JPWO2022013934A5 - - Google Patents

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Publication number
JPWO2022013934A5
JPWO2022013934A5 JP2022536010A JP2022536010A JPWO2022013934A5 JP WO2022013934 A5 JPWO2022013934 A5 JP WO2022013934A5 JP 2022536010 A JP2022536010 A JP 2022536010A JP 2022536010 A JP2022536010 A JP 2022536010A JP WO2022013934 A5 JPWO2022013934 A5 JP WO2022013934A5
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JP
Japan
Prior art keywords
fluorescent
layer
aluminum
sample
sample chamber
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JP2022536010A
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English (en)
Japanese (ja)
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JPWO2022013934A1 (https=
JP7416254B2 (ja
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Priority claimed from PCT/JP2020/027312 external-priority patent/WO2022013934A1/ja
Publication of JPWO2022013934A1 publication Critical patent/JPWO2022013934A1/ja
Publication of JPWO2022013934A5 publication Critical patent/JPWO2022013934A5/ja
Application granted granted Critical
Publication of JP7416254B2 publication Critical patent/JP7416254B2/ja
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JP2022536010A 2020-07-14 2020-07-14 蛍光ｘ線分析装置 Active JP7416254B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/027312 WO2022013934A1 (ja) 2020-07-14 2020-07-14 蛍光ｘ線分析装置

Publications (3)

Publication Number Publication Date
JPWO2022013934A1 JPWO2022013934A1 (https=) 2022-01-20
JPWO2022013934A5 true JPWO2022013934A5 (https=) 2023-03-24
JP7416254B2 JP7416254B2 (ja) 2024-01-17

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ID=79555359

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022536010A Active JP7416254B2 (ja) 2020-07-14 2020-07-14 蛍光ｘ線分析装置

Country Status (6)

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US (1) US12270773B2 (https=)
EP (1) EP4184153A4 (https=)
JP (1) JP7416254B2 (https=)
CN (1) CN115867793B (https=)
TW (1) TWI821667B (https=)
WO (1) WO2022013934A1 (https=)

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2336652A1 (de) * 1973-07-18 1975-01-30 Siemens Ag Schichtsystem zur absorption von roentgenstrahlen
US4150179A (en) * 1977-12-19 1979-04-17 University College Cardiff Hot dip aluminizing of steel strip
JPH06330346A (ja) * 1993-05-24 1994-11-29 Nippon Steel Corp アルミメッキ鋼板
JP3166638B2 (ja) * 1996-11-29 2001-05-14 株式会社島津製作所 蛍光ｘ線分析装置
US6266390B1 (en) 1998-09-21 2001-07-24 Spectramet, Llc High speed materials sorting using x-ray fluorescence
CA2393011C (en) 2002-07-11 2008-02-26 Janghyun Choi Production method for aluminum alloy coated steel sheet
JP2004197151A (ja) 2002-12-18 2004-07-15 Lucite Japan Kk 耐食性鉄材の製造方法
JP4166099B2 (ja) * 2003-02-14 2008-10-15 Ｔｄｋ株式会社 試料容器
JP4854005B2 (ja) * 2006-02-24 2012-01-11 エスアイアイ・ナノテクノロジー株式会社 蛍光ｘ線分析装置
JP2011022163A (ja) 2010-10-29 2011-02-03 Shimadzu Corp Ｘ線分析装置
JP2013108726A (ja) * 2011-11-24 2013-06-06 Mitsubishi Electric Corp 検知装置、及び、検知方法
JP6305327B2 (ja) * 2014-12-04 2018-04-04 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置
JP2016114394A (ja) 2014-12-12 2016-06-23 日鐵住金建材株式会社 放射能汚染物質隔離容器
US10175184B2 (en) * 2015-06-22 2019-01-08 Moxtek, Inc. XRF analyzer for light element detection
FR3052259B1 (fr) * 2016-06-02 2023-08-25 Avenisense Capteur, procede de calibration d'un capteur et methode automatisee de suivi en ligne de l'evolution d'un corps liquide
JP6642372B2 (ja) * 2016-10-14 2020-02-05 株式会社島津製作所 Ｘ線分析装置
US10914694B2 (en) * 2017-08-23 2021-02-09 Government Of The United States Of America, As Represented By The Secretary Of Commerce X-ray spectrometer

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