JPS57161667A - Testing device for withstanding voltage - Google Patents
Testing device for withstanding voltageInfo
- Publication number
- JPS57161667A JPS57161667A JP4806681A JP4806681A JPS57161667A JP S57161667 A JPS57161667 A JP S57161667A JP 4806681 A JP4806681 A JP 4806681A JP 4806681 A JP4806681 A JP 4806681A JP S57161667 A JPS57161667 A JP S57161667A
- Authority
- JP
- Japan
- Prior art keywords
- phases
- tested
- high voltage
- input power
- power sources
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/18—Indicating phase sequence; Indicating synchronism
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Relating To Insulation (AREA)
Abstract
PURPOSE:To make it possible to correct the connecting phases with respect to input power sources immediately before the setup of a handler, by providing a phase detecting circuit which detects the phases of the power source inputs in order to match the phases in connecting the input power sources between two withstanding voltage testers. CONSTITUTION:The phases of the input power sources which are applied to the withstanding voltage testers 13 and 14 are checked by the phase detector 21 and the phases of the two input power sources are adjusted. Namely, an operator adjusts and sets up the phases based on the indication of a neon lamp and the like in the phases detector 21. Then the devices to be tested 11 and 12 are set on the handler and transferred to contactors corresponding to test positions. Then power source switches SA and SB are closed. Thus high voltage E2 are generated in high voltage transformers TA and TB. Said voltages are applied to the devices to be tested 11 and 12 through distributing resistors R and multiplexers SA1-SA6 and SB1-SB6. At this time, the tester 13 applies the high voltage to odd numbered device units in the device to be tested 11, and the tester 14 applies the high voltage to the even numbered device units in the device to be tested 12. The measured currents are detected by a circuit 16, and the defective device is detected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4806681A JPS57161667A (en) | 1981-03-31 | 1981-03-31 | Testing device for withstanding voltage |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4806681A JPS57161667A (en) | 1981-03-31 | 1981-03-31 | Testing device for withstanding voltage |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57161667A true JPS57161667A (en) | 1982-10-05 |
Family
ID=12792971
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4806681A Pending JPS57161667A (en) | 1981-03-31 | 1981-03-31 | Testing device for withstanding voltage |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57161667A (en) |
-
1981
- 1981-03-31 JP JP4806681A patent/JPS57161667A/en active Pending
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