JPS54151478A - Pin connection checking system of integrated circuits being tested in integrated circuit testing apparatus - Google Patents
Pin connection checking system of integrated circuits being tested in integrated circuit testing apparatusInfo
- Publication number
- JPS54151478A JPS54151478A JP5975778A JP5975778A JPS54151478A JP S54151478 A JPS54151478 A JP S54151478A JP 5975778 A JP5975778 A JP 5975778A JP 5975778 A JP5975778 A JP 5975778A JP S54151478 A JPS54151478 A JP S54151478A
- Authority
- JP
- Japan
- Prior art keywords
- tested
- voltage
- output
- testing apparatus
- pin connection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To perform connection checking of pin connectors and pins for each pin readily and quickly by comparing the output voltage of a test pulse generator and the voltage of a voltage supervising part when the output of the generator is connected to the IC being tested.
CONSTITUTION: This system is provided with a test pulse generator PG and a multilicity of pin connectors C into which the connection pins CP of the IC being tested are inserted and a switch SW which selectively connects the output of the PG to any one of the connectors C. A voltage supervising part VM is provided via resistor to the output of the PG. The connection of the pins CP selectively connected to the PG by the SW is checked by comparing the DC voltage having been set in the output of the PG and the voltage in the VM.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53059757A JPS592355B2 (en) | 1978-05-19 | 1978-05-19 | Pin connection confirmation method for integrated circuit under test in integrated circuit test equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53059757A JPS592355B2 (en) | 1978-05-19 | 1978-05-19 | Pin connection confirmation method for integrated circuit under test in integrated circuit test equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS54151478A true JPS54151478A (en) | 1979-11-28 |
JPS592355B2 JPS592355B2 (en) | 1984-01-18 |
Family
ID=13122443
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53059757A Expired JPS592355B2 (en) | 1978-05-19 | 1978-05-19 | Pin connection confirmation method for integrated circuit under test in integrated circuit test equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS592355B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5772569A (en) * | 1980-10-17 | 1982-05-06 | Canon Inc | Paper sheet handling device |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5911741U (en) * | 1982-07-14 | 1984-01-25 | 株式会社丸山製作所 | fire extinguisher safety device |
JPS5976256U (en) * | 1982-11-17 | 1984-05-23 | 株式会社丸山製作所 | fire extinguisher |
JPS59133244U (en) * | 1983-02-24 | 1984-09-06 | 宮田工業株式会社 | fire extinguisher safety device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5188989U (en) * | 1975-01-13 | 1976-07-16 |
-
1978
- 1978-05-19 JP JP53059757A patent/JPS592355B2/en not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5188989U (en) * | 1975-01-13 | 1976-07-16 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5772569A (en) * | 1980-10-17 | 1982-05-06 | Canon Inc | Paper sheet handling device |
JPS6321871B2 (en) * | 1980-10-17 | 1988-05-09 | Canon Kk |
Also Published As
Publication number | Publication date |
---|---|
JPS592355B2 (en) | 1984-01-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6469974A (en) | Method and apparatus for diagnosing fault on circuit board | |
GB1542235A (en) | Test pin for testing electrical circuits | |
EP0285799A3 (en) | Device for the functional electric testing of wiring arrays, in particular of circuit boards | |
IT1162778B (en) | EQUIPMENT FOR TESTING INTEGRATED SEMICONDUCTOR CIRCUITS | |
GB2266965B (en) | Partitioned boundary-scan testing for the reduction of testing-induced damage | |
DE3065137D1 (en) | Electrical test probe for use in testing circuits on printed circuit boards and the like | |
EP0039122A3 (en) | Apparatus and method for testing electrical systems of a vehicle | |
JPS54151478A (en) | Pin connection checking system of integrated circuits being tested in integrated circuit testing apparatus | |
DE69021105D1 (en) | Method and device for testing integrated circuits at high speed. | |
JPS57137868A (en) | Test equipment for electronic wattmeter | |
JPS5627667A (en) | Method of estimating semiconductor device | |
JPS5578351A (en) | Testing method of computer | |
JPS6473267A (en) | Test data generation system for lsi | |
JPS6430255A (en) | Large scale integrated circuit provided with failure detection circuit | |
JPS59231459A (en) | Testing apparatus | |
JPS55143458A (en) | Testing device for logic unit | |
KR930006962B1 (en) | Semiconductor testing method | |
GB2268277B (en) | Improvements in or relating to electronic circuit test apparatus | |
ATE78930T1 (en) | ARRANGEMENT FOR TESTING INTEGRATED CIRCUITS. | |
JPS55113968A (en) | Method of testing integrated circuit | |
Thorsen | CMOS circuit testability | |
JPS524786A (en) | Test method of integrated circuit | |
JPS5626269A (en) | Testing method of electric circuit | |
JPS562045A (en) | Inspection unit for random logic circuit | |
JPS6468667A (en) | Test system for printed board |