JPS58100437A - Ｌｓｉのチエツク方法 - Google Patents

Ｌｓｉのチエツク方法

Info

Publication number
JPS58100437A
JPS58100437A JP56197748A JP19774881A JPS58100437A JP S58100437 A JPS58100437 A JP S58100437A JP 56197748 A JP56197748 A JP 56197748A JP 19774881 A JP19774881 A JP 19774881A JP S58100437 A JPS58100437 A JP S58100437A
Authority
JP
Japan
Prior art keywords
signal
circuit
output
check
lsi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56197748A
Other languages
English (en)
Japanese (ja)
Other versions
JPH039428B2 (enrdf_load_stackoverflow
Inventor
Fumio Nakamura
文夫 中村
Kiyoshi Katsumata
勝又　清
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP56197748A priority Critical patent/JPS58100437A/ja
Publication of JPS58100437A publication Critical patent/JPS58100437A/ja
Publication of JPH039428B2 publication Critical patent/JPH039428B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP56197748A 1981-12-10 1981-12-10 Ｌｓｉのチエツク方法 Granted JPS58100437A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56197748A JPS58100437A (ja) 1981-12-10 1981-12-10 Ｌｓｉのチエツク方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56197748A JPS58100437A (ja) 1981-12-10 1981-12-10 Ｌｓｉのチエツク方法

Publications (2)

Publication Number Publication Date
JPS58100437A true JPS58100437A (ja) 1983-06-15
JPH039428B2 JPH039428B2 (enrdf_load_stackoverflow) 1991-02-08

Family

ID=16379681

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56197748A Granted JPS58100437A (ja) 1981-12-10 1981-12-10 Ｌｓｉのチエツク方法

Country Status (1)

Country Link
JP (1) JPS58100437A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61264273A (ja) * 1985-05-17 1986-11-22 Matsushita Electronics Corp 集積回路
US4752729A (en) * 1986-07-01 1988-06-21 Texas Instruments Incorporated Test circuit for VSLI integrated circuits
JPH02135540A (ja) * 1988-11-16 1990-05-24 Rohm Co Ltd データ処理装置のテスト方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61264273A (ja) * 1985-05-17 1986-11-22 Matsushita Electronics Corp 集積回路
US4752729A (en) * 1986-07-01 1988-06-21 Texas Instruments Incorporated Test circuit for VSLI integrated circuits
JPH02135540A (ja) * 1988-11-16 1990-05-24 Rohm Co Ltd データ処理装置のテスト方法

Also Published As

Publication number Publication date
JPH039428B2 (enrdf_load_stackoverflow) 1991-02-08

Similar Documents

Publication Publication Date Title
US4964074A (en) In-circuit emulator
JP2946658B2 (ja) フリップフロップ回路
JPS58100437A (ja) Ｌｓｉのチエツク方法
JP2505032B2 (ja) 半導体集積回路
JPH02117205A (ja) スキヤンラツチ回路
JPH0644031B2 (ja) テスト回路
JPH0455774A (ja) 同期型ｆｆ間のオーバディレイテスト方式
JPH1038977A (ja) 統合化集積回路
JP2838599B2 (ja) テスト容易化回路
JPH02118475A (ja) 論理集積回路
JP2558819B2 (ja) 半田付不良検査用テスト回路を有する多ピンｌｓｉ
JPH03279880A (ja) 検査機能付集積回路素子
JPS6248862B2 (enrdf_load_stackoverflow)
JPS6173075A (ja) Ｌｓｉ論理状態抽出方式
JPS60174963A (ja) 電子パツケ−ジ試験回路
JPH02205109A (ja) スキヤンラッチ回路
JPH02130641A (ja) 擬似障害設定方式
JPH0566248A (ja) ３ステート回路のピンスキヤンイン方式
JPS61280116A (ja) 位相比較回路
KR100604785B1 (ko) 바운더리 스캔 셀을 구비하는 집적회로 장치
JPH03212947A (ja) Ｉｃパッケージ
JPH04176164A (ja) 半導体集積回路
JPH0746123B2 (ja) 集積回路の試験方式
JPS63132185A (ja) 入力回路装置
JPH0573350A (ja) 副入出力端子を有するマイクロ・プロセツサ