KR100326493B1 - 스택형 전극을 가진 dram 커패시터 및 그 제조 방법 - Google Patents
스택형 전극을 가진 dram 커패시터 및 그 제조 방법 Download PDFInfo
- Publication number
- KR100326493B1 KR100326493B1 KR1019997002431A KR19997002431A KR100326493B1 KR 100326493 B1 KR100326493 B1 KR 100326493B1 KR 1019997002431 A KR1019997002431 A KR 1019997002431A KR 19997002431 A KR19997002431 A KR 19997002431A KR 100326493 B1 KR100326493 B1 KR 100326493B1
- Authority
- KR
- South Korea
- Prior art keywords
- electrode
- memory
- layers
- contact
- capacitor
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 title claims abstract description 37
- 238000004519 manufacturing process Methods 0.000 title claims description 14
- 238000000034 method Methods 0.000 title description 6
- 239000004065 semiconductor Substances 0.000 claims description 32
- 239000004020 conductor Substances 0.000 claims description 13
- 238000005530 etching Methods 0.000 claims description 9
- 239000000463 material Substances 0.000 claims description 9
- 239000007772 electrode material Substances 0.000 claims description 8
- 210000001331 nose Anatomy 0.000 claims description 6
- 238000000151 deposition Methods 0.000 claims description 5
- 239000011810 insulating material Substances 0.000 claims description 4
- 230000010354 integration Effects 0.000 claims description 4
- 239000010409 thin film Substances 0.000 claims description 2
- 239000010970 precious metal Substances 0.000 claims 1
- 210000004027 cell Anatomy 0.000 abstract description 62
- 230000001419 dependent effect Effects 0.000 description 2
- 210000002105 tongue Anatomy 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/01—Manufacture or treatment
- H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
- H10B12/03—Making the capacitor or connections thereto
- H10B12/033—Making the capacitor or connections thereto the capacitor extending over the transistor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
- H10B12/31—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor
- H10B12/318—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor the storage electrode having multiple segments
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19640271A DE19640271C1 (de) | 1996-09-30 | 1996-09-30 | Verfahren zur Herstellung einer integrierten Halbleiterspeicheranordnung |
DE19640271.9 | 1996-09-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20000048524A KR20000048524A (ko) | 2000-07-25 |
KR100326493B1 true KR100326493B1 (ko) | 2002-03-12 |
Family
ID=7807421
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019997002431A KR100326493B1 (ko) | 1996-09-30 | 1997-09-05 | 스택형 전극을 가진 dram 커패시터 및 그 제조 방법 |
Country Status (8)
Country | Link |
---|---|
US (1) | US6197633B1 (de) |
EP (1) | EP0931339B1 (de) |
JP (1) | JP3359644B2 (de) |
KR (1) | KR100326493B1 (de) |
CN (1) | CN1160777C (de) |
DE (2) | DE19640271C1 (de) |
TW (1) | TW364201B (de) |
WO (1) | WO1998015000A1 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8154847B2 (en) * | 2008-09-12 | 2012-04-10 | Mediatek Inc. | Capacitor structure |
KR101652878B1 (ko) * | 2010-02-22 | 2016-09-01 | 삼성전자주식회사 | 반도체 소자 및 그 제조 방법 |
JP2012221965A (ja) | 2011-04-04 | 2012-11-12 | Elpida Memory Inc | 半導体記憶装置及びその製造方法 |
JP2018157106A (ja) * | 2017-03-17 | 2018-10-04 | 東芝メモリ株式会社 | 記憶装置および容量素子 |
KR102423766B1 (ko) | 2017-07-26 | 2022-07-21 | 삼성전자주식회사 | 3차원 반도체 소자 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR920001761A (ko) * | 1990-06-29 | 1992-01-30 | 김광호 | 디램셀의 적층형 캐패시터 및 제조방법 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0815207B2 (ja) * | 1986-02-04 | 1996-02-14 | 富士通株式会社 | 半導体記憶装置 |
JPH0338061A (ja) * | 1989-07-05 | 1991-02-19 | Fujitsu Ltd | 半導体記憶装置 |
JPH03153074A (ja) * | 1989-11-10 | 1991-07-01 | Mitsubishi Electric Corp | 半導体装置 |
KR920017248A (ko) * | 1991-02-18 | 1992-09-26 | 문정환 | 반도체 메모리 소자의 커패시터 제조방법 |
US5240871A (en) * | 1991-09-06 | 1993-08-31 | Micron Technology, Inc. | Corrugated storage contact capacitor and method for forming a corrugated storage contact capacitor |
US5631184A (en) * | 1992-03-13 | 1997-05-20 | Fujitsu Limited | Method of producing a semiconductor device having a fin type capacitor |
JPH06217959A (ja) * | 1993-01-26 | 1994-08-09 | Toshiba Corp | 磁気共鳴イメージングにおける位相エンコード量調整法 |
JPH07161832A (ja) * | 1993-12-08 | 1995-06-23 | Oki Electric Ind Co Ltd | 半導体記憶装置およびその製造方法 |
US5744833A (en) * | 1996-08-16 | 1998-04-28 | United Microelectronics Corporation | Semiconductor memory device having tree-type capacitor |
-
1996
- 1996-09-30 DE DE19640271A patent/DE19640271C1/de not_active Expired - Fee Related
-
1997
- 1997-09-05 EP EP97942796A patent/EP0931339B1/de not_active Expired - Lifetime
- 1997-09-05 KR KR1019997002431A patent/KR100326493B1/ko not_active IP Right Cessation
- 1997-09-05 CN CNB97198381XA patent/CN1160777C/zh not_active Expired - Fee Related
- 1997-09-05 WO PCT/DE1997/001965 patent/WO1998015000A1/de active IP Right Grant
- 1997-09-05 JP JP51610398A patent/JP3359644B2/ja not_active Expired - Fee Related
- 1997-09-05 DE DE59709521T patent/DE59709521D1/de not_active Expired - Fee Related
- 1997-09-22 TW TW086113734A patent/TW364201B/zh not_active IP Right Cessation
-
1999
- 1999-03-30 US US09/281,822 patent/US6197633B1/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR920001761A (ko) * | 1990-06-29 | 1992-01-30 | 김광호 | 디램셀의 적층형 캐패시터 및 제조방법 |
Also Published As
Publication number | Publication date |
---|---|
TW364201B (en) | 1999-07-11 |
DE59709521D1 (de) | 2003-04-17 |
EP0931339A1 (de) | 1999-07-28 |
JP2000503812A (ja) | 2000-03-28 |
WO1998015000A1 (de) | 1998-04-09 |
CN1231762A (zh) | 1999-10-13 |
DE19640271C1 (de) | 1998-03-05 |
EP0931339B1 (de) | 2003-03-12 |
CN1160777C (zh) | 2004-08-04 |
US6197633B1 (en) | 2001-03-06 |
JP3359644B2 (ja) | 2002-12-24 |
KR20000048524A (ko) | 2000-07-25 |
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E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20120210 Year of fee payment: 11 |
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LAPS | Lapse due to unpaid annual fee |