GB2268277B - Improvements in or relating to electronic circuit test apparatus - Google Patents

Improvements in or relating to electronic circuit test apparatus

Info

Publication number
GB2268277B
GB2268277B GB9212849A GB9212849A GB2268277B GB 2268277 B GB2268277 B GB 2268277B GB 9212849 A GB9212849 A GB 9212849A GB 9212849 A GB9212849 A GB 9212849A GB 2268277 B GB2268277 B GB 2268277B
Authority
GB
United Kingdom
Prior art keywords
signal
probe
electronic circuit
robotic
relating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9212849A
Other versions
GB9212849D0 (en
GB2268277A (en
Inventor
Toby Howard Williams
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BAE Systems Defence Systems Ltd
Original Assignee
Siemens Plessey Electronic Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Plessey Electronic Systems Ltd filed Critical Siemens Plessey Electronic Systems Ltd
Priority to GB9212849A priority Critical patent/GB2268277B/en
Publication of GB9212849D0 publication Critical patent/GB9212849D0/en
Publication of GB2268277A publication Critical patent/GB2268277A/en
Application granted granted Critical
Publication of GB2268277B publication Critical patent/GB2268277B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

Abstract

A test system for electronic circuit boards (38) including integrated circuits (27, 28) having integral boundary scan circuits (29, 32) includes a manufacturing defects analyser having at least one robotic probe (37). In use, a first scan circuit (29) is arranged to apply a signal to an interface connection (30) to be tested and the signal is sensed by a probe (37); and a second scan circuit (32) is arranged to sense any signal transmitted by an interface (34) under test when a signal is injected by the probe (37). The robotic probes are also used to measure, e.g. impedance, voltage drop and V/l curves on discrete components (36). The robotic probes may also drive and/or sense analog signals. <IMAGE>
GB9212849A 1992-06-17 1992-06-17 Improvements in or relating to electronic circuit test apparatus Expired - Fee Related GB2268277B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB9212849A GB2268277B (en) 1992-06-17 1992-06-17 Improvements in or relating to electronic circuit test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9212849A GB2268277B (en) 1992-06-17 1992-06-17 Improvements in or relating to electronic circuit test apparatus

Publications (3)

Publication Number Publication Date
GB9212849D0 GB9212849D0 (en) 1992-07-29
GB2268277A GB2268277A (en) 1994-01-05
GB2268277B true GB2268277B (en) 1995-11-08

Family

ID=10717254

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9212849A Expired - Fee Related GB2268277B (en) 1992-06-17 1992-06-17 Improvements in or relating to electronic circuit test apparatus

Country Status (1)

Country Link
GB (1) GB2268277B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5469064A (en) * 1992-01-14 1995-11-21 Hewlett-Packard Company Electrical assembly testing using robotic positioning of probes
WO2000042442A1 (en) * 1999-01-13 2000-07-20 Imax Trading Corporation Apparatus for testing the pattern of pcb and method thereof
FI110034B (en) * 2000-02-11 2002-11-15 Elektrobit Oy Test arrangement and test procedure

Also Published As

Publication number Publication date
GB9212849D0 (en) 1992-07-29
GB2268277A (en) 1994-01-05

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20100617