JP7416254B2 - 蛍光ｘ線分析装置 - Google Patents

蛍光ｘ線分析装置 Download PDF

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Publication number
JP7416254B2
JP7416254B2 JP2022536010A JP2022536010A JP7416254B2 JP 7416254 B2 JP7416254 B2 JP 7416254B2 JP 2022536010 A JP2022536010 A JP 2022536010A JP 2022536010 A JP2022536010 A JP 2022536010A JP 7416254 B2 JP7416254 B2 JP 7416254B2
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fluorescent
sample
layer
ray
molten aluminum
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Japanese (ja)
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JPWO2022013934A1 (https=
JPWO2022013934A5 (https=
Inventor
祐司 森久
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Shimadzu Corp
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Shimadzu Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2022536010A 2020-07-14 2020-07-14 蛍光ｘ線分析装置 Active JP7416254B2 (ja)

Applications Claiming Priority (1)

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PCT/JP2020/027312 WO2022013934A1 (ja) 2020-07-14 2020-07-14 蛍光ｘ線分析装置

Publications (3)

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JPWO2022013934A1 JPWO2022013934A1 (https=) 2022-01-20
JPWO2022013934A5 JPWO2022013934A5 (https=) 2023-03-24
JP7416254B2 true JP7416254B2 (ja) 2024-01-17

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JP2022536010A Active JP7416254B2 (ja) 2020-07-14 2020-07-14 蛍光ｘ線分析装置

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US (1) US12270773B2 (https=)
EP (1) EP4184153A4 (https=)
JP (1) JP7416254B2 (https=)
CN (1) CN115867793B (https=)
TW (1) TWI821667B (https=)
WO (1) WO2022013934A1 (https=)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004043882A (ja) 2002-07-11 2004-02-12 Union Steel Manufacturing Co Ltd アルミニウム合金メッキ鋼板のメッキ方法
JP2011022163A (ja) 2010-10-29 2011-02-03 Shimadzu Corp Ｘ線分析装置
JP2016109502A (ja) 2014-12-04 2016-06-20 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置
JP2016114394A (ja) 2014-12-12 2016-06-23 日鐵住金建材株式会社 放射能汚染物質隔離容器

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2336652A1 (de) * 1973-07-18 1975-01-30 Siemens Ag Schichtsystem zur absorption von roentgenstrahlen
US4150179A (en) * 1977-12-19 1979-04-17 University College Cardiff Hot dip aluminizing of steel strip
JPH06330346A (ja) * 1993-05-24 1994-11-29 Nippon Steel Corp アルミメッキ鋼板
JP3166638B2 (ja) * 1996-11-29 2001-05-14 株式会社島津製作所 蛍光ｘ線分析装置
US6266390B1 (en) 1998-09-21 2001-07-24 Spectramet, Llc High speed materials sorting using x-ray fluorescence
JP2004197151A (ja) 2002-12-18 2004-07-15 Lucite Japan Kk 耐食性鉄材の製造方法
JP4166099B2 (ja) * 2003-02-14 2008-10-15 Ｔｄｋ株式会社 試料容器
JP4854005B2 (ja) * 2006-02-24 2012-01-11 エスアイアイ・ナノテクノロジー株式会社 蛍光ｘ線分析装置
JP2013108726A (ja) * 2011-11-24 2013-06-06 Mitsubishi Electric Corp 検知装置、及び、検知方法
US10175184B2 (en) * 2015-06-22 2019-01-08 Moxtek, Inc. XRF analyzer for light element detection
FR3052259B1 (fr) * 2016-06-02 2023-08-25 Avenisense Capteur, procede de calibration d'un capteur et methode automatisee de suivi en ligne de l'evolution d'un corps liquide
JP6642372B2 (ja) * 2016-10-14 2020-02-05 株式会社島津製作所 Ｘ線分析装置
US10914694B2 (en) * 2017-08-23 2021-02-09 Government Of The United States Of America, As Represented By The Secretary Of Commerce X-ray spectrometer

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004043882A (ja) 2002-07-11 2004-02-12 Union Steel Manufacturing Co Ltd アルミニウム合金メッキ鋼板のメッキ方法
JP2011022163A (ja) 2010-10-29 2011-02-03 Shimadzu Corp Ｘ線分析装置
JP2016109502A (ja) 2014-12-04 2016-06-20 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置
JP2016114394A (ja) 2014-12-12 2016-06-23 日鐵住金建材株式会社 放射能汚染物質隔離容器

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Publication number Publication date
WO2022013934A1 (ja) 2022-01-20
EP4184153A4 (en) 2024-04-17
CN115867793B (zh) 2025-08-05
US12270773B2 (en) 2025-04-08
JPWO2022013934A1 (https=) 2022-01-20
TW202202835A (zh) 2022-01-16
TWI821667B (zh) 2023-11-11
US20230251214A1 (en) 2023-08-10
EP4184153A1 (en) 2023-05-24
CN115867793A (zh) 2023-03-28

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