JPS5787150A - Large-scale integrated circuit - Google Patents

Large-scale integrated circuit

Info

Publication number
JPS5787150A
JPS5787150A JP16364080A JP16364080A JPS5787150A JP S5787150 A JPS5787150 A JP S5787150A JP 16364080 A JP16364080 A JP 16364080A JP 16364080 A JP16364080 A JP 16364080A JP S5787150 A JPS5787150 A JP S5787150A
Authority
JP
Japan
Prior art keywords
test
output
pins
circuit
level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16364080A
Other languages
Japanese (ja)
Other versions
JPS645461B2 (en
Inventor
Kazuo Nomura
Takanori Senoo
Yoriyasu Takeguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP16364080A priority Critical patent/JPS5787150A/en
Publication of JPS5787150A publication Critical patent/JPS5787150A/en
Publication of JPS645461B2 publication Critical patent/JPS645461B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Abstract

PURPOSE:To easily perform the DC test of LSI for the subject integrated circuit by a method wheren a mode is designated by sending a switching signal to a plurality of output switching circuits from a decoder, and a signal, with which the logical level of output buffer will be given, is outputted to one of the input terminals. CONSTITUTION:On the LSI with a testing circuit such as a logical operation function and the like, a test mode decoding circuit 16, output signal switching circuits 17-19 to be connected to output buffers 12-14 which output signals to pins 5-7 and input buffers 8-17, for which signals sent from pins 1-4 are inputted, are provided. When a normal operation is performed, signals are inputted to the pin 1, the results of an arithmetic operation are outputted to the pins 5-7, but the control signals A and B of a circuit 15 are turned to L-level. When a DC test is performed, the output E of the circuit 15 is set at H-level, and the signal of the logical level identical to the pin 4 is outputted to the pins 5-7. Also, in the functional test, the combination of logical levels of the pins 2 and 3 is made separately from the DC tset, and the test is performed by giving the H level to the output C or D of the circuit 15. Through these procedures, the DC test can be simplified, and the number of test modes can also be increased by increasing the number of control terminals (pins 2 and 3).
JP16364080A 1980-11-19 1980-11-19 Large-scale integrated circuit Granted JPS5787150A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16364080A JPS5787150A (en) 1980-11-19 1980-11-19 Large-scale integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16364080A JPS5787150A (en) 1980-11-19 1980-11-19 Large-scale integrated circuit

Publications (2)

Publication Number Publication Date
JPS5787150A true JPS5787150A (en) 1982-05-31
JPS645461B2 JPS645461B2 (en) 1989-01-30

Family

ID=15777777

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16364080A Granted JPS5787150A (en) 1980-11-19 1980-11-19 Large-scale integrated circuit

Country Status (1)

Country Link
JP (1) JPS5787150A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58145140A (en) * 1982-02-23 1983-08-29 Nec Corp Semiconductor characteristic measuring device
JPS604232A (en) * 1983-06-22 1985-01-10 Toshiba Corp Method for designating test mode of lsi
JPS6081836A (en) * 1983-10-07 1985-05-09 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション Integrated circuit logic chip
JPS60150662A (en) * 1984-01-18 1985-08-08 Hitachi Ltd Semiconductor integrated logic device
JPS63301553A (en) * 1987-05-30 1988-12-08 Toshiba Corp Semiconductor integrated circuit device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02106849U (en) * 1989-02-09 1990-08-24

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58145140A (en) * 1982-02-23 1983-08-29 Nec Corp Semiconductor characteristic measuring device
JPS604232A (en) * 1983-06-22 1985-01-10 Toshiba Corp Method for designating test mode of lsi
JPS6081836A (en) * 1983-10-07 1985-05-09 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション Integrated circuit logic chip
JPH0533540B2 (en) * 1983-10-07 1993-05-19 Intaanashonaru Bijinesu Mashiinzu Corp
JPS60150662A (en) * 1984-01-18 1985-08-08 Hitachi Ltd Semiconductor integrated logic device
JPS63301553A (en) * 1987-05-30 1988-12-08 Toshiba Corp Semiconductor integrated circuit device

Also Published As

Publication number Publication date
JPS645461B2 (en) 1989-01-30

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