JPS57178542A - Integrated circuit - Google Patents
Integrated circuitInfo
- Publication number
- JPS57178542A JPS57178542A JP56064686A JP6468681A JPS57178542A JP S57178542 A JPS57178542 A JP S57178542A JP 56064686 A JP56064686 A JP 56064686A JP 6468681 A JP6468681 A JP 6468681A JP S57178542 A JPS57178542 A JP S57178542A
- Authority
- JP
- Japan
- Prior art keywords
- signals
- pin
- integrated circuit
- circuit
- inputted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
- Logic Circuits (AREA)
Abstract
PURPOSE:To increase the rate of defective detection by providing a control pin and gate circuits, and setting logical values of some or all of input and output signals in an integrated circuit to 0 or 1 fixedly. CONSTITUTION:To gate circuits 41...4n, output signals 21...2n from another circuit 2 are inputted. An integrated circuit 1 is provided with a control pin 3, and a control signal 31 inputted from the pin 3 is inputted to the circuits 41...4n in common. The circuits 41...4n ANDs the signals 21...2n, and signal 31 to send out output signals 411...4n1. Those signals are connected to the output pins 51...5n of the circuit 1. When a voltage having a level ''0'' is applied to the pin 3, voltages with the ''0'' are developed at the pins 51...5n. When a voltage having a ''1'' is applied to the pin 3, on the other hand, signals voltages of signals 21...2n of the circuit 2 are developed at the pins 51...5n. Thus, the rate of defective detection is improved.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56064686A JPS57178542A (en) | 1981-04-28 | 1981-04-28 | Integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56064686A JPS57178542A (en) | 1981-04-28 | 1981-04-28 | Integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57178542A true JPS57178542A (en) | 1982-11-02 |
Family
ID=13265278
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56064686A Pending JPS57178542A (en) | 1981-04-28 | 1981-04-28 | Integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57178542A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5897843A (en) * | 1981-12-08 | 1983-06-10 | Hitachi Ltd | Integrated circuit |
JPS6034027A (en) * | 1983-08-04 | 1985-02-21 | Nec Corp | Semiconductor device |
-
1981
- 1981-04-28 JP JP56064686A patent/JPS57178542A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5897843A (en) * | 1981-12-08 | 1983-06-10 | Hitachi Ltd | Integrated circuit |
JPH0221146B2 (en) * | 1981-12-08 | 1990-05-11 | Hitachi Ltd | |
JPS6034027A (en) * | 1983-08-04 | 1985-02-21 | Nec Corp | Semiconductor device |
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