JPS6145390B2 - - Google Patents

Info

Publication number
JPS6145390B2
JPS6145390B2 JP58244089A JP24408983A JPS6145390B2 JP S6145390 B2 JPS6145390 B2 JP S6145390B2 JP 58244089 A JP58244089 A JP 58244089A JP 24408983 A JP24408983 A JP 24408983A JP S6145390 B2 JPS6145390 B2 JP S6145390B2
Authority
JP
Japan
Prior art keywords
impurity region
substrate
insulating film
gate electrode
groove
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58244089A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60136369A (ja
Inventor
Toshiharu Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP58244089A priority Critical patent/JPS60136369A/ja
Publication of JPS60136369A publication Critical patent/JPS60136369A/ja
Publication of JPS6145390B2 publication Critical patent/JPS6145390B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/63Vertical IGFETs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/01Manufacture or treatment
    • H10B12/02Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/03Making the capacitor or connections thereto
    • H10B12/038Making the capacitor or connections thereto the capacitor being in a trench in the substrate
    • H10B12/0383Making the capacitor or connections thereto the capacitor being in a trench in the substrate wherein the transistor is vertical
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/601Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs 
    • H10D30/608Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs  having non-planar bodies, e.g. having recessed gate electrodes

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
JP58244089A 1983-12-26 1983-12-26 半導体装置及びその製造方法 Granted JPS60136369A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58244089A JPS60136369A (ja) 1983-12-26 1983-12-26 半導体装置及びその製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58244089A JPS60136369A (ja) 1983-12-26 1983-12-26 半導体装置及びその製造方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP5040661A Division JPH0831576B2 (ja) 1993-02-05 1993-02-05 半導体装置及びその製造方法

Publications (2)

Publication Number Publication Date
JPS60136369A JPS60136369A (ja) 1985-07-19
JPS6145390B2 true JPS6145390B2 (enrdf_load_stackoverflow) 1986-10-07

Family

ID=17113571

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58244089A Granted JPS60136369A (ja) 1983-12-26 1983-12-26 半導体装置及びその製造方法

Country Status (1)

Country Link
JP (1) JPS60136369A (enrdf_load_stackoverflow)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0682803B2 (ja) * 1985-09-04 1994-10-19 日本電気株式会社 Mis型半導体記憶装置
US4751558A (en) * 1985-10-31 1988-06-14 International Business Machines Corporation High density memory with field shield
JPS63244683A (ja) * 1987-03-30 1988-10-12 Mitsubishi Electric Corp 電界効果型半導体装置およびその製造方法
JP2507502B2 (ja) * 1987-12-28 1996-06-12 三菱電機株式会社 半導体装置
JPH02130873A (ja) * 1988-11-10 1990-05-18 Nec Corp 半導体集積回路装置
US4954854A (en) * 1989-05-22 1990-09-04 International Business Machines Corporation Cross-point lightly-doped drain-source trench transistor and fabrication process therefor
JP2757491B2 (ja) * 1989-09-27 1998-05-25 日産自動車 株式会社 半導体装置の製造方法
JPH0482272A (ja) * 1990-07-25 1992-03-16 Semiconductor Energy Lab Co Ltd 絶縁ゲイト型電界効果半導体装置
JPH05206394A (ja) * 1992-01-24 1993-08-13 Mitsubishi Electric Corp 電界効果トランジスタおよびその製造方法
US5672524A (en) * 1995-08-01 1997-09-30 Advanced Micro Devices, Inc. Three-dimensional complementary field effect transistor process
US5763310A (en) * 1996-10-08 1998-06-09 Advanced Micro Devices, Inc. Integrated circuit employing simultaneously formed isolation and transistor trenches
JP3788022B2 (ja) * 1998-03-30 2006-06-21 セイコーエプソン株式会社 薄膜トランジスタおよびその製造方法
DE19845003C1 (de) * 1998-09-30 2000-02-10 Siemens Ag Vertikaler Feldeffekttransistor mit innenliegendem ringförmigen Gate und Herstellverfahren
JP2002184980A (ja) * 2000-10-05 2002-06-28 Fuji Electric Co Ltd トレンチ型ラテラルmosfetおよびその製造方法
JP2010219326A (ja) * 2009-03-17 2010-09-30 Elpida Memory Inc 半導体記憶装置及びその製造方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51147271A (en) * 1975-06-13 1976-12-17 Hitachi Ltd Semiconductor memory device

Also Published As

Publication number Publication date
JPS60136369A (ja) 1985-07-19

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