TWI821667B - 螢光x射線分析裝置 - Google Patents
螢光x射線分析裝置 Download PDFInfo
- Publication number
- TWI821667B TWI821667B TW110117616A TW110117616A TWI821667B TW I821667 B TWI821667 B TW I821667B TW 110117616 A TW110117616 A TW 110117616A TW 110117616 A TW110117616 A TW 110117616A TW I821667 B TWI821667 B TW I821667B
- Authority
- TW
- Taiwan
- Prior art keywords
- sample
- rays
- layer
- fluorescence
- molten aluminum
- Prior art date
Links
- 238000002441 X-ray diffraction Methods 0.000 title claims abstract description 52
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims abstract description 102
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 102
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 102
- 229910052742 iron Inorganic materials 0.000 claims abstract description 51
- 230000001678 irradiating effect Effects 0.000 claims abstract description 6
- 239000010410 layer Substances 0.000 claims description 80
- 239000011247 coating layer Substances 0.000 claims description 16
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 7
- 229910052799 carbon Inorganic materials 0.000 claims description 7
- 238000000034 method Methods 0.000 abstract description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 54
- 239000012535 impurity Substances 0.000 description 44
- 229910052759 nickel Inorganic materials 0.000 description 27
- 238000004458 analytical method Methods 0.000 description 12
- 230000002378 acidificating effect Effects 0.000 description 11
- 239000002904 solvent Substances 0.000 description 11
- 239000000463 material Substances 0.000 description 10
- 230000002238 attenuated effect Effects 0.000 description 9
- 238000007747 plating Methods 0.000 description 8
- 229910000831 Steel Inorganic materials 0.000 description 6
- 239000000956 alloy Substances 0.000 description 6
- 229910045601 alloy Inorganic materials 0.000 description 6
- 239000010959 steel Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000002834 transmittance Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 3
- 239000004926 polymethyl methacrylate Substances 0.000 description 3
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000004454 trace mineral analysis Methods 0.000 description 2
- 229910002703 Al K Inorganic materials 0.000 description 1
- 229910052582 BN Inorganic materials 0.000 description 1
- 229910018493 Ni—K Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000002784 hot electron Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000004452 microanalysis Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000000825 pharmaceutical preparation Substances 0.000 description 1
- 229940127557 pharmaceutical product Drugs 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000004451 qualitative analysis Methods 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| WOPCT/JP2020/027312 | 2020-07-14 | ||
| PCT/JP2020/027312 WO2022013934A1 (ja) | 2020-07-14 | 2020-07-14 | 蛍光ｘ線分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202202835A TW202202835A (zh) | 2022-01-16 |
| TWI821667B true TWI821667B (zh) | 2023-11-11 |
Family
ID=79555359
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW110117616A TWI821667B (zh) | 2020-07-14 | 2021-05-17 | 螢光x射線分析裝置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US12270773B2 (https=) |
| EP (1) | EP4184153A4 (https=) |
| JP (1) | JP7416254B2 (https=) |
| CN (1) | CN115867793B (https=) |
| TW (1) | TWI821667B (https=) |
| WO (1) | WO2022013934A1 (https=) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06330346A (ja) * | 1993-05-24 | 1994-11-29 | Nippon Steel Corp | アルミメッキ鋼板 |
| US20010022830A1 (en) * | 1998-09-21 | 2001-09-20 | Sommer Edward J. | High speed materials sorting using x-ray fluorescence |
| JP2011022163A (ja) * | 2010-10-29 | 2011-02-03 | Shimadzu Corp | Ｘ線分析装置 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2336652A1 (de) * | 1973-07-18 | 1975-01-30 | Siemens Ag | Schichtsystem zur absorption von roentgenstrahlen |
| US4150179A (en) * | 1977-12-19 | 1979-04-17 | University College Cardiff | Hot dip aluminizing of steel strip |
| JP3166638B2 (ja) * | 1996-11-29 | 2001-05-14 | 株式会社島津製作所 | 蛍光ｘ線分析装置 |
| CA2393011C (en) | 2002-07-11 | 2008-02-26 | Janghyun Choi | Production method for aluminum alloy coated steel sheet |
| JP2004197151A (ja) | 2002-12-18 | 2004-07-15 | Lucite Japan Kk | 耐食性鉄材の製造方法 |
| JP4166099B2 (ja) * | 2003-02-14 | 2008-10-15 | Ｔｄｋ株式会社 | 試料容器 |
| JP4854005B2 (ja) * | 2006-02-24 | 2012-01-11 | エスアイアイ・ナノテクノロジー株式会社 | 蛍光ｘ線分析装置 |
| JP2013108726A (ja) * | 2011-11-24 | 2013-06-06 | Mitsubishi Electric Corp | 検知装置、及び、検知方法 |
| JP6305327B2 (ja) * | 2014-12-04 | 2018-04-04 | 株式会社日立ハイテクサイエンス | 蛍光ｘ線分析装置 |
| JP2016114394A (ja) | 2014-12-12 | 2016-06-23 | 日鐵住金建材株式会社 | 放射能汚染物質隔離容器 |
| US10175184B2 (en) * | 2015-06-22 | 2019-01-08 | Moxtek, Inc. | XRF analyzer for light element detection |
| FR3052259B1 (fr) * | 2016-06-02 | 2023-08-25 | Avenisense | Capteur, procede de calibration d'un capteur et methode automatisee de suivi en ligne de l'evolution d'un corps liquide |
| JP6642372B2 (ja) * | 2016-10-14 | 2020-02-05 | 株式会社島津製作所 | Ｘ線分析装置 |
| US10914694B2 (en) * | 2017-08-23 | 2021-02-09 | Government Of The United States Of America, As Represented By The Secretary Of Commerce | X-ray spectrometer |
-
2020
- 2020-07-14 WO PCT/JP2020/027312 patent/WO2022013934A1/ja not_active Ceased
- 2020-07-14 EP EP20945235.8A patent/EP4184153A4/en active Pending
- 2020-07-14 US US18/015,655 patent/US12270773B2/en active Active
- 2020-07-14 CN CN202080102888.3A patent/CN115867793B/zh active Active
- 2020-07-14 JP JP2022536010A patent/JP7416254B2/ja active Active
-
2021
- 2021-05-17 TW TW110117616A patent/TWI821667B/zh active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06330346A (ja) * | 1993-05-24 | 1994-11-29 | Nippon Steel Corp | アルミメッキ鋼板 |
| US20010022830A1 (en) * | 1998-09-21 | 2001-09-20 | Sommer Edward J. | High speed materials sorting using x-ray fluorescence |
| JP2011022163A (ja) * | 2010-10-29 | 2011-02-03 | Shimadzu Corp | Ｘ線分析装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022013934A1 (ja) | 2022-01-20 |
| EP4184153A4 (en) | 2024-04-17 |
| CN115867793B (zh) | 2025-08-05 |
| US12270773B2 (en) | 2025-04-08 |
| JPWO2022013934A1 (https=) | 2022-01-20 |
| TW202202835A (zh) | 2022-01-16 |
| US20230251214A1 (en) | 2023-08-10 |
| EP4184153A1 (en) | 2023-05-24 |
| CN115867793A (zh) | 2023-03-28 |
| JP7416254B2 (ja) | 2024-01-17 |
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