JPS625230B2 - - Google Patents
Info
- Publication number
- JPS625230B2 JPS625230B2 JP55108164A JP10816480A JPS625230B2 JP S625230 B2 JPS625230 B2 JP S625230B2 JP 55108164 A JP55108164 A JP 55108164A JP 10816480 A JP10816480 A JP 10816480A JP S625230 B2 JPS625230 B2 JP S625230B2
- Authority
- JP
- Japan
- Prior art keywords
- sih
- film
- grown
- vapor deposition
- chemical vapor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H10P14/6923—
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
- C23C16/5096—Flat-bed apparatus
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- H10P14/69215—
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- H10P14/6922—
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- H10P14/6336—
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Inorganic Chemistry (AREA)
- Formation Of Insulating Films (AREA)
- Surface Treatment Of Glass (AREA)
- Silicon Compounds (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55108164A JPS5747711A (en) | 1980-08-08 | 1980-08-08 | Chemical plasma growing method in vapor phase |
| EP81303589A EP0046059B1 (en) | 1980-08-08 | 1981-08-05 | Method of plasma enhanced chemical vapour deposition of films |
| DE8181303589T DE3172827D1 (en) | 1980-08-08 | 1981-08-05 | Method of plasma enhanced chemical vapour deposition of films |
| US06/290,978 US4394401A (en) | 1980-08-08 | 1981-08-07 | Method of plasma enhanced chemical vapor deposition of phosphosilicate glass film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55108164A JPS5747711A (en) | 1980-08-08 | 1980-08-08 | Chemical plasma growing method in vapor phase |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5747711A JPS5747711A (en) | 1982-03-18 |
| JPS625230B2 true JPS625230B2 (enExample) | 1987-02-03 |
Family
ID=14477587
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55108164A Granted JPS5747711A (en) | 1980-08-08 | 1980-08-08 | Chemical plasma growing method in vapor phase |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4394401A (enExample) |
| EP (1) | EP0046059B1 (enExample) |
| JP (1) | JPS5747711A (enExample) |
| DE (1) | DE3172827D1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0395922U (enExample) * | 1990-01-22 | 1991-09-30 |
Families Citing this family (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA1208162A (en) * | 1982-10-14 | 1986-07-22 | Dilip K. Nath | Plasma processed sinterable ceramics |
| JPH0614552B2 (ja) * | 1983-02-02 | 1994-02-23 | 富士ゼロックス株式会社 | 光電変換素子の製造方法 |
| US4557950A (en) * | 1984-05-18 | 1985-12-10 | Thermco Systems, Inc. | Process for deposition of borophosphosilicate glass |
| US4620986A (en) * | 1984-11-09 | 1986-11-04 | Intel Corporation | MOS rear end processing |
| US4651674A (en) * | 1984-11-16 | 1987-03-24 | Sony Corporation | Apparatus for vapor deposition |
| US4612207A (en) * | 1985-01-14 | 1986-09-16 | Xerox Corporation | Apparatus and process for the fabrication of large area thin film multilayers |
| US4759993A (en) * | 1985-04-25 | 1988-07-26 | Ovonic Synthetic Materials Co., Inc. | Plasma chemical vapor deposition SiO2-x coated articles and plasma assisted chemical vapor deposition method of applying the coating |
| CA1289512C (en) * | 1985-07-29 | 1991-09-24 | Vincent D. Cannella | Depositing an electrical insulator with unidirectional gas flow in series of chambers |
| JPS6260871A (ja) * | 1985-09-11 | 1987-03-17 | Anelva Corp | 真空化学反応装置 |
| EP0245290A1 (en) * | 1985-11-04 | 1987-11-19 | Motorola, Inc. | Glass intermetal dielectric |
| JPS6362879A (ja) * | 1986-09-02 | 1988-03-19 | Anelva Corp | 真空化学反応装置 |
| US5354695A (en) | 1992-04-08 | 1994-10-11 | Leedy Glenn J | Membrane dielectric isolation IC fabrication |
| JPH0828427B2 (ja) * | 1988-09-14 | 1996-03-21 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| JPH0339475A (ja) * | 1989-07-05 | 1991-02-20 | Hitachi Electron Eng Co Ltd | プラズマcvd装置における生成酸化膜の強化方法 |
| CA2006174A1 (en) * | 1989-12-20 | 1991-06-20 | Luc Ouellet | Method of making crack-free insulating films with sog interlayer |
| US6714625B1 (en) | 1992-04-08 | 2004-03-30 | Elm Technology Corporation | Lithography device for semiconductor circuit pattern generation |
| US5420437A (en) * | 1994-01-11 | 1995-05-30 | Siess; Harold E. | Method and apparatus for generation and implantation of ions |
| US6127261A (en) * | 1995-11-16 | 2000-10-03 | Advanced Micro Devices, Inc. | Method of fabricating an integrated circuit including a tri-layer pre-metal interlayer dielectric compatible with advanced CMOS technologies |
| KR100267418B1 (ko) * | 1995-12-28 | 2000-10-16 | 엔도 마코토 | 플라스마처리방법및플라스마처리장치 |
| US6345589B1 (en) | 1996-03-29 | 2002-02-12 | Applied Materials, Inc. | Method and apparatus for forming a borophosphosilicate film |
| US6013584A (en) * | 1997-02-19 | 2000-01-11 | Applied Materials, Inc. | Methods and apparatus for forming HDP-CVD PSG film used for advanced pre-metal dielectric layer applications |
| US5915167A (en) | 1997-04-04 | 1999-06-22 | Elm Technology Corporation | Three dimensional structure memory |
| US6551857B2 (en) | 1997-04-04 | 2003-04-22 | Elm Technology Corporation | Three dimensional structure integrated circuits |
| US6627305B1 (en) * | 1997-07-16 | 2003-09-30 | Koninklijke Philips Electronics N.V. | Substrates for large area electronic devices |
| US6073576A (en) | 1997-11-25 | 2000-06-13 | Cvc Products, Inc. | Substrate edge seal and clamp for low-pressure processing equipment |
| JP3818561B2 (ja) * | 1998-10-29 | 2006-09-06 | エルジー フィリップス エルシーディー カンパニー リミテッド | シリコン酸化膜の成膜方法および薄膜トランジスタの製造方法 |
| US6323141B1 (en) * | 2000-04-03 | 2001-11-27 | Taiwan Semiconductor Manufacturing Company | Method for forming anti-reflective coating layer with enhanced film thickness uniformity |
| US6748994B2 (en) * | 2001-04-11 | 2004-06-15 | Avery Dennison Corporation | Label applicator, method and label therefor |
| US20020182342A1 (en) * | 2001-04-13 | 2002-12-05 | Luc Ouellet | Optical quality silica films |
| US6887514B2 (en) * | 2001-05-31 | 2005-05-03 | Dalsa Semiconductor Inc. | Method of depositing optical films |
| US7208426B2 (en) * | 2001-11-13 | 2007-04-24 | Chartered Semiconductors Manufacturing Limited | Preventing plasma induced damage resulting from high density plasma deposition |
| WO2004015764A2 (en) | 2002-08-08 | 2004-02-19 | Leedy Glenn J | Vertical system integration |
| JP2004172389A (ja) | 2002-11-20 | 2004-06-17 | Renesas Technology Corp | 半導体装置およびその製造方法 |
| US7223706B2 (en) * | 2004-06-30 | 2007-05-29 | Intersil Americas, Inc. | Method for forming plasma enhanced deposited, fully oxidized PSG film |
| JP4711781B2 (ja) * | 2005-08-29 | 2011-06-29 | 京セラ株式会社 | 薄膜コンデンサの製造方法 |
| US7704897B2 (en) * | 2008-02-22 | 2010-04-27 | Applied Materials, Inc. | HDP-CVD SiON films for gap-fill |
| CN102584019B (zh) * | 2012-01-31 | 2014-07-02 | 绥中滨海经济区红杉科技有限公司 | 化学汽相沉积法镀制玻璃减反射膜的设备及方法 |
| JP6125176B2 (ja) * | 2012-08-27 | 2017-05-10 | シャープ株式会社 | 高透過率保護膜作製方法および半導体発光素子の製造方法 |
| FR3045033B1 (fr) * | 2015-12-09 | 2020-12-11 | Saint Gobain | Procede et installation pour l'obtention d'un vitrage colore |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4223048A (en) * | 1978-08-07 | 1980-09-16 | Pacific Western Systems | Plasma enhanced chemical vapor processing of semiconductive wafers |
| US4289797A (en) * | 1979-10-11 | 1981-09-15 | Western Electric Co., Incorporated | Method of depositing uniform films of Six Ny or Six Oy in a plasma reactor |
-
1980
- 1980-08-08 JP JP55108164A patent/JPS5747711A/ja active Granted
-
1981
- 1981-08-05 EP EP81303589A patent/EP0046059B1/en not_active Expired
- 1981-08-05 DE DE8181303589T patent/DE3172827D1/de not_active Expired
- 1981-08-07 US US06/290,978 patent/US4394401A/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0395922U (enExample) * | 1990-01-22 | 1991-09-30 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5747711A (en) | 1982-03-18 |
| DE3172827D1 (en) | 1985-12-12 |
| EP0046059A2 (en) | 1982-02-17 |
| EP0046059A3 (en) | 1983-01-05 |
| EP0046059B1 (en) | 1985-11-06 |
| US4394401A (en) | 1983-07-19 |
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