JPS55113968A - Method of testing integrated circuit - Google Patents
Method of testing integrated circuitInfo
- Publication number
- JPS55113968A JPS55113968A JP2212279A JP2212279A JPS55113968A JP S55113968 A JPS55113968 A JP S55113968A JP 2212279 A JP2212279 A JP 2212279A JP 2212279 A JP2212279 A JP 2212279A JP S55113968 A JPS55113968 A JP S55113968A
- Authority
- JP
- Japan
- Prior art keywords
- measured
- gate circuits
- integrated circuit
- testing integrated
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To shorten the testing time and the number of steps of test required for a measurement by measuring simultaneously four gate circuits with standard values of the case of one gate circuit.
CONSTITUTION: In order to test simultaneously four gate circuits, all input terminals 1aW4a are grounded, and all output terminals 1bW4b are short-circuited. Then, a voltage E is applied to the output terminals and an output leakage current is measured. In this simultaneous measurement, the respective gate circuits are measured only when the measured value exceeds the standard value of one gate circuit.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2212279A JPS55113968A (en) | 1979-02-27 | 1979-02-27 | Method of testing integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2212279A JPS55113968A (en) | 1979-02-27 | 1979-02-27 | Method of testing integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55113968A true JPS55113968A (en) | 1980-09-02 |
Family
ID=12074068
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2212279A Pending JPS55113968A (en) | 1979-02-27 | 1979-02-27 | Method of testing integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55113968A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5951368A (en) * | 1982-09-17 | 1984-03-24 | Nec Corp | Measurement of leak current for semiconductor element |
-
1979
- 1979-02-27 JP JP2212279A patent/JPS55113968A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5951368A (en) * | 1982-09-17 | 1984-03-24 | Nec Corp | Measurement of leak current for semiconductor element |
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