JPS5727041A - Large-scale integrated circuit having testing function - Google Patents

Large-scale integrated circuit having testing function

Info

Publication number
JPS5727041A
JPS5727041A JP10112180A JP10112180A JPS5727041A JP S5727041 A JPS5727041 A JP S5727041A JP 10112180 A JP10112180 A JP 10112180A JP 10112180 A JP10112180 A JP 10112180A JP S5727041 A JPS5727041 A JP S5727041A
Authority
JP
Japan
Prior art keywords
test
register
latch
designating
mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10112180A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6331935B2 (enrdf_load_stackoverflow
Inventor
Shigeaki Yoshida
Yoshinori Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Renesas Eastern Japan Semiconductor Inc
Original Assignee
Hitachi Tokyo Electronics Co Ltd
Hitachi Ltd
Hitachi Ome Electronic Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Tokyo Electronics Co Ltd, Hitachi Ltd, Hitachi Ome Electronic Co Ltd filed Critical Hitachi Tokyo Electronics Co Ltd
Priority to JP10112180A priority Critical patent/JPS5727041A/ja
Publication of JPS5727041A publication Critical patent/JPS5727041A/ja
Publication of JPS6331935B2 publication Critical patent/JPS6331935B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP10112180A 1980-07-25 1980-07-25 Large-scale integrated circuit having testing function Granted JPS5727041A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10112180A JPS5727041A (en) 1980-07-25 1980-07-25 Large-scale integrated circuit having testing function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10112180A JPS5727041A (en) 1980-07-25 1980-07-25 Large-scale integrated circuit having testing function

Publications (2)

Publication Number Publication Date
JPS5727041A true JPS5727041A (en) 1982-02-13
JPS6331935B2 JPS6331935B2 (enrdf_load_stackoverflow) 1988-06-27

Family

ID=14292236

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10112180A Granted JPS5727041A (en) 1980-07-25 1980-07-25 Large-scale integrated circuit having testing function

Country Status (1)

Country Link
JP (1) JPS5727041A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58222500A (ja) * 1982-04-20 1983-12-24 マステク・コ−パレイシヤン 選択機能モ−ド開始方法
JPS6356741A (ja) * 1986-08-28 1988-03-11 Nec Corp テスト回路
JPH0389182A (ja) * 1989-08-31 1991-04-15 Sharp Corp 集積回路装置
JP2015156196A (ja) * 2014-02-21 2015-08-27 株式会社デンソー マイクロコンピュータ
CN110941218A (zh) * 2019-12-10 2020-03-31 北京振兴计量测试研究所 一种can总线控制器测试方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5264749U (enrdf_load_stackoverflow) * 1975-11-07 1977-05-13
JPS56162849A (en) * 1980-05-20 1981-12-15 Fujitsu Ltd Integrated circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5264749U (enrdf_load_stackoverflow) * 1975-11-07 1977-05-13
JPS56162849A (en) * 1980-05-20 1981-12-15 Fujitsu Ltd Integrated circuit

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58222500A (ja) * 1982-04-20 1983-12-24 マステク・コ−パレイシヤン 選択機能モ−ド開始方法
JPS6356741A (ja) * 1986-08-28 1988-03-11 Nec Corp テスト回路
JPH0389182A (ja) * 1989-08-31 1991-04-15 Sharp Corp 集積回路装置
JP2015156196A (ja) * 2014-02-21 2015-08-27 株式会社デンソー マイクロコンピュータ
CN110941218A (zh) * 2019-12-10 2020-03-31 北京振兴计量测试研究所 一种can总线控制器测试方法
CN110941218B (zh) * 2019-12-10 2021-02-26 北京振兴计量测试研究所 一种can总线控制器测试方法

Also Published As

Publication number Publication date
JPS6331935B2 (enrdf_load_stackoverflow) 1988-06-27

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