JPS57128938A - Device for measuring characteristic of semiconductor - Google Patents
Device for measuring characteristic of semiconductorInfo
- Publication number
- JPS57128938A JPS57128938A JP1546681A JP1546681A JPS57128938A JP S57128938 A JPS57128938 A JP S57128938A JP 1546681 A JP1546681 A JP 1546681A JP 1546681 A JP1546681 A JP 1546681A JP S57128938 A JPS57128938 A JP S57128938A
- Authority
- JP
- Japan
- Prior art keywords
- adapter
- transistors
- circuit substrate
- panel
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE:To perform various characteristic tests of transistors simply, by providing an adapter between a circuit substrate on which testing transistors are mounted and a panel having connecting terminals, and appropriately establishing wirings on the adapter. CONSTITUTION:The circuit substrate (d) having connecting terminals 101-136 is prepared and the transistors are mounted. In this example, 12 transistors can be mounted. Then the panel P having 36 connecting teminals 1-36 is prepared. The terminals of the circuit substrate (d) and the panel P are connected via the adapter A. The wirings between the connecting terminals 201-236 and 301-336 provided on both sides of the adapter A are appropriately established. For example, in the case the characteristics of the transistors are measured by connecting the circuit substrate (d) to the panel P by using the adapter A as shown in the Figure, other characteristic tests can be performed if the circuit substrate (d) and the adapter A are turned over and connected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1546681A JPS57128938A (en) | 1981-02-04 | 1981-02-04 | Device for measuring characteristic of semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1546681A JPS57128938A (en) | 1981-02-04 | 1981-02-04 | Device for measuring characteristic of semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57128938A true JPS57128938A (en) | 1982-08-10 |
Family
ID=11889572
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1546681A Pending JPS57128938A (en) | 1981-02-04 | 1981-02-04 | Device for measuring characteristic of semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57128938A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58106944U (en) * | 1982-01-14 | 1983-07-21 | 日本電子材料株式会社 | probe card |
JPS63289826A (en) * | 1987-05-21 | 1988-11-28 | Tokyo Electron Ltd | Probe card and inspection using the same |
JPH0377342A (en) * | 1989-08-18 | 1991-04-02 | Matsushita Electron Corp | Apparatus and method for inspecting semiconductor integrated circuit |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5532240A (en) * | 1978-08-25 | 1980-03-06 | Matsushita Electric Ind Co Ltd | Reproducing device |
-
1981
- 1981-02-04 JP JP1546681A patent/JPS57128938A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5532240A (en) * | 1978-08-25 | 1980-03-06 | Matsushita Electric Ind Co Ltd | Reproducing device |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58106944U (en) * | 1982-01-14 | 1983-07-21 | 日本電子材料株式会社 | probe card |
JPS63289826A (en) * | 1987-05-21 | 1988-11-28 | Tokyo Electron Ltd | Probe card and inspection using the same |
JPH0377342A (en) * | 1989-08-18 | 1991-04-02 | Matsushita Electron Corp | Apparatus and method for inspecting semiconductor integrated circuit |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
MY112140A (en) | Jig for measuring the characteristics of a semiconductor, manufacturing method for the same, and usage of the same | |
JPS57128938A (en) | Device for measuring characteristic of semiconductor | |
JPS57186351A (en) | Semiconductor device | |
AU8975182A (en) | Pin electronic interface circuit in test equipment | |
JPS5727041A (en) | Large-scale integrated circuit having testing function | |
JPS5619634A (en) | Semiconductor device | |
JPS5444480A (en) | Package for integrated circuit | |
JPS5788759A (en) | Wiring method for active matrix substrate | |
JPS5745942A (en) | Semiconductor integrated circuit device | |
JPS55153353A (en) | Semiconductor device | |
JPS52128071A (en) | Automatic test unit | |
JPS56138934A (en) | Testing device | |
JPS6467931A (en) | Integrated circuit | |
JPS52115188A (en) | Prober | |
JPS5692474A (en) | Aging tester of ic | |
JPS60113165A (en) | Burn-in device of semiconductor element | |
JPS57115843A (en) | Testing device for wafer | |
JPS6473629A (en) | Semiconductor integrated circuit | |
JPS56115965A (en) | Testing method for semiconductor integrated circuit device | |
JPS5715435A (en) | Substrate for semiconductor device | |
JPS6415675A (en) | Circuit for testing integrated circuit | |
JPS5742158A (en) | Semiconductor integrated circuit | |
JPS5245234A (en) | Device for testing circuit | |
JPS6484630A (en) | Measuring jig for semiconductor integrated circuit | |
JPS648639A (en) | Semiconductor chip |