JPS613662U - 2次電子検出装置 - Google Patents
2次電子検出装置Info
- Publication number
- JPS613662U JPS613662U JP8685584U JP8685584U JPS613662U JP S613662 U JPS613662 U JP S613662U JP 8685584 U JP8685584 U JP 8685584U JP 8685584 U JP8685584 U JP 8685584U JP S613662 U JPS613662 U JP S613662U
- Authority
- JP
- Japan
- Prior art keywords
- secondary electron
- detector
- detection device
- electron
- optical axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8685584U JPS613662U (ja) | 1984-06-12 | 1984-06-12 | 2次電子検出装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8685584U JPS613662U (ja) | 1984-06-12 | 1984-06-12 | 2次電子検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS613662U true JPS613662U (ja) | 1986-01-10 |
JPH0535558Y2 JPH0535558Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-09-09 |
Family
ID=30638535
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8685584U Granted JPS613662U (ja) | 1984-06-12 | 1984-06-12 | 2次電子検出装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS613662U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0331956U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1989-08-07 | 1991-03-28 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5514683A (en) * | 1978-07-19 | 1980-02-01 | Jeol Ltd | Reflected electron detector for scan electronic microscope |
JPS5568059A (en) * | 1978-11-17 | 1980-05-22 | Jeol Ltd | Automatic position setter for reflective electron beam detector in scanning electronic microscope |
-
1984
- 1984-06-12 JP JP8685584U patent/JPS613662U/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5514683A (en) * | 1978-07-19 | 1980-02-01 | Jeol Ltd | Reflected electron detector for scan electronic microscope |
JPS5568059A (en) * | 1978-11-17 | 1980-05-22 | Jeol Ltd | Automatic position setter for reflective electron beam detector in scanning electronic microscope |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0331956U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1989-08-07 | 1991-03-28 |
Also Published As
Publication number | Publication date |
---|---|
JPH0535558Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-09-09 |