KR100352966B1 - 전원 차단을 자가 검지하여 오동작을 방지할 수 있는다전원 노드를 구비하는 반도체 장치 - Google Patents

전원 차단을 자가 검지하여 오동작을 방지할 수 있는다전원 노드를 구비하는 반도체 장치 Download PDF

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Publication number
KR100352966B1
KR100352966B1 KR1020000027643A KR20000027643A KR100352966B1 KR 100352966 B1 KR100352966 B1 KR 100352966B1 KR 1020000027643 A KR1020000027643 A KR 1020000027643A KR 20000027643 A KR20000027643 A KR 20000027643A KR 100352966 B1 KR100352966 B1 KR 100352966B1
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KR
South Korea
Prior art keywords
potential
power supply
node
circuit
output
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Expired - Fee Related
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KR1020000027643A
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English (en)
Korean (ko)
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KR20010020881A (ko
Inventor
가또히로시
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미쓰비시덴키 가부시키가이샤
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Publication of KR100352966B1 publication Critical patent/KR100352966B1/ko
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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/143—Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/28—Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/153—Arrangements in which a pulse is delivered at the instant when a predetermined characteristic of an input signal is present or at a fixed time interval after this instant

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Dram (AREA)
  • Power Sources (AREA)
  • Semiconductor Integrated Circuits (AREA)
KR1020000027643A 1999-08-12 2000-05-23 전원 차단을 자가 검지하여 오동작을 방지할 수 있는다전원 노드를 구비하는 반도체 장치 Expired - Fee Related KR100352966B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP22839399A JP4308985B2 (ja) 1999-08-12 1999-08-12 半導体装置
JP1999-228393 1999-08-12

Publications (2)

Publication Number Publication Date
KR20010020881A KR20010020881A (ko) 2001-03-15
KR100352966B1 true KR100352966B1 (ko) 2002-09-18

Family

ID=16875775

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020000027643A Expired - Fee Related KR100352966B1 (ko) 1999-08-12 2000-05-23 전원 차단을 자가 검지하여 오동작을 방지할 수 있는다전원 노드를 구비하는 반도체 장치

Country Status (4)

Country Link
US (1) US6340902B1 (enExample)
JP (1) JP4308985B2 (enExample)
KR (1) KR100352966B1 (enExample)
TW (1) TW540047B (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5041631B2 (ja) * 2001-06-15 2012-10-03 ルネサスエレクトロニクス株式会社 半導体記憶装置
JP3853195B2 (ja) * 2001-10-29 2006-12-06 株式会社ルネサステクノロジ 半導体装置
JP2003229490A (ja) * 2002-02-05 2003-08-15 Matsushita Electric Ind Co Ltd 半導体装置とその電源断検査方法
US7046016B2 (en) * 2002-10-22 2006-05-16 Tokyo Electron Limited Potential fixing device, potential fixing method, and capacitance measuring instrument
JP4184104B2 (ja) * 2003-01-30 2008-11-19 株式会社ルネサステクノロジ 半導体装置
JP2007109337A (ja) * 2005-10-14 2007-04-26 Elpida Memory Inc 半導体メモリ装置及びメモリモジュール
KR20140066391A (ko) 2012-11-23 2014-06-02 삼성전자주식회사 서든 파워 오프 감지 회로를 포함하는 불휘발성 메모리 장치 및 그것의 서든 파워 오프 감지 방법
US12405622B2 (en) * 2023-07-17 2025-09-02 Qualcomm Incorporated Voltage detector in data communication interface

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4617473A (en) * 1984-01-03 1986-10-14 Intersil, Inc. CMOS backup power switching circuit
JPH04285437A (ja) 1991-03-12 1992-10-09 Fujitsu Ltd 停電検出装置
JPH06140499A (ja) 1992-10-27 1994-05-20 Toyota Motor Corp 半導体集積回路
JPH06208423A (ja) * 1993-01-12 1994-07-26 Mitsubishi Electric Corp 電源回路
US5510735A (en) * 1994-12-29 1996-04-23 Motorola, Inc. Comparator circuit for generating a control signal corresponding to a difference voltage between a battery voltage and a power supply voltage
JPH10135424A (ja) 1996-11-01 1998-05-22 Mitsubishi Electric Corp 半導体集積回路装置
KR19980034730A (ko) * 1996-11-08 1998-08-05 김영환 외부 인터페이스 전압 자동검출 반도체 장치
JPH10290526A (ja) 1997-04-14 1998-10-27 Denso Corp 車載コンピュータの電源装置

Also Published As

Publication number Publication date
JP2001057074A (ja) 2001-02-27
JP4308985B2 (ja) 2009-08-05
TW540047B (en) 2003-07-01
KR20010020881A (ko) 2001-03-15
US6340902B1 (en) 2002-01-22

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