JPS56147075A - Withstand voltage tester - Google Patents
Withstand voltage testerInfo
- Publication number
- JPS56147075A JPS56147075A JP5037480A JP5037480A JPS56147075A JP S56147075 A JPS56147075 A JP S56147075A JP 5037480 A JP5037480 A JP 5037480A JP 5037480 A JP5037480 A JP 5037480A JP S56147075 A JPS56147075 A JP S56147075A
- Authority
- JP
- Japan
- Prior art keywords
- value
- breakdown voltage
- voltage
- holding
- withstand voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Relating To Insulation (AREA)
Abstract
PURPOSE:To prevent the reading error for the value of breakdown voltage, by holding the value of breakdown voltage at the time when an automatic breaker works at a digital display device. CONSTITUTION:The test voltage B is applied to the object C to be tested via the transformer T with a control of the voltage adjuster R. This test voltage is displayed on the digital display device DM. When the object C is broken at the value of breakdown voltage, the automatic breaker B1 works to break the input power source A. With detection of this breaking action, the holding switch S2 is turned on. This detection signal is supplied to the holding terminal of the device DM. Accordingly the value of breakdown voltage is held at the device DM for the object C. In such way, the reading error is avoided for the value of breakdown voltage.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5037480A JPS56147075A (en) | 1980-04-18 | 1980-04-18 | Withstand voltage tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5037480A JPS56147075A (en) | 1980-04-18 | 1980-04-18 | Withstand voltage tester |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56147075A true JPS56147075A (en) | 1981-11-14 |
JPS6210387B2 JPS6210387B2 (en) | 1987-03-05 |
Family
ID=12857103
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5037480A Granted JPS56147075A (en) | 1980-04-18 | 1980-04-18 | Withstand voltage tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56147075A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61173072U (en) * | 1985-04-16 | 1986-10-28 | ||
CN101865970A (en) * | 2010-05-31 | 2010-10-20 | 福建捷联电子有限公司 | Automatic voltage-withstanding grounding test system for display and voltage-withstanding grounding test method thereof |
-
1980
- 1980-04-18 JP JP5037480A patent/JPS56147075A/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61173072U (en) * | 1985-04-16 | 1986-10-28 | ||
CN101865970A (en) * | 2010-05-31 | 2010-10-20 | 福建捷联电子有限公司 | Automatic voltage-withstanding grounding test system for display and voltage-withstanding grounding test method thereof |
Also Published As
Publication number | Publication date |
---|---|
JPS6210387B2 (en) | 1987-03-05 |
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