JPS6415675A - Circuit for testing integrated circuit - Google Patents
Circuit for testing integrated circuitInfo
- Publication number
- JPS6415675A JPS6415675A JP62171078A JP17107887A JPS6415675A JP S6415675 A JPS6415675 A JP S6415675A JP 62171078 A JP62171078 A JP 62171078A JP 17107887 A JP17107887 A JP 17107887A JP S6415675 A JPS6415675 A JP S6415675A
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- integrated circuit
- circuit
- data
- control signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE:To reduce the number of parts and to simply perform a test, by providing the external input terminal connected to a testing control signal input terminal and the resistor connected to the control signal input terminal at one terminal thereof and earthed at the other terminal thereof. CONSTITUTION:An integrated circuit 6 to be tested is mounted on a unit 8 and a control signal input terminal 4 is connected to the terminal 3 of a connector 10. When the integrated circuit 6 is operated in a usual mode, the terminal 3 of the connector 3 is opened. By this method, a signal of logic 0 is inputted to the terminal 4 by a resistor 9 and the data of a terminal 1 is outputted to a terminal 7. When a test mode is set in order to test the integrated circuit 6, voltage of +5V is applied to the terminal. By this setup a signal of logic 1 is inputted to the terminal 4 and the data of the terminal is outputted to the terminal 7. The data of the terminal 7 is investigated to judge whether the integrated circuit 6 is normal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62171078A JPS6415675A (en) | 1987-07-10 | 1987-07-10 | Circuit for testing integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62171078A JPS6415675A (en) | 1987-07-10 | 1987-07-10 | Circuit for testing integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6415675A true JPS6415675A (en) | 1989-01-19 |
Family
ID=15916607
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62171078A Pending JPS6415675A (en) | 1987-07-10 | 1987-07-10 | Circuit for testing integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6415675A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6127788A (en) * | 1997-05-15 | 2000-10-03 | Denso Corporation | High voltage discharge lamp device |
US6747422B2 (en) | 1997-05-16 | 2004-06-08 | Denso Corporation | High-voltage discharge lamp device |
-
1987
- 1987-07-10 JP JP62171078A patent/JPS6415675A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6127788A (en) * | 1997-05-15 | 2000-10-03 | Denso Corporation | High voltage discharge lamp device |
US6333607B1 (en) | 1997-05-16 | 2001-12-25 | Denso Corporation | High voltage discharge lamp device |
US6747422B2 (en) | 1997-05-16 | 2004-06-08 | Denso Corporation | High-voltage discharge lamp device |
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