JPS57128938A - Device for measuring characteristic of semiconductor - Google Patents

Device for measuring characteristic of semiconductor

Info

Publication number
JPS57128938A
JPS57128938A JP1546681A JP1546681A JPS57128938A JP S57128938 A JPS57128938 A JP S57128938A JP 1546681 A JP1546681 A JP 1546681A JP 1546681 A JP1546681 A JP 1546681A JP S57128938 A JPS57128938 A JP S57128938A
Authority
JP
Japan
Prior art keywords
adapter
transistors
circuit substrate
panel
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1546681A
Other languages
Japanese (ja)
Inventor
Kazuo Noguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamagata Ltd
Original Assignee
NEC Yamagata Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamagata Ltd filed Critical NEC Yamagata Ltd
Priority to JP1546681A priority Critical patent/JPS57128938A/en
Publication of JPS57128938A publication Critical patent/JPS57128938A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To perform various characteristic tests of transistors simply, by providing an adapter between a circuit substrate on which testing transistors are mounted and a panel having connecting terminals, and appropriately establishing wirings on the adapter. CONSTITUTION:The circuit substrate (d) having connecting terminals 101-136 is prepared and the transistors are mounted. In this example, 12 transistors can be mounted. Then the panel P having 36 connecting teminals 1-36 is prepared. The terminals of the circuit substrate (d) and the panel P are connected via the adapter A. The wirings between the connecting terminals 201-236 and 301-336 provided on both sides of the adapter A are appropriately established. For example, in the case the characteristics of the transistors are measured by connecting the circuit substrate (d) to the panel P by using the adapter A as shown in the Figure, other characteristic tests can be performed if the circuit substrate (d) and the adapter A are turned over and connected.
JP1546681A 1981-02-04 1981-02-04 Device for measuring characteristic of semiconductor Pending JPS57128938A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1546681A JPS57128938A (en) 1981-02-04 1981-02-04 Device for measuring characteristic of semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1546681A JPS57128938A (en) 1981-02-04 1981-02-04 Device for measuring characteristic of semiconductor

Publications (1)

Publication Number Publication Date
JPS57128938A true JPS57128938A (en) 1982-08-10

Family

ID=11889572

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1546681A Pending JPS57128938A (en) 1981-02-04 1981-02-04 Device for measuring characteristic of semiconductor

Country Status (1)

Country Link
JP (1) JPS57128938A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58106944U (en) * 1982-01-14 1983-07-21 日本電子材料株式会社 probe card
JPS63289826A (en) * 1987-05-21 1988-11-28 Tokyo Electron Ltd Probe card and inspection using the same
JPH0377342A (en) * 1989-08-18 1991-04-02 Matsushita Electron Corp Apparatus and method for inspecting semiconductor integrated circuit

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5532240A (en) * 1978-08-25 1980-03-06 Matsushita Electric Ind Co Ltd Reproducing device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5532240A (en) * 1978-08-25 1980-03-06 Matsushita Electric Ind Co Ltd Reproducing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58106944U (en) * 1982-01-14 1983-07-21 日本電子材料株式会社 probe card
JPS63289826A (en) * 1987-05-21 1988-11-28 Tokyo Electron Ltd Probe card and inspection using the same
JPH0377342A (en) * 1989-08-18 1991-04-02 Matsushita Electron Corp Apparatus and method for inspecting semiconductor integrated circuit

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