JPS5655875A - Testing device for integrated circuit - Google Patents

Testing device for integrated circuit

Info

Publication number
JPS5655875A
JPS5655875A JP13261079A JP13261079A JPS5655875A JP S5655875 A JPS5655875 A JP S5655875A JP 13261079 A JP13261079 A JP 13261079A JP 13261079 A JP13261079 A JP 13261079A JP S5655875 A JPS5655875 A JP S5655875A
Authority
JP
Japan
Prior art keywords
inferior
circuit
sample
samples
parallel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13261079A
Other languages
Japanese (ja)
Inventor
Makoto Urabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP13261079A priority Critical patent/JPS5655875A/en
Publication of JPS5655875A publication Critical patent/JPS5655875A/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To prevent the damage of a power circuit and a burn caused by a heated inferior sample when a plurality of samples of the same kind are tested in parallel by interrupting the constant voltage being applied to the sample which is determined to be inferior.
CONSTITUTION: Prior to the parallel test for a plurality of samples 7 of the same kind supplied with the voltage from power circuits 6' for device with output control which are independent from each other, the samples are driven in parallel for a preliminary teste through the intermediary of a driver circuit 2. When any inferior sample is detected through the intermediary of a selection circuit 4 and an inferiority detecting circuit 3, an analog switch 9 of the circuit 6' corresponding to the inferior sample 7 is changed over by a control circuit 8 for output of power for device in accordance with an inferior detection signal and thereby the output of the constant voltage for the inferior sample 7 is broken. Accordingly, the device thus constituted becomes an integrated-circuit testing device by which a plurality of samples of the same kind are tested in parallel and which can prevent the damage of the power circuit by the inferior sample, the occurrence of the burn caused by the heated inferior sample, etc.
COPYRIGHT: (C)1981,JPO&Japio
JP13261079A 1979-10-15 1979-10-15 Testing device for integrated circuit Pending JPS5655875A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13261079A JPS5655875A (en) 1979-10-15 1979-10-15 Testing device for integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13261079A JPS5655875A (en) 1979-10-15 1979-10-15 Testing device for integrated circuit

Publications (1)

Publication Number Publication Date
JPS5655875A true JPS5655875A (en) 1981-05-16

Family

ID=15085347

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13261079A Pending JPS5655875A (en) 1979-10-15 1979-10-15 Testing device for integrated circuit

Country Status (1)

Country Link
JP (1) JPS5655875A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5136077A (en) * 1974-09-24 1976-03-26 Tokyo Shibaura Electric Co

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5136077A (en) * 1974-09-24 1976-03-26 Tokyo Shibaura Electric Co

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