JPS57127996A - Check input data set circuit for shift register constituted logical circuit function testing device - Google Patents

Check input data set circuit for shift register constituted logical circuit function testing device

Info

Publication number
JPS57127996A
JPS57127996A JP56010375A JP1037581A JPS57127996A JP S57127996 A JPS57127996 A JP S57127996A JP 56010375 A JP56010375 A JP 56010375A JP 1037581 A JP1037581 A JP 1037581A JP S57127996 A JPS57127996 A JP S57127996A
Authority
JP
Japan
Prior art keywords
register
data
input terminal
condition set
shift condition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56010375A
Other languages
Japanese (ja)
Inventor
Takeo Matsunuma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP56010375A priority Critical patent/JPS57127996A/en
Publication of JPS57127996A publication Critical patent/JPS57127996A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To eliminate the need for the provision of shift condition set data in a check data, by providing a shift condition set data register and a shift condition set input terminal selection register, and giving the shift condition set data through selection and control to an input terminal. CONSTITUTION:A selection register at an input termianl of inspected logical circuit, register 2 for check data inputted to a terminal selected by the register 1, input terminal selection register 3 setting the input conditions for shift control, and register 4 for shift condition set data given to the input terminal selected at the register 3, are provided. If the shift condition set data of the register 4 is given to the input terminal selected at the register 3 is controlled with a shift condition set signal 5, and if the data of the register 2 is given to the input terminal selected at the register 1 with the signal 5 or the data of the register 4 is given to the input terminal selected at the register 3, is selected and controlled with a data selection control circuit 6.
JP56010375A 1981-01-27 1981-01-27 Check input data set circuit for shift register constituted logical circuit function testing device Pending JPS57127996A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56010375A JPS57127996A (en) 1981-01-27 1981-01-27 Check input data set circuit for shift register constituted logical circuit function testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56010375A JPS57127996A (en) 1981-01-27 1981-01-27 Check input data set circuit for shift register constituted logical circuit function testing device

Publications (1)

Publication Number Publication Date
JPS57127996A true JPS57127996A (en) 1982-08-09

Family

ID=11748382

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56010375A Pending JPS57127996A (en) 1981-01-27 1981-01-27 Check input data set circuit for shift register constituted logical circuit function testing device

Country Status (1)

Country Link
JP (1) JPS57127996A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS626500A (en) * 1985-07-01 1987-01-13 Nec Corp Semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS626500A (en) * 1985-07-01 1987-01-13 Nec Corp Semiconductor device

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