KR970008085B1 - Test method for semiconductor - Google Patents

Test method for semiconductor Download PDF

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Publication number
KR970008085B1
KR970008085B1 KR89019064A KR890019064A KR970008085B1 KR 970008085 B1 KR970008085 B1 KR 970008085B1 KR 89019064 A KR89019064 A KR 89019064A KR 890019064 A KR890019064 A KR 890019064A KR 970008085 B1 KR970008085 B1 KR 970008085B1
Authority
KR
South Korea
Prior art keywords
quality
test
bad
function
semiconductor device
Prior art date
Application number
KR89019064A
Other languages
Korean (ko)
Other versions
KR910012743A (en
Inventor
Byung-Jo Kwon
Original Assignee
Lg Semicon Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lg Semicon Co Ltd filed Critical Lg Semicon Co Ltd
Priority to KR89019064A priority Critical patent/KR970008085B1/en
Publication of KR910012743A publication Critical patent/KR910012743A/en
Application granted granted Critical
Publication of KR970008085B1 publication Critical patent/KR970008085B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The method is characterized by including the steps of: connecting each input pin of a semiconductor device to a test driver(T1), and applying a signal according to a function test input level(VIH, VIL) of High/Low state to the test driver(T1); determining good quality/bad quality by inputting an output level according to the function test input level outputted from the semiconductor device to a CPU; and passing open/short test in case of good quality, and otherwise determining whether a bad function quality or bad open/short quality.
KR89019064A 1989-12-20 1989-12-20 Test method for semiconductor KR970008085B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR89019064A KR970008085B1 (en) 1989-12-20 1989-12-20 Test method for semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR89019064A KR970008085B1 (en) 1989-12-20 1989-12-20 Test method for semiconductor

Publications (2)

Publication Number Publication Date
KR910012743A KR910012743A (en) 1991-08-08
KR970008085B1 true KR970008085B1 (en) 1997-05-20

Family

ID=19293259

Family Applications (1)

Application Number Title Priority Date Filing Date
KR89019064A KR970008085B1 (en) 1989-12-20 1989-12-20 Test method for semiconductor

Country Status (1)

Country Link
KR (1) KR970008085B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100988610B1 (en) * 2010-01-13 2010-10-18 주식회사 드리미 Tester and method for inspecting open/short of semiconductor chip

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100988610B1 (en) * 2010-01-13 2010-10-18 주식회사 드리미 Tester and method for inspecting open/short of semiconductor chip

Also Published As

Publication number Publication date
KR910012743A (en) 1991-08-08

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