JPWO2022004000A5 - - Google Patents
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- Publication number
- JPWO2022004000A5 JPWO2022004000A5 JP2022533027A JP2022533027A JPWO2022004000A5 JP WO2022004000 A5 JPWO2022004000 A5 JP WO2022004000A5 JP 2022533027 A JP2022533027 A JP 2022533027A JP 2022533027 A JP2022533027 A JP 2022533027A JP WO2022004000 A5 JPWO2022004000 A5 JP WO2022004000A5
- Authority
- JP
- Japan
- Prior art keywords
- sample
- detector
- ray
- rays
- fluorescent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020112575 | 2020-06-30 | ||
| JP2020112575 | 2020-06-30 | ||
| PCT/JP2020/045375 WO2022004000A1 (ja) | 2020-06-30 | 2020-12-07 | 蛍光ｘ線分析装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2022004000A1 JPWO2022004000A1 (https=) | 2022-01-06 |
| JPWO2022004000A5 true JPWO2022004000A5 (https=) | 2023-01-24 |
| JP7380884B2 JP7380884B2 (ja) | 2023-11-15 |
Family
ID=79315823
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022533027A Active JP7380884B2 (ja) | 2020-06-30 | 2020-12-07 | 蛍光ｘ線分析装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US12292397B2 (https=) |
| EP (1) | EP4174479A4 (https=) |
| JP (1) | JP7380884B2 (https=) |
| CN (1) | CN115803612B (https=) |
| WO (1) | WO2022004000A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7562603B2 (ja) * | 2022-06-20 | 2024-10-07 | 日本電子株式会社 | 蛍光ｘ線分析装置および測定方法 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3166638B2 (ja) * | 1996-11-29 | 2001-05-14 | 株式会社島津製作所 | 蛍光ｘ線分析装置 |
| JPH10221047A (ja) * | 1997-02-03 | 1998-08-21 | Jeol Ltd | 蛍光ｘ線膜厚分析装置及び方法 |
| JP3629539B2 (ja) * | 2002-03-04 | 2005-03-16 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| JP3726161B2 (ja) * | 2003-03-28 | 2005-12-14 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| JP3823155B2 (ja) * | 2003-09-26 | 2006-09-20 | 理学電機工業株式会社 | 雰囲気置換機能を備えたｘ線分析方法 |
| FI20031753L (fi) | 2003-12-01 | 2005-06-02 | Metorex Internat Oy | Parannettu mittausjärjestely röntgenfluoresenssianalyysiä varten |
| DE102004019030A1 (de) * | 2004-04-17 | 2005-11-03 | Katz, Elisabeth | Vorrichtung für die Elementanalyse |
| DE08155628T1 (de) * | 2008-05-05 | 2010-04-29 | Oxford Instruments Analytical Oy | Röntgenfluoreszenzanalysator mit gasgefüllter Kammer |
| JP6081260B2 (ja) * | 2013-03-28 | 2017-02-15 | 株式会社日立ハイテクサイエンス | 蛍光ｘ線分析装置 |
| CN105247354A (zh) | 2013-05-27 | 2016-01-13 | 株式会社岛津制作所 | 荧光x射线分析装置 |
| CN203824942U (zh) * | 2014-05-14 | 2014-09-10 | 苏州三值精密仪器有限公司 | 一种x荧光光谱仪测试油品中有害元素的充氦气装置 |
| CN109239117B (zh) * | 2018-10-26 | 2024-01-30 | 钢研纳克检测技术股份有限公司 | 直接测定样品中痕量铝、硅、磷、硫、氯含量的分析装置及方法 |
| JP7135795B2 (ja) * | 2018-11-30 | 2022-09-13 | 株式会社島津製作所 | 蛍光ｘ線分析システムおよび蛍光ｘ線分析方法 |
-
2020
- 2020-12-07 WO PCT/JP2020/045375 patent/WO2022004000A1/ja not_active Ceased
- 2020-12-07 US US18/013,205 patent/US12292397B2/en active Active
- 2020-12-07 JP JP2022533027A patent/JP7380884B2/ja active Active
- 2020-12-07 EP EP20943522.1A patent/EP4174479A4/en active Pending
- 2020-12-07 CN CN202080102474.0A patent/CN115803612B/zh active Active
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