KR100343646B1 - 반도체메모리 - Google Patents
반도체메모리 Download PDFInfo
- Publication number
- KR100343646B1 KR100343646B1 KR1019940031265A KR19940031265A KR100343646B1 KR 100343646 B1 KR100343646 B1 KR 100343646B1 KR 1019940031265 A KR1019940031265 A KR 1019940031265A KR 19940031265 A KR19940031265 A KR 19940031265A KR 100343646 B1 KR100343646 B1 KR 100343646B1
- Authority
- KR
- South Korea
- Prior art keywords
- potential
- memory
- mode
- semiconductor memory
- capacitor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
- G11C11/225—Auxiliary circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
- G11C11/221—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements using ferroelectric capacitors
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32482593A JP3279025B2 (ja) | 1993-12-22 | 1993-12-22 | 半導体メモリ |
| JP93-324825 | 1993-12-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR950020705A KR950020705A (ko) | 1995-07-24 |
| KR100343646B1 true KR100343646B1 (ko) | 2002-12-02 |
Family
ID=18170104
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019940031265A Expired - Fee Related KR100343646B1 (ko) | 1993-12-22 | 1994-11-25 | 반도체메모리 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP3279025B2 (enExample) |
| KR (1) | KR100343646B1 (enExample) |
| CN (1) | CN1047249C (enExample) |
| TW (1) | TW271008B (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3622304B2 (ja) * | 1995-12-27 | 2005-02-23 | 株式会社日立製作所 | 半導体記憶装置 |
| US5703804A (en) * | 1996-09-26 | 1997-12-30 | Sharp Kabushiki K.K. | Semiconductor memory device |
| US5828596A (en) * | 1996-09-26 | 1998-10-27 | Sharp Kabushiki Kaisha | Semiconductor memory device |
| NO312698B1 (no) * | 2000-07-07 | 2002-06-17 | Thin Film Electronics Asa | Fremgangsmåte til å utföre skrive- og leseoperasjoner i en passiv matriseminne og apparat for å utföre fremgangsmåten |
| KR100425160B1 (ko) | 2001-05-28 | 2004-03-30 | 주식회사 하이닉스반도체 | 불휘발성 강유전체 메모리 장치의 승압전압 발생회로 및그 발생방법 |
| WO2005122180A1 (ja) * | 2004-06-08 | 2005-12-22 | Fujitsu Limited | 半導体記憶装置の検査方法 |
| JPWO2008105076A1 (ja) * | 2007-02-27 | 2010-06-03 | 富士通株式会社 | Rfidタグlsiおよびrfidタグ制御方法 |
| CN107533860B (zh) * | 2015-05-28 | 2022-02-08 | 英特尔公司 | 具有非易失性留存的基于铁电的存储器单元 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5086412A (en) * | 1990-11-21 | 1992-02-04 | National Semiconductor Corporation | Sense amplifier and method for ferroelectric memory |
-
1993
- 1993-12-22 JP JP32482593A patent/JP3279025B2/ja not_active Expired - Fee Related
-
1994
- 1994-11-25 KR KR1019940031265A patent/KR100343646B1/ko not_active Expired - Fee Related
- 1994-12-05 TW TW083111269A patent/TW271008B/zh active
- 1994-12-21 CN CN94119568A patent/CN1047249C/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP3279025B2 (ja) | 2002-04-30 |
| JPH07182872A (ja) | 1995-07-21 |
| CN1047249C (zh) | 1999-12-08 |
| CN1112716A (zh) | 1995-11-29 |
| TW271008B (enExample) | 1996-02-21 |
| KR950020705A (ko) | 1995-07-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5539279A (en) | Ferroelectric memory | |
| KR100385363B1 (ko) | 반도체메모리 | |
| KR100223990B1 (ko) | 반도체 기억장치 | |
| KR101278689B1 (ko) | 불휘발성 메모리 셀 및 기억장치와 불휘발성 논리 회로 | |
| JP5162276B2 (ja) | 強誘電体メモリ装置 | |
| KR100538718B1 (ko) | 반도체기억장치 | |
| KR100391152B1 (ko) | 조기동작 고전압 발생기를 가지는 반도체 장치 및 그에따른 고전압 공급방법 | |
| JP3431122B2 (ja) | 半導体記憶装置 | |
| JP3226433B2 (ja) | 強誘電体メモリ装置 | |
| US20050146972A1 (en) | Low power semiconductor memory device | |
| KR100328331B1 (ko) | 반도체 기억장치 및 그 동작방법 | |
| US6859386B2 (en) | Semiconductor memory device with memory cell having low cell ratio | |
| KR100343646B1 (ko) | 반도체메모리 | |
| JP2005285190A (ja) | メモリ | |
| US4965769A (en) | Semiconductor memory capable of high-speed data erasing | |
| KR20010021416A (ko) | 메모리 셀을 구비하는 집적 회로 및 메모리 셀에 대한데이터 비트 기록 방법 | |
| JP4639049B2 (ja) | メモリ | |
| JP2003123465A (ja) | 強誘電体記憶装置 | |
| KR100216647B1 (ko) | 승압회로를 갖는 기억장치 및 승압회로제어방법 | |
| US7099177B2 (en) | Nonvolatile ferroelectric memory device having power control function | |
| US7200028B2 (en) | Ferroelectric memory device and its driving method | |
| JP3391266B2 (ja) | 半導体メモリ | |
| US7262988B2 (en) | Memory device and semiconductor device | |
| KR100351189B1 (ko) | 비트 라인들, 워드 라인들 및 플레이트 라인들을 구비하는집적 메모리 및 메모리 동작 방법 | |
| JP2001312888A (ja) | 半導体記憶装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20050627 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20050627 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |