JPS6362893B2 - - Google Patents
Info
- Publication number
- JPS6362893B2 JPS6362893B2 JP18062383A JP18062383A JPS6362893B2 JP S6362893 B2 JPS6362893 B2 JP S6362893B2 JP 18062383 A JP18062383 A JP 18062383A JP 18062383 A JP18062383 A JP 18062383A JP S6362893 B2 JPS6362893 B2 JP S6362893B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- single crystal
- semiconductor
- forming
- silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 30
- 239000013078 crystal Substances 0.000 claims description 29
- 238000000034 method Methods 0.000 claims description 23
- 238000002844 melting Methods 0.000 claims description 18
- 230000008018 melting Effects 0.000 claims description 17
- 229910052751 metal Inorganic materials 0.000 claims description 16
- 239000002184 metal Substances 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 13
- 238000004519 manufacturing process Methods 0.000 claims description 10
- 238000000137 annealing Methods 0.000 claims description 8
- 229910052594 sapphire Inorganic materials 0.000 claims description 8
- 239000010980 sapphire Substances 0.000 claims description 8
- 238000010894 electron beam technology Methods 0.000 claims description 6
- 238000005530 etching Methods 0.000 claims description 5
- 239000012212 insulator Substances 0.000 claims description 5
- 239000011810 insulating material Substances 0.000 claims 1
- 239000005300 metallic glass Substances 0.000 claims 1
- 239000003870 refractory metal Substances 0.000 claims 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 18
- 229910052710 silicon Inorganic materials 0.000 description 18
- 239000010703 silicon Substances 0.000 description 18
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 12
- 229910052814 silicon oxide Inorganic materials 0.000 description 12
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 7
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 6
- 238000001259 photo etching Methods 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 229910000077 silane Inorganic materials 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- LNDHQUDDOUZKQV-UHFFFAOYSA-J molybdenum tetrafluoride Chemical compound F[Mo](F)(F)F LNDHQUDDOUZKQV-UHFFFAOYSA-J 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- NXHILIPIEUBEPD-UHFFFAOYSA-H tungsten hexafluoride Chemical compound F[W](F)(F)(F)(F)F NXHILIPIEUBEPD-UHFFFAOYSA-H 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/0242—Crystalline insulating materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02488—Insulating materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Recrystallisation Techniques (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18062383A JPS6074507A (ja) | 1983-09-30 | 1983-09-30 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18062383A JPS6074507A (ja) | 1983-09-30 | 1983-09-30 | 半導体装置の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6074507A JPS6074507A (ja) | 1985-04-26 |
JPS6362893B2 true JPS6362893B2 (enrdf_load_stackoverflow) | 1988-12-05 |
Family
ID=16086445
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18062383A Granted JPS6074507A (ja) | 1983-09-30 | 1983-09-30 | 半導体装置の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6074507A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2020096099A1 (ko) * | 2018-11-09 | 2020-05-14 | 주식회사 루닛 | 기계 학습 방법 및 장치 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0590857U (ja) * | 1991-05-29 | 1993-12-10 | 株式会社小桜建装 | 差し込みプラグ |
-
1983
- 1983-09-30 JP JP18062383A patent/JPS6074507A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2020096099A1 (ko) * | 2018-11-09 | 2020-05-14 | 주식회사 루닛 | 기계 학습 방법 및 장치 |
US10922628B2 (en) | 2018-11-09 | 2021-02-16 | Lunit Inc. | Method and apparatus for machine learning |
Also Published As
Publication number | Publication date |
---|---|
JPS6074507A (ja) | 1985-04-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6089953A (ja) | 積層型半導体装置の製造方法 | |
JPH04320330A (ja) | 半導体装置のコンタクト部の形成方法 | |
JPS6163017A (ja) | 半導体薄膜結晶層の製造方法 | |
US5510642A (en) | Semiconductor device | |
JPS60150618A (ja) | 半導体装置の製造方法 | |
JPS62160712A (ja) | 半導体装置の製造方法 | |
JPS6362893B2 (enrdf_load_stackoverflow) | ||
JPS59155951A (ja) | 半導体装置の製造方法 | |
KR940004450B1 (ko) | 반도체장치의 제조방법 | |
JPS6240716A (ja) | 半導体装置の製造方法 | |
JPH01168050A (ja) | 積層型半導体装置 | |
JPH0355829A (ja) | 半導体装置の製造方法 | |
JPS63265464A (ja) | 半導体装置の製造方法 | |
JP2745055B2 (ja) | 単結晶半導体薄膜の製造方法 | |
JPH0257337B2 (enrdf_load_stackoverflow) | ||
JPS61117821A (ja) | 半導体装置の製造方法 | |
JPS63300510A (ja) | 積層型半導体装置 | |
JPS61113229A (ja) | 半導体薄膜結晶層の製造方法 | |
JP2569402B2 (ja) | 半導体薄膜結晶層の製造方法 | |
JPS59194422A (ja) | 半導体層の単結晶化方法 | |
JPS6079711A (ja) | 半導体装置の製造方法 | |
JPH0573324B2 (enrdf_load_stackoverflow) | ||
JPH0574706A (ja) | 単結晶半導体膜の製造方法 | |
JPH03250620A (ja) | 半導体装置の製造方法 | |
JPH0779078B2 (ja) | 半導体層の単結晶化方法 |