JPS6467931A - Integrated circuit - Google Patents

Integrated circuit

Info

Publication number
JPS6467931A
JPS6467931A JP22601187A JP22601187A JPS6467931A JP S6467931 A JPS6467931 A JP S6467931A JP 22601187 A JP22601187 A JP 22601187A JP 22601187 A JP22601187 A JP 22601187A JP S6467931 A JPS6467931 A JP S6467931A
Authority
JP
Japan
Prior art keywords
integrated circuit
transistor
circuit
terminal
check
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22601187A
Other languages
Japanese (ja)
Other versions
JPH0666372B2 (en
Inventor
Kazutoshi Watanabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62226011A priority Critical patent/JPH0666372B2/en
Publication of JPS6467931A publication Critical patent/JPS6467931A/en
Publication of JPH0666372B2 publication Critical patent/JPH0666372B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To automatically measure an integrated circuit by means of a circuit tester by connecting the terminal of a check transistor formed on the same substrate to the bonding pad of the integrated circuit. CONSTITUTION:A check transistor 3 and a resistance measuring pattern 4 are disposed between a plurality of bonding pads (BP) 2, 2,... provided along the side of an integrated circuit substrate 1, and the terminals of the transistor 3 and the pattern 4 are connected by wirings 5 to the BP 2, 2,... Thus, not only the circuit characteristics of the integrated circuit but transistor characteristics can be automatically inspected in the step of inspecting a wafer by a circuit tester in a structure in which the terminal of the transistor is connected to the B.P.
JP62226011A 1987-09-08 1987-09-08 Integrated circuit Expired - Lifetime JPH0666372B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62226011A JPH0666372B2 (en) 1987-09-08 1987-09-08 Integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62226011A JPH0666372B2 (en) 1987-09-08 1987-09-08 Integrated circuit

Publications (2)

Publication Number Publication Date
JPS6467931A true JPS6467931A (en) 1989-03-14
JPH0666372B2 JPH0666372B2 (en) 1994-08-24

Family

ID=16838389

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62226011A Expired - Lifetime JPH0666372B2 (en) 1987-09-08 1987-09-08 Integrated circuit

Country Status (1)

Country Link
JP (1) JPH0666372B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05121515A (en) * 1991-10-30 1993-05-18 Fujitsu Ltd Semiconductor integrated circuit

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6380546A (en) * 1986-09-25 1988-04-11 Agency Of Ind Science & Technol Semiconductor integrated circuit device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6380546A (en) * 1986-09-25 1988-04-11 Agency Of Ind Science & Technol Semiconductor integrated circuit device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05121515A (en) * 1991-10-30 1993-05-18 Fujitsu Ltd Semiconductor integrated circuit

Also Published As

Publication number Publication date
JPH0666372B2 (en) 1994-08-24

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