KR100326493B1 - 스택형 전극을 가진 dram 커패시터 및 그 제조 방법 - Google Patents

스택형 전극을 가진 dram 커패시터 및 그 제조 방법 Download PDF

Info

Publication number
KR100326493B1
KR100326493B1 KR1019997002431A KR19997002431A KR100326493B1 KR 100326493 B1 KR100326493 B1 KR 100326493B1 KR 1019997002431 A KR1019997002431 A KR 1019997002431A KR 19997002431 A KR19997002431 A KR 19997002431A KR 100326493 B1 KR100326493 B1 KR 100326493B1
Authority
KR
South Korea
Prior art keywords
electrode
memory
layers
contact
capacitor
Prior art date
Application number
KR1019997002431A
Other languages
English (en)
Korean (ko)
Other versions
KR20000048524A (ko
Inventor
귄터 쉰들러
발터 하르트너
카를로스 마추레-에스페요
Original Assignee
칼 하인쯔 호르닝어
지멘스 악티엔게젤샤프트
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 칼 하인쯔 호르닝어, 지멘스 악티엔게젤샤프트 filed Critical 칼 하인쯔 호르닝어
Publication of KR20000048524A publication Critical patent/KR20000048524A/ko
Application granted granted Critical
Publication of KR100326493B1 publication Critical patent/KR100326493B1/ko

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B99/00Subject matter not provided for in other groups of this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/01Manufacture or treatment
    • H10B12/02Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/03Making the capacitor or connections thereto
    • H10B12/033Making the capacitor or connections thereto the capacitor extending over the transistor
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/30DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/31DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor
    • H10B12/318DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor the storage electrode having multiple segments

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
KR1019997002431A 1996-09-30 1997-09-05 스택형 전극을 가진 dram 커패시터 및 그 제조 방법 KR100326493B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19640271A DE19640271C1 (de) 1996-09-30 1996-09-30 Verfahren zur Herstellung einer integrierten Halbleiterspeicheranordnung
DE19640271.9 1996-09-30

Publications (2)

Publication Number Publication Date
KR20000048524A KR20000048524A (ko) 2000-07-25
KR100326493B1 true KR100326493B1 (ko) 2002-03-12

Family

ID=7807421

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019997002431A KR100326493B1 (ko) 1996-09-30 1997-09-05 스택형 전극을 가진 dram 커패시터 및 그 제조 방법

Country Status (8)

Country Link
US (1) US6197633B1 (de)
EP (1) EP0931339B1 (de)
JP (1) JP3359644B2 (de)
KR (1) KR100326493B1 (de)
CN (1) CN1160777C (de)
DE (2) DE19640271C1 (de)
TW (1) TW364201B (de)
WO (1) WO1998015000A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8154847B2 (en) * 2008-09-12 2012-04-10 Mediatek Inc. Capacitor structure
KR101652878B1 (ko) * 2010-02-22 2016-09-01 삼성전자주식회사 반도체 소자 및 그 제조 방법
JP2012221965A (ja) 2011-04-04 2012-11-12 Elpida Memory Inc 半導体記憶装置及びその製造方法
JP2018157106A (ja) * 2017-03-17 2018-10-04 東芝メモリ株式会社 記憶装置および容量素子
KR102423766B1 (ko) 2017-07-26 2022-07-21 삼성전자주식회사 3차원 반도체 소자

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR920001761A (ko) * 1990-06-29 1992-01-30 김광호 디램셀의 적층형 캐패시터 및 제조방법

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0815207B2 (ja) * 1986-02-04 1996-02-14 富士通株式会社 半導体記憶装置
JPH0338061A (ja) * 1989-07-05 1991-02-19 Fujitsu Ltd 半導体記憶装置
JPH03153074A (ja) * 1989-11-10 1991-07-01 Mitsubishi Electric Corp 半導体装置
KR920017248A (ko) * 1991-02-18 1992-09-26 문정환 반도체 메모리 소자의 커패시터 제조방법
US5240871A (en) * 1991-09-06 1993-08-31 Micron Technology, Inc. Corrugated storage contact capacitor and method for forming a corrugated storage contact capacitor
US5631184A (en) * 1992-03-13 1997-05-20 Fujitsu Limited Method of producing a semiconductor device having a fin type capacitor
JPH06217959A (ja) * 1993-01-26 1994-08-09 Toshiba Corp 磁気共鳴イメージングにおける位相エンコード量調整法
JPH07161832A (ja) * 1993-12-08 1995-06-23 Oki Electric Ind Co Ltd 半導体記憶装置およびその製造方法
US5744833A (en) * 1996-08-16 1998-04-28 United Microelectronics Corporation Semiconductor memory device having tree-type capacitor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR920001761A (ko) * 1990-06-29 1992-01-30 김광호 디램셀의 적층형 캐패시터 및 제조방법

Also Published As

Publication number Publication date
TW364201B (en) 1999-07-11
DE59709521D1 (de) 2003-04-17
EP0931339A1 (de) 1999-07-28
JP2000503812A (ja) 2000-03-28
WO1998015000A1 (de) 1998-04-09
CN1231762A (zh) 1999-10-13
DE19640271C1 (de) 1998-03-05
EP0931339B1 (de) 2003-03-12
CN1160777C (zh) 2004-08-04
US6197633B1 (en) 2001-03-06
JP3359644B2 (ja) 2002-12-24
KR20000048524A (ko) 2000-07-25

Similar Documents

Publication Publication Date Title
KR102524614B1 (ko) 반도체 메모리 소자
US5053351A (en) Method of making stacked E-cell capacitor DRAM cell
US5084405A (en) Process to fabricate a double ring stacked cell structure
KR101031737B1 (ko) 반도체 구조, 메모리 셀, 디램 어레이, 전자 시스템,반도체 구조의 형성 방법, 및 디램 어레이 형성 방법
US5137842A (en) Stacked H-cell capacitor and process to fabricate same
US5081559A (en) Enclosed ferroelectric stacked capacitor
JP4794118B2 (ja) 半導体メモリ素子及びその製造方法
US5100825A (en) Method of making stacked surrounding reintrant wall capacitor
US5262343A (en) DRAM stacked capacitor fabrication process
US20020033494A1 (en) Semiconductor memory device and method of fabricating the same
CN109786389B (zh) 利用支撑条的动态随机存取存储器单元阵列及其制作方法
JPH07109873B2 (ja) 半導体記憶装置
KR100292594B1 (ko) 반도체 메모리 장치
US20020008269A1 (en) Structure of a stacked memory cell, in particular a ferroelectric cell
TWI575714B (zh) 三維記憶體
KR100326493B1 (ko) 스택형 전극을 가진 dram 커패시터 및 그 제조 방법
KR20200076806A (ko) 수직형 메모리 장치
US5234858A (en) Stacked surrounding wall capacitor
US5321648A (en) Stacked V-cell capacitor using a disposable outer digit line spacer
US6872996B2 (en) Method of fabricating a ferroelectric stacked memory cell
US5234855A (en) Stacked comb spacer capacitor
US6897502B2 (en) Semiconductor memory device and its manufacturing method
US5089986A (en) Mushroom double stacked capacitor
CN219437502U (zh) 半导体器件
TWI763278B (zh) 三維記憶體元件及其製造方法

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20120210

Year of fee payment: 11

LAPS Lapse due to unpaid annual fee