JPS57211076A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPS57211076A
JPS57211076A JP56095356A JP9535681A JPS57211076A JP S57211076 A JPS57211076 A JP S57211076A JP 56095356 A JP56095356 A JP 56095356A JP 9535681 A JP9535681 A JP 9535681A JP S57211076 A JPS57211076 A JP S57211076A
Authority
JP
Japan
Prior art keywords
output
circuit
control line
integrated circuit
semiconductor integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56095356A
Other languages
Japanese (ja)
Inventor
Yoshikazu Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Microcomputer System Ltd
Hitachi Ltd
Original Assignee
Hitachi Ltd
Hitachi Microcomputer Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Microcomputer Engineering Ltd filed Critical Hitachi Ltd
Priority to JP56095356A priority Critical patent/JPS57211076A/en
Publication of JPS57211076A publication Critical patent/JPS57211076A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To set easily the output voltage at a desired level, by separating an output circuit from an internal logical circuit with an external control signal and applying other external signals to the output circuit. CONSTITUTION:A high level of control voltage is applied to a pad 4 to perform a test of the output circuits 7-1-7-n. In this case, a control line 9 is set at a high level, and a control line 9-1 is set at a low level by an inverter 21. Then the MOSFET20-3 and 20-4 are turned on with 20-1 and 20-2 turned off respectively. Thus a control line 8 is connectd to the input terminal of an output terminal 7-1 via a circuit 30-1. As a result, both the output voltage and output current levels can be tested for the circuits 7-1-7-n based on the control signal applied to a pad 3 not by the output signal of an internal logical circuit 2.
JP56095356A 1981-06-22 1981-06-22 Semiconductor integrated circuit device Pending JPS57211076A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56095356A JPS57211076A (en) 1981-06-22 1981-06-22 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56095356A JPS57211076A (en) 1981-06-22 1981-06-22 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPS57211076A true JPS57211076A (en) 1982-12-24

Family

ID=14135365

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56095356A Pending JPS57211076A (en) 1981-06-22 1981-06-22 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS57211076A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6219776A (en) * 1985-07-18 1987-01-28 Toshiba Corp Test circuit

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5213915A (en) * 1975-07-19 1977-02-02 Oki Electric Ind Co Ltd Endless ink ribbon

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5213915A (en) * 1975-07-19 1977-02-02 Oki Electric Ind Co Ltd Endless ink ribbon

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6219776A (en) * 1985-07-18 1987-01-28 Toshiba Corp Test circuit

Similar Documents

Publication Publication Date Title
DE69028435D1 (en) Integrated circuit with test circuit
IE823102L (en) Test circuit
DE3686989D1 (en) REDUCING NOISE DURING CHECKING INTEGRATED CIRCUIT CHIPS.
JPS57211076A (en) Semiconductor integrated circuit device
JPS57186351A (en) Semiconductor device
JPS5783922A (en) Delay circuit
JPS552956A (en) Automatic wiring tester
JPS5745942A (en) Semiconductor integrated circuit device
JPS6428937A (en) Integrated circuit
JPS57111714A (en) Integrated circuit
JPS5535574A (en) Logic device
JPS57178542A (en) Integrated circuit
DE3786178D1 (en) CIRCUIT FOR ADJUSTING THE SIGNAL DELAY TIMES.
JPS57128938A (en) Device for measuring characteristic of semiconductor
JPS6415675A (en) Circuit for testing integrated circuit
JPS5793730A (en) Signal level conversion circuit
JPS5779457A (en) Voltage comparing circuit
JPS6486073A (en) Power-factor variable type electron load apparatus
JPH03115873A (en) Semiconductor integrated circuit
JPS6467800A (en) Nonvolatile semiconductor memory device
JPS55154473A (en) Low voltage distribution line phase detecting system
JPS5678230A (en) Analog signal selecting circuit
JPS5745471A (en) Testing circuit for semiconductor integrated circuit
JPS54111863A (en) Electronic watch
JPS5576449A (en) Fault diagnosis method for signal converter circuit