JPS5914196A - マイクロコンピユ−タの試験装置 - Google Patents

マイクロコンピユ−タの試験装置

Info

Publication number
JPS5914196A
JPS5914196A JP57121193A JP12119382A JPS5914196A JP S5914196 A JPS5914196 A JP S5914196A JP 57121193 A JP57121193 A JP 57121193A JP 12119382 A JP12119382 A JP 12119382A JP S5914196 A JPS5914196 A JP S5914196A
Authority
JP
Japan
Prior art keywords
microcomputer
program
test
address
rom
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57121193A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6349812B2 (enExample
Inventor
Hajime Aoki
肇 青木
Yoshitomo Nishimura
西村　致知
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP57121193A priority Critical patent/JPS5914196A/ja
Publication of JPS5914196A publication Critical patent/JPS5914196A/ja
Publication of JPS6349812B2 publication Critical patent/JPS6349812B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP57121193A 1982-07-14 1982-07-14 マイクロコンピユ−タの試験装置 Granted JPS5914196A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57121193A JPS5914196A (ja) 1982-07-14 1982-07-14 マイクロコンピユ−タの試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57121193A JPS5914196A (ja) 1982-07-14 1982-07-14 マイクロコンピユ−タの試験装置

Publications (2)

Publication Number Publication Date
JPS5914196A true JPS5914196A (ja) 1984-01-25
JPS6349812B2 JPS6349812B2 (enExample) 1988-10-05

Family

ID=14805160

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57121193A Granted JPS5914196A (ja) 1982-07-14 1982-07-14 マイクロコンピユ−タの試験装置

Country Status (1)

Country Link
JP (1) JPS5914196A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0767993A (ja) * 1990-02-26 1995-03-14 Maeng Sop ゴルフバッグ用スタンド

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5326545A (en) * 1976-08-24 1978-03-11 Toshiba Corp Checker for microc omputer
JPS5436151A (en) * 1977-08-26 1979-03-16 Nec Corp Test unit for micro computer system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5326545A (en) * 1976-08-24 1978-03-11 Toshiba Corp Checker for microc omputer
JPS5436151A (en) * 1977-08-26 1979-03-16 Nec Corp Test unit for micro computer system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0767993A (ja) * 1990-02-26 1995-03-14 Maeng Sop ゴルフバッグ用スタンド

Also Published As

Publication number Publication date
JPS6349812B2 (enExample) 1988-10-05

Similar Documents

Publication Publication Date Title
US4926425A (en) System for testing digital circuits
JPH0314033A (ja) マイクロプロセッサ比較チェック機能の検査方式
JPH10171677A (ja) マイクロプロセッサおよびその検査方法
JPS5914196A (ja) マイクロコンピユ−タの試験装置
JPH0145034B2 (enExample)
US6490694B1 (en) Electronic test system for microprocessor based boards
JP2006510156A (ja) 検査中におけるメモリ冗長部分の使用可能化
JPH0257676B2 (enExample)
US5805606A (en) Cache module fault isolation techniques
JPH1186593A (ja) 集積回路試験装置
JPH0342747A (ja) メモリ試験方式
JP3550636B2 (ja) Ｉｃ試験装置
JP2822738B2 (ja) 半導体ｉｃの検査方法
JPH0399326A (ja) マイクロプログラムローデイング方法とローデイング制御装置と情報処理装置と情報処理システム
JP3482788B2 (ja) 故障診断方法
JPH03265037A (ja) 大容量メモリ初期診断制御方式
JP3519563B2 (ja) 半導体記憶装置の試験方法およびその試験装置およびその試験システム
JPS59123056A (ja) 冗長機能自動切替システム
JP2000040390A (ja) バーンイン装置
JPS63250575A (ja) プリント基板の試験装置
JPS636471A (ja) 論理集積回路
JPS6283676A (ja) Ｉｃ試験方式
JPH01216437A (ja) 情報処理装置の試験方法
JPH08315597A (ja) Ｉｃ試験装置
JPH06208479A (ja) 情報処理装置の診断方式