이 픽업장치 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4190795A (en) * | 1977-09-09 | 1980-02-26 | Coberly & Associates | Constant intensity light source |
PH25206A (en) * | 1985-12-12 | 1991-03-27 | Lintec K K | Control apparatus for reducing adhesive force of adhesive agent adhering between semiconductor wafer and substrate |
JPH06196555A (ja) * | 1992-12-24 | 1994-07-15 | Nitto Denko Corp | 紫外線照射装置 |
-
1995
- 1995-12-02 JP JP33831195A patent/JP3518786B2/ja not_active Expired - Lifetime
-
1996
- 1996-10-29 MY MYPI96004484A patent/MY116683A/en unknown
- 1996-11-06 GB GB9623114A patent/GB2307759B/en not_active Expired - Fee Related
- 1996-11-20 DE DE19648062A patent/DE19648062B4/de not_active Expired - Fee Related
- 1996-11-29 SG SG1996011464A patent/SG60026A1/en unknown
- 1996-11-30 KR KR1019960060273A patent/KR100479893B1/ko not_active IP Right Cessation
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5098501A (en) * | 1989-12-08 | 1992-03-24 | Sumitomo Electric Industries, Ltd. | Pickup method and the pickup apparatus for chip-type part |
JPH04212422A (ja) * | 1990-10-16 | 1992-08-04 | Sony Corp | 半導体処理装置 |
JPH0636984A (ja) * | 1992-07-13 | 1994-02-10 | Canon Inc | 露光装置 |
JPH06196554A (ja) * | 1992-12-24 | 1994-07-15 | Nitto Denko Corp | 紫外線照射装置 |
KR940022799A (ko) * | 1993-03-03 | 1994-10-21 | 윌리엄 이. 힐러 | 디엠디(dmd)를 절단한 후의 웨이퍼 처리방법 |
KR950001831A (ko) * | 1993-06-23 | 1995-01-04 | 박경팔 | 광량 자동제어 노광장치 |
KR960019124U (ko) * | 1994-11-05 | 1996-06-19 | 현대반도체주식회사 | 다이 본드 장비의 다이 픽업장치 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101372394B1 (ko) * | 2012-11-23 | 2014-03-12 | 주식회사 대성엔지니어링 | 엘이디 자외선 조사장치 |
US11567247B2 (en) | 2018-11-09 | 2023-01-31 | Lg Chem, Ltd. | Plasma etching method using faraday cage |
US11932784B2 (en) | 2019-09-26 | 2024-03-19 | Lg Chem, Ltd. | Adhesive composition for dicing tape and dicing tape comprising the same |
Also Published As
Publication number | Publication date |
---|---|
DE19648062A1 (de) | 1997-06-05 |
GB2307759B (en) | 2000-02-09 |
JPH09162141A (ja) | 1997-06-20 |
GB9623114D0 (en) | 1997-01-08 |
DE19648062B4 (de) | 2009-01-29 |
KR970052125A (ko) | 1997-07-29 |
MY116683A (en) | 2004-03-31 |
GB2307759A (en) | 1997-06-04 |
SG60026A1 (en) | 1999-02-22 |
JP3518786B2 (ja) | 2004-04-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20120302 Year of fee payment: 8 |
|
LAPS | Lapse due to unpaid annual fee |